Viimati ilmunud raamatud https://www.kriso.ee Wed, 01 Mar 2023 00:00:00 GMT Wed, 01 Mar 2023 00:00:00 GMT Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach https://www.kriso.ee/built-fault-tolerant-computing-paradigm-resilient-db-9789811985515e.html <a href="https://www.kriso.ee/built-fault-tolerant-computing-paradigm-resilient-db-9789811985515e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Xiaowei Li, Guihai Yan, Cheng Liu<br>ISBN: 9789811985515<br> Kirjastus: Springer Verlag, Singapore<br> Formaat: PDF+DRM, Ilmumisaeg: 01-Mar-2023<br> Hind: 222,29 € https://www.kriso.ee/db/97898119855152e.html Wed, 01 Mar 2023 00:00:00 GMT Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach https://www.kriso.ee/built-fault-tolerant-computing-paradigm-resilient-db-9789811985515e.html <a href="https://www.kriso.ee/built-fault-tolerant-computing-paradigm-resilient-db-9789811985515e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Xiaowei Li, Guihai Yan, Cheng Liu<br>ISBN: 9789811985515<br> Kirjastus: Springer Verlag, Singapore<br> Formaat: EPUB+DRM, Ilmumisaeg: 01-Mar-2023<br> Hind: 222,29 € https://www.kriso.ee/db/97898119855156e.html Wed, 01 Mar 2023 00:00:00 GMT Lifetime Reliability-aware Design of Integrated Circuits https://www.kriso.ee/lifetime-reliability-aware-design-integrated-circuits-db-9783031153457e.html <a href="https://www.kriso.ee/lifetime-reliability-aware-design-integrated-circuits-db-9783031153457e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Mohsen Raji, Behnam Ghavami<br>ISBN: 9783031153457<br> Kirjastus: Springer International Publishing AG<br> Formaat: PDF+DRM, Ilmumisaeg: 16-Nov-2022<br> Hind: 92,01 € https://www.kriso.ee/db/97830311534572e.html Wed, 16 Nov 2022 00:00:00 GMT Lifetime Reliability-aware Design of Integrated Circuits https://www.kriso.ee/lifetime-reliability-aware-design-integrated-circuits-db-9783031153457e.html <a href="https://www.kriso.ee/lifetime-reliability-aware-design-integrated-circuits-db-9783031153457e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Mohsen Raji, Behnam Ghavami<br>ISBN: 9783031153457<br> Kirjastus: Springer International Publishing AG<br> Formaat: EPUB+DRM, Ilmumisaeg: 16-Nov-2022<br> Hind: 92,01 € https://www.kriso.ee/db/97830311534576e.html Wed, 16 Nov 2022 00:00:00 GMT Fundamentals of Microelectromechanical Systems (MEMS) https://www.kriso.ee/fundamentals-microelectromechanical-systems-mems-db-9781264257591e.html <a href="https://www.kriso.ee/fundamentals-microelectromechanical-systems-mems-db-9781264257591e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978126/9781264257591.jpg" align="left" hspace="5" > </a>Eun Sok Kim<br>ISBN: 9781264257591<br> Kirjastus: McGraw-Hill Education<br> Formaat: PDF+DRM, Ilmumisaeg: 14-May-2021<br> Hind: 112,32 € https://www.kriso.ee/db/97812642575912e.html Fri, 14 May 2021 00:00:00 GMT Fundamentals of Microelectromechanical Systems (MEMS) https://www.kriso.ee/fundamentals-microelectromechanical-systems-mems-db-9781264257591e.html <a href="https://www.kriso.ee/fundamentals-microelectromechanical-systems-mems-db-9781264257591e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978126/9781264257591.jpg" align="left" hspace="5" > </a>Eun Sok Kim<br>ISBN: 9781264257591<br> Kirjastus: McGraw-Hill Education<br> Formaat: EPUB+DRM, Ilmumisaeg: 14-May-2021<br> Hind: 112,32 € https://www.kriso.ee/db/97812642575916e.html Fri, 14 May 2021 00:00:00 GMT Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques https://www.kriso.ee/design-testability-debug-reliability-next-generation-db-9783030692094e.html <a href="https://www.kriso.ee/design-testability-debug-reliability-next-generation-db-9783030692094e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Sebastian Huhn, Rolf Drechsler<br>ISBN: 9783030692094<br> Kirjastus: Springer Nature Switzerland AG<br> Formaat: PDF+DRM, Ilmumisaeg: 19-Apr-2021<br> Hind: 122,88 € https://www.kriso.ee/db/97830306920942e.html Mon, 19 Apr 2021 00:00:00 GMT Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques https://www.kriso.ee/design-testability-debug-reliability-next-generation-db-9783030692094e.html <a