Viimati ilmunud raamatud https://www.kriso.ee Mon, 19 Sep 2022 00:00:00 GMT Mon, 19 Sep 2022 00:00:00 GMT Testing Software and Systems: 35th IFIP WG 6.1 International Conference, ICTSS 2023, Bergamo, Italy, September 1820, 2023, Proceedings 1st ed. 2023 https://www.kriso.ee/testing-software-systems-35th-ifip-wg-db-9783031432392.html <a href="https://www.kriso.ee/testing-software-systems-35th-ifip-wg-db-9783031432392.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978303/9783031432392.jpg" align="left" hspace="5" > </a>Silvia Bonfanti, Angelo Gargantini, Paolo Salvaneschi<br>ISBN: 9783031432392<br> Kirjastus: Springer International Publishing AG<br> Formaat: Pehme köide, Ilmumisaeg: 19-Sep-2022<br> Hind: 67,23 € https://www.kriso.ee/db/9783031432392.html Mon, 19 Sep 2022 00:00:00 GMT Testing Software and Systems: 33rd IFIP WG 6.1 International Conference, ICTSS 2021, London, UK, November 1012, 2021, Proceedings 1st ed. 2022 https://www.kriso.ee/testing-software-systems-33rd-ifip-wg-db-9783031046728.html <a href="https://www.kriso.ee/testing-software-systems-33rd-ifip-wg-db-9783031046728.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978303/9783031046728.jpg" align="left" hspace="5" > </a>David Clark, Hector Menendez, Ana Rosa Cavalli<br>ISBN: 9783031046728<br> Kirjastus: Springer International Publishing AG<br> Formaat: Pehme köide, Ilmumisaeg: 10-May-2021<br> Hind: 85,76 € https://www.kriso.ee/db/9783031046728.html Mon, 10 May 2021 00:00:00 GMT Testing Software and Systems: 30th IFIP WG 6.1 International Conference, ICTSS 2018, Cádiz, Spain, October 1-3, 2018, Proceedings 2018 ed. https://www.kriso.ee/testing-software-systems-30th-ifip-wg-db-9783319999265.html <a href="https://www.kriso.ee/testing-software-systems-30th-ifip-wg-db-9783319999265.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978331/9783319999265.jpg" align="left" hspace="5" > </a>Inmaculada Medina-Bulo, Mercedes G. Merayo, Robert Hierons<br>ISBN: 9783319999265<br> Kirjastus: Springer International Publishing AG<br> Formaat: Pehme köide, Ilmumisaeg: 07-Sep-2017<br> Hind: 48,70 € https://www.kriso.ee/db/9783319999265.html Thu, 07 Sep 2017 00:00:00 GMT Testing Software and Systems: 29th IFIP WG 6.1 International Conference, ICTSS 2017, St. Petersburg, Russia, October 9-11, 2017, Proceedings 1st ed. 2017 https://www.kriso.ee/testing-software-systems-29th-ifip-wg-db-9783319675480.html <a href="https://www.kriso.ee/testing-software-systems-29th-ifip-wg-db-9783319675480.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978331/9783319675480.jpg" align="left" hspace="5" > </a>Nina Yevtushenko, Ana Rosa Cavalli, Hüsnü Yenigün<br>ISBN: 9783319675480<br> Kirjastus: Springer International Publishing AG<br> Formaat: Pehme köide, Ilmumisaeg: 15-Sep-2016<br> Hind: 48,70 € https://www.kriso.ee/db/9783319675480.html Thu, 15 Sep 2016 00:00:00 GMT Testing Software and Systems: 27th IFIP WG 6.1 International Conference, ICTSS 2015, Sharjah and Dubai, United Arab Emirates, November 23-25, 2015, Proceedings 1st ed. 2015 https://www.kriso.ee/testing-software-systems-27th-ifip-wg-db-9783319259444.html <a href="https://www.kriso.ee/testing-software-systems-27th-ifip-wg-db-9783319259444.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978331/9783319259444.jpg" align="left" hspace="5" > </a>Khaled El-Fakih, Gerassimos Barlas, Nina Yevtushenko<br>ISBN: 9783319259444<br> Kirjastus: Springer International Publishing AG<br> Formaat: Pehme köide, Ilmumisaeg: 10-Nov-2014<br> Hind: 48,70 € https://www.kriso.ee/db/9783319259444.html Mon, 10 Nov 2014 00:00:00 GMT Testing Software and Systems: 26th IFIP WG 6.1 International Conference, ICTSS 2014, Madrid, Spain, September 23-25, 2014. Proceedings 2014 ed. https://www.kriso.ee/testing-software-systems-26th-ifip-wg-db-9783662448564.html <a href="https://www.kriso.ee/testing-software-systems-26th-ifip-wg-db-9783662448564.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978366/9783662448564.jpg" align="left" hspace="5" > </a>Mercedes G. Merayo, Edgardo Montes de Oca<br>ISBN: 9783662448564<br> Kirjastus: Springer-Verlag Berlin and Heidelberg GmbH & Co. K<br> Formaat: Pehme köide, Ilmumisaeg: 23-Sep-2013<br> Hind: 48,70 € https://www.kriso.ee/db/9783662448564.html Mon, 23 Sep 2013 00:00:00 GMT Testing Software and Systems: 25th IFIP WG 6.1 International Conference, ICTSS 2013, Istanbul, Turkey, November 13-15, 2013, Proceedings 2013 ed. https://www.kriso.ee/testing-software-systems-25th-ifip-wg-db-9783642417061.html <a href="https://www.kriso.ee/testing-software-systems-25th-ifip-wg-db-9783642417061.