Viimati ilmunud raamatud https://www.kriso.ee Wed, 19 Nov 2008 00:00:00 GMT Wed, 19 Nov 2008 00:00:00 GMT Defects in Microelectronic Materials and Devices https://www.kriso.ee/defects-microelectronic-materials-devices-db-9781040078501e.html <a href="https://www.kriso.ee/defects-microelectronic-materials-devices-db-9781040078501e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978104/9781040078501.jpg" align="left" hspace="5" > </a>Daniel M. Fleetwood, Ronald D. Schrimpf<br>ISBN: 9781040078501<br> Kirjastus: CRC Press Inc<br> Formaat: EPUB+DRM, Ilmumisaeg: 19-Nov-2008<br> Hind: 80,59 € https://www.kriso.ee/db/97810400785016e.html Wed, 19 Nov 2008 00:00:00 GMT Defects in Microelectronic Materials and Devices https://www.kriso.ee/defects-microelectronic-materials-devices-db-9781420043778e.html <a href="https://www.kriso.ee/defects-microelectronic-materials-devices-db-9781420043778e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978142/9781420043778.jpg" align="left" hspace="5" > </a>Daniel M. Fleetwood, Ronald D. Schrimpf<br>ISBN: 9781420043778<br> Kirjastus: CRC Press Inc<br> Formaat: PDF+DRM, Ilmumisaeg: 19-Nov-2008<br> Hind: 80,59 € https://www.kriso.ee/db/97814200437782e.html Wed, 19 Nov 2008 00:00:00 GMT Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices https://www.kriso.ee/radiation-effects-soft-errors-integrated-circuits-db-9789814482158e.html <a href="https://www.kriso.ee/radiation-effects-soft-errors-integrated-circuits-db-9789814482158e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Ronald D Schrimpf, Daniel M Fleetwood<br>ISBN: 9789814482158<br> Kirjastus: World Scientific Publishing Co Pte Ltd<br> Formaat: PDF+DRM, Ilmumisaeg: 29-Jul-2004<br> Hind: 63,18 € https://www.kriso.ee/db/97898144821582e.html Thu, 29 Jul 2004 00:00:00 GMT