href="https://www.kriso.ee/design-testability-debug-reliability-next-generation-db-9783030692094e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Sebastian Huhn, Rolf Drechsler<br>ISBN: 9783030692094<br> Kirjastus: Springer Nature Switzerland AG<br> Formaat: EPUB+DRM, Ilmumisaeg: 19-Apr-2021<br> Hind: 122,88 € https://www.kriso.ee/db/97830306920946e.html Mon, 19 Apr 2021 00:00:00 GMT Integrated Circuit Quality and Reliability https://www.kriso.ee/integrated-circuit-quality-reliability-db-9781351990493e.html <a href="https://www.kriso.ee/integrated-circuit-quality-reliability-db-9781351990493e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978135/9781351990493.jpg" align="left" hspace="5" > </a>Eugene R. Hnatek<br>ISBN: 9781351990493<br> Kirjastus: CRC Press Inc<br> Formaat: EPUB+DRM, Ilmumisaeg: 03-Oct-2018<br> Hind: 227,50 € https://www.kriso.ee/db/97813519904936e.html Wed, 03 Oct 2018 00:00:00 GMT Strain-Engineered MOSFETs https://www.kriso.ee/strain-engineered-mosfets-db-9781466503472e.html <a href="https://www.kriso.ee/strain-engineered-mosfets-db-9781466503472e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978146/9781466503472.jpg" align="left" hspace="5" > </a>C.K. Maiti, T.K. Maiti<br>ISBN: 9781466503472<br> Kirjastus: CRC Press Inc<br> Formaat: PDF+DRM, Ilmumisaeg: 03-Oct-2018<br> Hind: 4,47 € https://www.kriso.ee/db/97814665034722e.html Wed, 03 Oct 2018 00:00:00 GMT Integrated Circuit Quality and Reliability https://www.kriso.ee/integrated-circuit-quality-reliability-db-9781482277715e.html <a href="https://www.kriso.ee/integrated-circuit-quality-reliability-db-9781482277715e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978148/9781482277715.jpg" align="left" hspace="5" > </a>Eugene R. Hnatek<br>ISBN: 9781482277715<br> Kirjastus: CRC Press Inc<br> Formaat: PDF+DRM, Ilmumisaeg: 03-Oct-2018<br> Hind: 227,50 € https://www.kriso.ee/db/97814822777152e.html Wed, 03 Oct 2018 00:00:00 GMT Guidebook for Managing Silicon Chip Reliability https://www.kriso.ee/guidebook-managing-silicon-chip-reliability-db-9781351443562e.html <a href="https://www.kriso.ee/guidebook-managing-silicon-chip-reliability-db-9781351443562e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978135/9781351443562.jpg" align="left" hspace="5" > </a>Michael Pecht, Riko Radojcic, Gopal Rao<br>ISBN: 9781351443562<br> Kirjastus: CRC Press Inc<br> Formaat: EPUB+DRM, Ilmumisaeg: 22-Nov-2017<br> Hind: 77,99 € https://www.kriso.ee/db/97813514435626e.html Wed, 22 Nov 2017 00:00:00 GMT Guidebook for Managing Silicon Chip Reliability https://www.kriso.ee/guidebook-managing-silicon-chip-reliability-db-9781351443579e.html <a href="https://www.kriso.ee/guidebook-managing-silicon-chip-reliability-db-9781351443579e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978135/9781351443579.jpg" align="left" hspace="5" > </a>Michael Pecht, Riko Radojcic, Gopal Rao<br>ISBN: 9781351443579<br> Kirjastus: CRC Press Inc<br> Formaat: PDF+DRM, Ilmumisaeg: 22-Nov-2017<br> Hind: 77,99 € https://www.kriso.ee/db/97813514435792e.html Wed, 22 Nov 2017 00:00:00 GMT Low-Power Design and Power-Aware Verification https://www.kriso.ee/low-power-design-power-aware-verification-db-9783319666198e.html <a href="https://www.kriso.ee/low-power-design-power-aware-verification-db-9783319666198e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978331/9783319666198.jpg" align="left" hspace="5" > </a>Progyna Khondkar<br>ISBN: 9783319666198<br> Kirjastus: Springer International Publishing AG<br> Formaat: PDF+DRM, Ilmumisaeg: 05-Oct-2017<br> Hind: 110,53 € https://www.kriso.ee/db/97833196661982e.html Thu, 05 Oct 2017 00:00:00 GMT Low-Power Design and Power-Aware Verification https://www.kriso.ee/low-power-design-power-aware-verification-db-9783319666198e.html <a href="https://www.kriso.ee/low-power-design-power-aware-verification-db-9783319666198e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978331/9783319666198.jpg" align="left" hspace="5" > </a>Progyna Khondkar<br>ISBN: 9783319666198<br> Kirjastus: Springer International Publishing AG<br> Formaat: EPUB+DRM, Ilmumisaeg: 05-Oct-2017<br> Hind: 110,53 € https://www.kriso.ee/db/97833196661986e.html Thu, 05 Oct 2017 00:00:00 GMT