Viimati ilmunud raamatud https://www.kriso.ee Wed, 10 Mar 2021 00:00:00 GMT Wed, 10 Mar 2021 00:00:00 GMT Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs https://www.kriso.ee/mitigating-process-variability-soft-errors-circuit-db-9783030683689e.html <a href="https://www.kriso.ee/mitigating-process-variability-soft-errors-circuit-db-9783030683689e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Alexandra Zimpeck, Cristina Meinhardt, Laurent Artola, Ricardo Reis<br>ISBN: 9783030683689<br> Kirjastus: Springer Nature Switzerland AG<br> Formaat: PDF+DRM, Ilmumisaeg: 10-Mar-2021<br> Hind: 74,09 € https://www.kriso.ee/db/97830306836892e.html Wed, 10 Mar 2021 00:00:00 GMT Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs https://www.kriso.ee/mitigating-process-variability-soft-errors-circuit-db-9783030683689e.html <a href="https://www.kriso.ee/mitigating-process-variability-soft-errors-circuit-db-9783030683689e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Alexandra Zimpeck, Cristina Meinhardt, Laurent Artola, Ricardo Reis<br>ISBN: 9783030683689<br> Kirjastus: Springer Nature Switzerland AG<br> Formaat: EPUB+DRM, Ilmumisaeg: 10-Mar-2021<br> Hind: 74,09 € https://www.kriso.ee/db/97830306836896e.html Wed, 10 Mar 2021 00:00:00 GMT Integrated Circuit Design for Radiation Environments https://www.kriso.ee/integrated-circuit-design-radiation-environments-db-9781118701874e.html <a href="https://www.kriso.ee/integrated-circuit-design-radiation-environments-db-9781118701874e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978111/9781118701874.jpg" align="left" hspace="5" > </a>Stephen J. Gaul, Nicolaas van Vonno, Steven H. Voldman, Wesley H. Morris<br>ISBN: 9781118701874<br> Kirjastus: John Wiley & Sons Inc<br> Formaat: PDF+DRM, Ilmumisaeg: 03-Dec-2019<br> Hind: 118,50 € https://www.kriso.ee/db/97811187018742e.html Tue, 03 Dec 2019 00:00:00 GMT Integrated Circuit Design for Radiation Environments https://www.kriso.ee/integrated-circuit-design-radiation-environments-db-9781118701850e.html <a href="https://www.kriso.ee/integrated-circuit-design-radiation-environments-db-9781118701850e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978111/9781118701850.jpg" align="left" hspace="5" > </a>Stephen J. Gaul, Nicolaas van Vonno, Steven H. Voldman, Wesley H. Morris<br>ISBN: 9781118701850<br> Kirjastus: John Wiley & Sons Inc<br> Formaat: EPUB+DRM, Ilmumisaeg: 03-Dec-2019<br> Hind: 118,50 € https://www.kriso.ee/db/97811187018506e.html Tue, 03 Dec 2019 00:00:00 GMT Soft Errors: From Particles to Circuits https://www.kriso.ee/soft-errors-from-particles-circuits-db-9781351831550e.html <a href="https://www.kriso.ee/soft-errors-from-particles-circuits-db-9781351831550e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978135/9781351831550.jpg" align="left" hspace="5" > </a>Jean-Luc Autran, Daniela Munteanu<br>ISBN: 9781351831550<br> Kirjastus: CRC Press Inc<br> Formaat: EPUB+DRM, Ilmumisaeg: 19-Dec-2017<br> Hind: 84,50 € https://www.kriso.ee/db/97813518315506e.html Tue, 19 Dec 2017 00:00:00 GMT Soft Errors: From Particles to Circuits https://www.kriso.ee/soft-errors-from-particles-circuits-db-9781466590847e.html <a href="https://www.kriso.ee/soft-errors-from-particles-circuits-db-9781466590847e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978146/9781466590847.jpg" align="left" hspace="5" > </a>Jean-Luc Autran, Daniela Munteanu<br>ISBN: 9781466590847<br> Kirjastus: CRC Press Inc<br> Formaat: PDF+DRM, Ilmumisaeg: 