Viimati ilmunud raamatud https://www.kriso.ee Wed, 25 Nov 2020 00:00:00 GMT Wed, 25 Nov 2020 00:00:00 GMT Random Testing of Digital Circuits: Theory and Applications https://www.kriso.ee/random-testing-digital-circuits-theory-applications-db-9781000146011e.html <a href="https://www.kriso.ee/random-testing-digital-circuits-theory-applications-db-9781000146011e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978100/9781000146011.jpg" align="left" hspace="5" > </a>Rene David<br>ISBN: 9781000146011<br> Kirjastus: CRC Press Inc<br> Formaat: EPUB+DRM, Ilmumisaeg: 25-Nov-2020<br> Hind: 390,00 € https://www.kriso.ee/db/97810001460116e.html Wed, 25 Nov 2020 00:00:00 GMT Random Testing of Digital Circuits: Theory and Applications https://www.kriso.ee/random-testing-digital-circuits-theory-applications-db-9781000110166e.html <a href="https://www.kriso.ee/random-testing-digital-circuits-theory-applications-db-9781000110166e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978100/9781000110166.jpg" align="left" hspace="5" > </a>Rene David<br>ISBN: 9781000110166<br> Kirjastus: CRC Press Inc<br> Formaat: PDF+DRM, Ilmumisaeg: 25-Nov-2020<br> Hind: 390,00 € https://www.kriso.ee/db/97810001101662e.html Wed, 25 Nov 2020 00:00:00 GMT Advanced VLSI Design and Testability Issues https://www.kriso.ee/advanced-vlsi-design-testability-issues-db-9781000168174e.html <a href="https://www.kriso.ee/advanced-vlsi-design-testability-issues-db-9781000168174e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978100/9781000168174.jpg" align="left" hspace="5" > </a>Suman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra<br>ISBN: 9781000168174<br> Kirjastus: CRC Press<br> Formaat: EPUB+DRM, Ilmumisaeg: 18-Aug-2020<br> Hind: 51,99 € https://www.kriso.ee/db/97810001681746e.html Tue, 18 Aug 2020 00:00:00 GMT Advanced VLSI Design and Testability Issues https://www.kriso.ee/advanced-vlsi-design-testability-issues-db-9781000168150e.html <a href="https://www.kriso.ee/advanced-vlsi-design-testability-issues-db-9781000168150e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978100/9781000168150.jpg" align="left" hspace="5" > </a>Suman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra<br>ISBN: 9781000168150<br> Kirjastus: CRC Press<br> Formaat: PDF+DRM, Ilmumisaeg: 18-Aug-2020<br> Hind: 51,99 € https://www.kriso.ee/db/97810001681502e.html Tue, 18 Aug 2020 00:00:00 GMT VLSI Design Methodology Development https://www.kriso.ee/vlsi-design-methodology-development-db-9780135657683e.html <a href="https://www.kriso.ee/vlsi-design-methodology-development-db-9780135657683e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978013/9780135657683.jpg" align="left" hspace="5" > </a>Thomas Dillinger<br>ISBN: 9780135657683<br> Kirjastus: Pearson<br> Formaat: EPUB+DRM, Ilmumisaeg: 17-Jun-2019<br> Hind: 84,23 € https://www.kriso.ee/db/97801356576836e.html Mon, 17 Jun 2019 00:00:00 GMT Digital Integrated Circuits: Design-for-Test Using Simulink and Stateflow https://www.kriso.ee/digital-integrated-circuits-design-test-using-db-9781351838009e.html <a href="https://www.kriso.ee/digital-integrated-circuits-design-test-using-db-9781351838009e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978135/9781351838009.jpg" align="left" hspace="5" > </a>Evgeni Perelroyzen<br>ISBN: 9781351838009<br> Kirjastus: CRC Press Inc<br> Formaat: EPUB+DRM, Ilmumisaeg: 03-Oct-2018<br> Hind: 156,00 € https://www.kriso.ee/db/97813518380096e.html Wed, 03 Oct 2018 00:00:00 GMT Digital Integrated Circuits: Design-for-Test Using Simulink and Stateflow https://www.kriso.ee/digital-integrated-circuits-design-test-using-db-9781420004595e.html <a href="https://www.kriso.ee/digital-integrated-circuits-design-test-using-db-9781420004595e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978142/9781420004595.jpg" align="left" hspace="5" > </a>Evgeni Perelroyzen<br>ISBN: 9781420004595<br> Kirjastus: CRC Press Inc<br> Formaat: PDF+DRM, Ilmumisaeg: 03-Oct-2018<br> Hind: 109,19 € https://www.kriso.ee/db/97814200045952e.html Wed, 03 Oct 2018 00:00:00 GMT Thermal-Aware Testing of Digital VLSI Circuits and Systems https://www.kriso.ee/thermal-aware-testing-digital-vlsi-circuits-db-9781351227773e.html <a href="https://www.kriso.ee/thermal-aware-testing-digital-vlsi-circuits-db-9781351227773e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Santanu