Viimati ilmunud raamatud https://www.kriso.ee Tue, 19 Jan 2021 00:00:00 GMT Tue, 19 Jan 2021 00:00:00 GMT Modern Mossbauer Spectroscopy: New Challenges Based on Cutting-Edge Techniques https://www.kriso.ee/modern-mossbauer-spectroscopy-new-challenges-based-db-9789811594229e.html <a href="https://www.kriso.ee/modern-mossbauer-spectroscopy-new-challenges-based-db-9789811594229e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Yutaka Yoshida, Guido Langouche<br>ISBN: 9789811594229<br> Kirjastus: Springer Verlag, Singapore<br> Formaat: PDF+DRM, Ilmumisaeg: 19-Jan-2021<br> Hind: 172,28 € https://www.kriso.ee/db/97898115942292e.html Tue, 19 Jan 2021 00:00:00 GMT Modern Mossbauer Spectroscopy: New Challenges Based on Cutting-Edge Techniques https://www.kriso.ee/modern-mossbauer-spectroscopy-new-challenges-based-db-9789811594229e.html <a href="https://www.kriso.ee/modern-mossbauer-spectroscopy-new-challenges-based-db-9789811594229e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Yutaka Yoshida, Guido Langouche<br>ISBN: 9789811594229<br> Kirjastus: Springer Verlag, Singapore<br> Formaat: EPUB+DRM, Ilmumisaeg: 19-Jan-2021<br> Hind: 172,28 € https://www.kriso.ee/db/97898115942296e.html Tue, 19 Jan 2021 00:00:00 GMT Defects and Impurities in Silicon Materials: An Introduction to Atomic-Level Silicon Engineering https://www.kriso.ee/defects-impurities-silicon-materials-introduction-atomic-db-9784431558002e.html <a href="https://www.kriso.ee/defects-impurities-silicon-materials-introduction-atomic-db-9784431558002e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Yutaka Yoshida, Guido Langouche<br>ISBN: 9784431558002<br> Kirjastus: Springer Verlag, Japan<br> Formaat: PDF+DRM, Ilmumisaeg: 30-Mar-2016<br> Hind: 74,09 € https://www.kriso.ee/db/97844315580022e.html Wed, 30 Mar 2016 00:00:00 GMT Defects and Impurities in Silicon Materials: An Introduction to Atomic-Level Silicon Engineering https://www.kriso.ee/defects-impurities-silicon-materials-introduction-atomic-db-9784431558002e.html <a href="https://www.kriso.ee/defects-impurities-silicon-materials-introduction-atomic-db-9784431558002e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Yutaka Yoshida, Guido Langouche<br>ISBN: 9784431558002<br> Kirjastus: Springer Verlag, Japan<br> Formaat: EPUB+DRM, Ilmumisaeg: 30-Mar-2016<br> Hind: 74,09 € https://www.kriso.ee/db/97844315580026e.html Wed, 30 Mar 2016 00:00:00 GMT Mossbauer Spectroscopy: Tutorial Book https://www.kriso.ee/mossbauer-spectroscopy-tutorial-book-db-9783642322204e.html <a href="https://www.kriso.ee/mossbauer-spectroscopy-tutorial-book-db-9783642322204e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Yutaka Yoshida, Guido Langouche<br>ISBN: 9783642322204<br> Kirjastus: Springer-Verlag Berlin and Heidelberg GmbH & Co. K<br> Formaat: PDF+DRM, Ilmumisaeg: 08-Nov-2012<br> Hind: 66,68 € https://www.kriso.ee/db/97836423222042e.html Thu, 08 Nov 2012 00:00:00 GMT