19-Dec-2017<br> Hind: 84,50 € https://www.kriso.ee/db/97814665908472e.html Tue, 19 Dec 2017 00:00:00 GMT Radiation-Tolerant Delta-Sigma Time-to-Digital Converters https://www.kriso.ee/radiation-tolerant-delta-sigma-time-digital-db-9783319118420e.html <a href="https://www.kriso.ee/radiation-tolerant-delta-sigma-time-digital-db-9783319118420e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978331/9783319118420.jpg" align="left" hspace="5" > </a>Ying Cao, Paul Leroux, Michiel Steyaert<br>ISBN: 9783319118420<br> Kirjastus: Springer International Publishing AG<br> Formaat: PDF+DRM, Ilmumisaeg: 09-Feb-2015<br> Hind: 110,53 € https://www.kriso.ee/db/97833191184202e.html Mon, 09 Feb 2015 00:00:00 GMT Terrestrial Radiation Effects in ULSI Devices and Electronic Systems https://www.kriso.ee/terrestrial-radiation-effects-ulsi-devices-electronic-db-9781118479315e.html <a href="https://www.kriso.ee/terrestrial-radiation-effects-ulsi-devices-electronic-db-9781118479315e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978111/9781118479315.jpg" align="left" hspace="5" > </a>Eishi H. Ibe<br>ISBN: 9781118479315<br> Kirjastus: Wiley-IEEE Press<br> Formaat: PDF+DRM, Ilmumisaeg: 26-Nov-2014<br> Hind: 149,37 € https://www.kriso.ee/db/97811184793152e.html Wed, 26 Nov 2014 00:00:00 GMT Terrestrial Radiation Effects in ULSI Devices and Electronic Systems https://www.kriso.ee/terrestrial-radiation-effects-ulsi-devices-electronic-db-9781118479322e.html <a href="https://www.kriso.ee/terrestrial-radiation-effects-ulsi-devices-electronic-db-9781118479322e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978111/9781118479322.jpg" align="left" hspace="5" > </a>Eishi H. Ibe<br>ISBN: 9781118479322<br> Kirjastus: Wiley-IEEE Press<br> Formaat: EPUB+DRM, Ilmumisaeg: 26-Nov-2014<br> Hind: 149,37 € https://www.kriso.ee/db/97811184793226e.html Wed, 26 Nov 2014 00:00:00 GMT Architecture Design for Soft Errors https://www.kriso.ee/architecture-design-soft-errors-db-9780080558325e.html <a href="https://www.kriso.ee/architecture-design-soft-errors-db-9780080558325e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978008/9780080558325.jpg" align="left" hspace="5" > </a>Shubu Mukherjee<br>ISBN: 9780080558325<br> Kirjastus: Morgan Kaufmann Publishers In<br> Formaat: PDF+DRM, Ilmumisaeg: 29-Aug-2011<br> Hind: 65,44 € https://www.kriso.ee/db/97800805583252e.html Mon, 29 Aug 2011 00:00:00 GMT Soft Errors in Modern Electronic Systems https://www.kriso.ee/soft-errors-modern-electronic-systems-db-9781441969934e.html <a href="https://www.kriso.ee/soft-errors-modern-electronic-systems-db-9781441969934e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978144/9781441969934.jpg" align="left" hspace="5" > </a>Michael Nicolaidis<br>ISBN: 9781441969934<br> Kirjastus: Springer-Verlag New York Inc.<br> Formaat: PDF+DRM, Ilmumisaeg: 24-Sep-2010<br> Hind: 159,93 € https://www.kriso.ee/db/97814419699342e.html Fri, 24 Sep 2010 00:00:00 GMT Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices https://www.kriso.ee/radiation-effects-soft-errors-integrated-circuits-db-9789814482158e.html <a href="https://www.kriso.ee/radiation-effects-soft-errors-integrated-circuits-db-9789814482158e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Ronald D Schrimpf, Daniel M Fleetwood<br>ISBN: 9789814482158<br> Kirjastus: World Scientific Publishing Co Pte Ltd<br> Formaat: PDF+DRM, Ilmumisaeg: 29-Jul-2004<br> Hind: 63,18 € https://www.kriso.ee/db/97898144821582e.html Thu, 29 Jul 2004 00:00:00 GMT