Viimati ilmunud raamatud https://www.kriso.ee Thu, 17 Oct 2019 00:00:00 GMT Thu, 17 Oct 2019 00:00:00 GMT Optical Inspection of Microsystems https://www.kriso.ee/optical-inspection-microsystems-db-9780367390570.html <a href="https://www.kriso.ee/optical-inspection-microsystems-db-9780367390570.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978036/9780367390570.jpg" align="left" hspace="5" > </a>Wolfgang Osten, Alain Bosseboeuf, Brian J. Thompson, Angela Duparre, Cosme Furlong, Ingrid De Wolf, Anand Asundi, Kalus Korner, Dietmar Vogel, Christophe Gorecki<br>ISBN: 9780367390570<br> Kirjastus: CRC Press<br> Formaat: Pehme köide, Ilmumisaeg: 17-Oct-2019<br> Hind: 63,54 € https://www.kriso.ee/db/9780367390570.html Thu, 17 Oct 2019 00:00:00 GMT Optical Micro- and Nanometrology VII https://www.kriso.ee/optical-micro-nanometrology-vii-db-9781510618824.html <a href="https://www.kriso.ee/optical-micro-nanometrology-vii-db-9781510618824.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Christophe Gorecki, Anand Asundi, Wolfgang Osten<br>ISBN: 9781510618824<br> Kirjastus: SPIE Press<br> Formaat: Pehme köide, Ilmumisaeg: 30-Aug-2018<br> Hind: 117,48 € https://www.kriso.ee/db/9781510618824.html Thu, 30 Aug 2018 00:00:00 GMT Optical Micro- And Nanometrology: 5-7 April 2016, Brussels, Belgium, Volume 6 https://www.kriso.ee/optical-micro-nanometrology-5-7-april-db-9781510601352.html <a href="https://www.kriso.ee/optical-micro-nanometrology-5-7-april-db-9781510601352.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Christophe Gorecki, Anand Krishna Asundi, Wolfgang Osten<br>ISBN: 9781510601352<br> Kirjastus: SPIE Press<br> Formaat: Pehme köide, Ilmumisaeg: 30-Jun-2016<br> Hind: 117,48 € https://www.kriso.ee/db/9781510601352.html Thu, 30 Jun 2016 00:00:00 GMT Interferometry XVII: Advanced Applications https://www.kriso.ee/interferometry-xvii-advanced-applications-db-9781628412314.html <a href="https://www.kriso.ee/interferometry-xvii-advanced-applications-db-9781628412314.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Cosme Furlong, Christophe Gorecki, Peter de Groot, Erik Novak<br>ISBN: 9781628412314<br> Kirjastus: SPIE Press<br> Formaat: Pehme köide, Ilmumisaeg: 30-Oct-2014<br> Hind: 106,75 € https://www.kriso.ee/db/9781628412314.html Thu, 30 Oct 2014 00:00:00 GMT Optical Micro- and Nanometrology V https://www.kriso.ee/optical-micro-nanometrology-v-db-9781628410808.html <a href="https://www.kriso.ee/optical-micro-nanometrology-v-db-9781628410808.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Christophe Gorecki, Anand Asundi, Wolfgang Osten<br>ISBN: 9781628410808<br> Kirjastus: SPIE Press<br> Formaat: Pehme köide, Ilmumisaeg: 30-Jul-2014<br> Hind: 136,38 € https://www.kriso.ee/db/9781628410808.html Wed, 30 Jul 2014 00:00:00 GMT Optical Micro- and Nanometrology IV: 16-18 April 2012, Brussels, Belgium https://www.kriso.ee/optical-micro-nanometrology-iv-16-18-db-9780819491220.html <a href="https://www.kriso.ee/optical-micro-nanometrology-iv-16-18-db-9780819491220.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Christophe Gorecki, Anand K. Asundi, Wolfgang Osten<br>ISBN: 9780819491220<br> Kirjastus: SPIE Press<br> Formaat: Pehme köide, Ilmumisaeg: 15-Jul-2012<br> Hind: 158,05 € https://www.kriso.ee/db/9780819491220.html Sun, 15 Jul 2012 00:00:00 GMT Optical Micro- and Nanometrology: 13-16 April 2010, Brussels, Belgium, Volume III https://www.kriso.ee/optical-micro-nanometrology-13-16-april-db-9780819481917.html <a href="https://www.kriso.ee/optical-micro-nanometrology-13-16-april-db-9780819481917.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Christophe Gorecki<br>ISBN: 9780819481917<br> Kirjastus: SPIE Press<br> Formaat: Pehme köide, Ilmumisaeg: 01-Jan-2010<br> Hind: 179,65 € https://www.kriso.ee/db/9780819481917.html Fri, 01 Jan 2010 00:00:00 GMT Optical Inspection of Microsystems https://www.kriso.ee/optical-inspection-microsystems-db-9780849336829.html <a href="https://www.kriso.ee/optical-inspection-microsystems-db-9780849336829.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978084/9780849336829.jpg" align="left" hspace="5" > </a>Wolfgang Osten, Alain Bosseboeuf, Brian J. Thompson, Angela Duparre, Cosme Furlong, Ingrid De Wolf, Anand Asundi, Kalus Korner, Dietmar Vogel, Christophe Gorecki<br>ISBN: 9780849336829<br> Kirjastus: CRC Press Inc<br> Formaat: Kõva köide, Ilmumisaeg: 20-Jul-2006<br> Hind: 232,75 € https://www.kriso.ee/db/9780849336829.html Thu, 20 Jul 2006 00:00:00 GMT Microsystems Engineering: Metrology and Inspection https://www.kriso.ee/microsystems-engineering-metrology-inspection-db-9780819440952.html <a href="https://www.kriso.ee/microsystems-engineering-metrology-inspection-db-9780819440952.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Christophe Gorecki, Werner Jueptner, Malgorzata Kujawinska<br>ISBN: 9780819440952<br> Kirjastus: SPIE Press<br> Formaat: Pehme köide, Ilmumisaeg: 01-Oct-2001<br> Hind: 136,38 € https://www.kriso.ee/db/9780819440952.html Mon, 01 Oct 2001 00:00:00 GMT