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978364/9783642417061.jpg" align="left" hspace="5" > </a>Hüsnü Yenigün, Cemal Yilmaz, Andreas Ulrich<br>ISBN: 9783642417061<br> Kirjastus: Springer-Verlag Berlin and Heidelberg GmbH & Co. K<br> Formaat: Pehme köide, Ilmumisaeg: 18-Oct-2012<br> Hind: 48,70 € https://www.kriso.ee/db/9783642417061.html Thu, 18 Oct 2012 00:00:00 GMT Testing Software and Systems: 24th IFIP WG 6.1 International Conference, ICTSS 2012, Aalborg, Denmark, November 19-21, 2012, Proceedings 2012 ed. https://www.kriso.ee/testing-software-systems-24th-ifip-wg-db-9783642346903.html <a href="https://www.kriso.ee/testing-software-systems-24th-ifip-wg-db-9783642346903.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978364/9783642346903.jpg" align="left" hspace="5" > </a>Brian Nielsen, Carsten Weise<br>ISBN: 9783642346903<br> Kirjastus: Springer-Verlag Berlin and Heidelberg GmbH & Co. K<br> Formaat: Pehme köide, Ilmumisaeg: 09-Oct-2011<br> Hind: 48,70 € https://www.kriso.ee/db/9783642346903.html Sun, 09 Oct 2011 00:00:00 GMT Testing Software and Systems: 23rd IFIP WG 6.1 International Conference, ICTSS 2011, Paris, France, November 7-10, 2011, Proceedings https://www.kriso.ee/testing-software-systems-23rd-ifip-wg-db-9783642245794.html <a href="https://www.kriso.ee/testing-software-systems-23rd-ifip-wg-db-9783642245794.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978364/9783642245794.jpg" align="left" hspace="5" > </a>Burkhart Wolff, Fatiha Zaidi<br>ISBN: 9783642245794<br> Kirjastus: Springer-Verlag Berlin and Heidelberg GmbH & Co. K<br> Formaat: Pehme köide, Ilmumisaeg: 21-Oct-2010<br> Hind: 48,70 € https://www.kriso.ee/db/9783642245794.html Thu, 21 Oct 2010 00:00:00 GMT Testing Software and Systems: 22nd IFIP WG 6.1 International Conference, ICTSS 2010, Natal, Brazil, November 8-10, 2010, Proceedings https://www.kriso.ee/testing-software-systems-22nd-ifip-wg-db-9783642165726.html <a href="https://www.kriso.ee/testing-software-systems-22nd-ifip-wg-db-9783642165726.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978364/9783642165726.jpg" align="left" hspace="5" > </a>Alexandre Petrenko, Adenilso Simao, José Carlos Maldonado<br>ISBN: 9783642165726<br> Kirjastus: Springer-Verlag Berlin and Heidelberg GmbH & Co. K<br> Formaat: Pehme köide, Ilmumisaeg: 08-Oct-2009<br> Hind: 48,70 € https://www.kriso.ee/db/9783642165726.html Thu, 08 Oct 2009 00:00:00 GMT Protocol Test Systems: International Workshop Proceedings, 6th https://www.kriso.ee/protocol-test-systems-international-workshop-proceedings-db-9780444816979.html <a href="https://www.kriso.ee/protocol-test-systems-international-workshop-proceedings-db-9780444816979.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>O. Rafiq<br>ISBN: 9780444816979<br> Kirjastus: Elsevier Science Ltd<br> Formaat: Pehme köide, Ilmumisaeg: 23-Dec-1993<br> Hind: 111,93 € https://www.kriso.ee/db/9780444816979.html Thu, 23 Dec 1993 00:00:00 GMT Protocol Test Systems V: Proceedings of the IFIP TC6/WG6.1 Fifth Working Conference, Montreal, Quebec, Canada, 28-30 September 1992 https://www.kriso.ee/protocol-test-systems-v-proceedings-ifip-db-9780444899804.html <a href="https://www.kriso.ee/protocol-test-systems-v-proceedings-ifip-db-9780444899804.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Gregor V. Bochmann, R. Dssouli, A. Das<br>ISBN: 9780444899804<br> Kirjastus: Elsevier Science Ltd<br> Formaat: Pehme köide, Ilmumisaeg: 09-Mar-1993<br> Hind: 102,48 € https://www.kriso.ee/db/9780444899804.html Tue, 09 Mar 1993 00:00:00 GMT Protocol Test Systems: International Workshop Proceedings, 3rd https://www.kriso.ee/protocol-test-systems-international-workshop-proceedings-db-9780444891778.html <a href="https://www.kriso.ee/protocol-test-systems-international-workshop-proceedings-db-9780444891778.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>I. Davidson, D.M. Litwack<br>ISBN: 9780444891778<br> Kirjastus: Elsevier Science Ltd<br> Formaat: Kõva köide, Ilmumisaeg: 31-Jul-1991<br> Hind: 115,54 € https://www.kriso.ee/db/9780444891778.html Wed, 31 Jul 1991 00:00:00 GMT Protocol Test Systems: International Workshop Proceedings, 2nd https://www.kriso.ee/protocol-test-systems-international-workshop-proceedings-db-9780444885630.html <a href="https://www.kriso.ee/protocol-test-systems-international-workshop-proceedings-db-9780444885630.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>J.D. Meer, Jan De Meer, etc.<br>ISBN: 9780444885630<br> Kirjastus: Elsevier Science Ltd<br> Formaat: Kõva köide, Ilmumisaeg: 30-Apr-1990<br> Hind: 105,23 € https://www.kriso.ee/db/9780444885630.html Mon, 30 Apr 1990 00:00:00 GMT