Viimati ilmunud raamatud https://www.kriso.ee Thu, 01 Jan 2004 00:00:00 GMT Thu, 01 Jan 2004 00:00:00 GMT Icmts 2004: Proceedings of the 2004 International Conference on Microelectronic Test Structures: March 22-25, 2004 ... https://www.kriso.ee/icmts-2004-proceedings-2004-international-conference-db-9780780382626.html <a href="https://www.kriso.ee/icmts-2004-proceedings-2004-international-conference-db-9780780382626.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Japan) International Conference on Microelectronic Test Structures<br>ISBN: 9780780382626<br> Kirjastus: IEEE Computer Society Press<br> Formaat: Kõva köide, Ilmumisaeg: 01-Jan-2004<br> Hind: 221,46 € https://www.kriso.ee/db/9780780382626.html Thu, 01 Jan 2004 00:00:00 GMT Test, 2003 International Conference 2003 https://www.kriso.ee/test-2003-international-conference-2003-db-9780780381063.html <a href="https://www.kriso.ee/test-2003-international-conference-2003-db-9780780381063.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>IEEE, International Test Conference, IEEE Computer Society, Institute of Electrical and Electronics Engineers<br>ISBN: 9780780381063<br> Kirjastus: I.E.E.E.Press<br> Formaat: Pehme köide, Ilmumisaeg: 01-Jan-2003<br> Hind: 440,88 € https://www.kriso.ee/db/9780780381063.html Wed, 01 Jan 2003 00:00:00 GMT 2000 Test Conference, IEEE International https://www.kriso.ee/2000-test-conference-ieee-international-db-9780780365469.html <a href="https://www.kriso.ee/2000-test-conference-ieee-international-db-9780780365469.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Ch&&&&&, IEEE, International Test Conference<br>ISBN: 9780780365469<br> Kirjastus: I.E.E.E.Press<br> Formaat: Pehme köide, Ilmumisaeg: 01-Jan-2000<br> Hind: 309,18 € https://www.kriso.ee/db/9780780365469.html Sat, 01 Jan 2000 00:00:00 GMT