Viimati ilmunud raamatud https://www.kriso.ee Wed, 26 Sep 2012 00:00:00 GMT Wed, 26 Sep 2012 00:00:00 GMT Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield https://www.kriso.ee/nanometer-variation-tolerant-sram-circuits-statistical-db-9781461417491e.html <a href="https://www.kriso.ee/nanometer-variation-tolerant-sram-circuits-statistical-db-9781461417491e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978146/9781461417491.jpg" align="left" hspace="5" > </a>Mohamed Abu Rahma, Mohab Anis<br>ISBN: 9781461417491<br> Kirjastus: Springer-Verlag New York Inc.<br> Formaat: PDF+DRM, Ilmumisaeg: 26-Sep-2012<br> Hind: 110,53 € https://www.kriso.ee/db/97814614174912e.html Wed, 26 Sep 2012 00:00:00 GMT Green Computing with Emerging Memory: Low-Power Computation for Social Innovation https://www.kriso.ee/green-computing-emerging-memory-low-power-db-9781461408123e.html <a href="https://www.kriso.ee/green-computing-emerging-memory-low-power-db-9781461408123e.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Takayuki Kawahara, Hiroyuki Mizuno<br>ISBN: 9781461408123<br> Kirjastus: Springer-Verlag New York Inc.<br> Formaat: PDF+DRM, Ilmumisaeg: 26-Sep-2012<br> Hind: 110,53 € https://www.kriso.ee/db/97814614081232e.html Wed, 26 Sep 2012 00:00:00 GMT SRAM Design for Wireless Sensor Networks: Energy Efficient and Variability Resilient Techniques https://www.kriso.ee/sram-design-wireless-sensor-networks-energy-db-9781461440390e.html <a href="https://www.kriso.ee/sram-design-wireless-sensor-networks-energy-db-9781461440390e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978146/9781461440390.jpg" align="left" hspace="5" > </a>Vibhu Sharma, Francky Catthoor, Wim Dehaene<br>ISBN: 9781461440390<br> Kirjastus: Springer-Verlag New York Inc.<br> Formaat: PDF+DRM, Ilmumisaeg: 27-Jul-2012<br> Hind: 110,53 € https://www.kriso.ee/db/97814614403902e.html Fri, 27 Jul 2012 00:00:00 GMT CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test https://www.kriso.ee/cmos-sram-circuit-design-parametric-test-db-9781402083631e.html <a href="https://www.kriso.ee/cmos-sram-circuit-design-parametric-test-db-9781402083631e.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978140/9781402083631.jpg" align="left" hspace="5" > </a>Andrei Pavlov, Manoj Sachdev<br>ISBN: 9781402083631<br> Kirjastus: Springer-Verlag New York Inc.<br> Formaat: PDF+DRM, Ilmumisaeg: 01-Jun-2008<br> Hind: 172,28 € https://www.kriso.ee/db/97814020836312e.html Sun, 01 Jun 2008 00:00:00 GMT