Chattopadhyay<br>ISBN: 9781351227773<br> Kirjastus: CRC Press Inc<br> Formaat: PDF+DRM, Ilmumisaeg: 24-Apr-2018<br> Hind: 28,59 € https://www.kriso.ee/db/97813512277732e.html Tue, 24 Apr 2018 00:00:00 GMT Thermal-Aware Testing of Digital VLSI Circuits and Systems https://www.kriso.ee/thermal-aware-testing-digital-vlsi-circuits-db-9781351227766e.html <a href="https://www.kriso.ee/thermal-aware-testing-digital-vlsi-circuits-db-9781351227766e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Santanu Chattopadhyay<br>ISBN: 9781351227766<br> Kirjastus: CRC Press Inc<br> Formaat: EPUB+DRM, Ilmumisaeg: 24-Apr-2018<br> Hind: 28,59 € https://www.kriso.ee/db/97813512277666e.html Tue, 24 Apr 2018 00:00:00 GMT Electronic Design Automation for IC System Design, Verification, and Testing https://www.kriso.ee/electronic-design-automation-ic-system-design-db-9781351830997e.html <a href="https://www.kriso.ee/electronic-design-automation-ic-system-design-db-9781351830997e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978135/9781351830997.jpg" align="left" hspace="5" > </a>Luciano Lavagno, Igor L. Markov, Grant Martin, Louis K. Scheffer<br>ISBN: 9781351830997<br> Kirjastus: CRC Press Inc<br> Formaat: EPUB+DRM, Ilmumisaeg: 19-Dec-2017<br> Hind: 100,09 € https://www.kriso.ee/db/97813518309976e.html Tue, 19 Dec 2017 00:00:00 GMT Electronic Design Automation for IC System Design, Verification, and Testing https://www.kriso.ee/electronic-design-automation-ic-system-design-db-9781482254631e.html <a href="https://www.kriso.ee/electronic-design-automation-ic-system-design-db-9781482254631e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978148/9781482254631.jpg" align="left" hspace="5" > </a>Luciano Lavagno, Igor L. Markov, Grant Martin, Louis K. Scheffer<br>ISBN: 9781482254631<br> Kirjastus: CRC Press Inc<br> Formaat: PDF+DRM, Ilmumisaeg: 19-Dec-2017<br> Hind: 100,09 € https://www.kriso.ee/db/97814822546312e.html Tue, 19 Dec 2017 00:00:00 GMT Engineer's Guide to Automated Testing of High-Speed Interfaces, Second Edition https://www.kriso.ee/engineers-guide-automated-testing-high-speed-db-9781608079865e.html <a href="https://www.kriso.ee/engineers-guide-automated-testing-high-speed-db-9781608079865e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978160/9781608079865.jpg" align="left" hspace="5" > </a>Jose Moreira, Hubert Werkmann<br>ISBN: 9781608079865<br> Kirjastus: Artech House Publishers<br> Formaat: PDF+DRM, Ilmumisaeg: 31-Jan-2016<br> Hind: 87,75 € https://www.kriso.ee/db/97816080798652e.html Sun, 31 Jan 2016 00:00:00 GMT Crystal Growth and Evaluation of Silicon for VLSI and ULSI https://www.kriso.ee/crystal-growth-evaluation-silicon-vlsi-ulsi-db-9781040055854e.html <a href="https://www.kriso.ee/crystal-growth-evaluation-silicon-vlsi-ulsi-db-9781040055854e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978104/9781040055854.jpg" align="left" hspace="5" > </a>Golla Eranna<br>ISBN: 9781040055854<br> Kirjastus: CRC Press Inc<br> Formaat: EPUB+DRM, Ilmumisaeg: 08-Dec-2014<br> Hind: 79,30 € https://www.kriso.ee/db/97810400558546e.html Mon, 08 Dec 2014 00:00:00 GMT Crystal Growth and Evaluation of Silicon for VLSI and ULSI https://www.kriso.ee/crystal-growth-evaluation-silicon-vlsi-ulsi-db-9781482232820e.html <a href="https://www.kriso.ee/crystal-growth-evaluation-silicon-vlsi-ulsi-db-9781482232820e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978148/9781482232820.jpg" align="left" hspace="5" > </a>Golla Eranna<br>ISBN: 9781482232820<br> Kirjastus: CRC Press Inc<br> Formaat: PDF+DRM, Ilmumisaeg: 08-Dec-2014<br> Hind: 79,30 € https://www.kriso.ee/db/97814822328202e.html Mon, 08 Dec 2014 00:00:00 GMT VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings https://www.kriso.ee/vlsi-design-test-17th-international-symposium-db-9783642420245e.html <a href="https://www.kriso.ee/vlsi-design-test-17th-international-symposium-db-9783642420245e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, D. Boolchandani, Virendra Sing, Adit Singh<br>ISBN: 9783642420245<br> Kirjastus: Springer-Verlag Berlin and Heidelberg GmbH & Co. K<br> Formaat: PDF+DRM, Ilmumisaeg: 13-Dec-2013<br> Hind: 55,56 € https://www.kriso.ee/db/97836424202452e.html Fri, 13 Dec 2013 00:00:00 GMT