Viimati ilmunud raamatud https://www.kriso.ee Tue, 01 Feb 2000 00:00:00 GMT Tue, 01 Feb 2000 00:00:00 GMT International Integrated Reliability Workshop 1999 1999 ed. https://www.kriso.ee/international-integrated-reliability-workshop-1999-1999-db-9780780348820.html <a href="https://www.kriso.ee/international-integrated-reliability-workshop-1999-1999-db-9780780348820.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Institute of Electrical and Electronics Engineers<br>ISBN: 9780780348820<br> Kirjastus: I.E.E.E.Press<br> Formaat: Microfiche, Ilmumisaeg: 01-Feb-2000<br> Hind: 143,20 € https://www.kriso.ee/db/9780780348820.html Tue, 01 Feb 2000 00:00:00 GMT International Integrated Reliability Workshop 1999 1999 ed. https://www.kriso.ee/international-integrated-reliability-workshop-1999-1999-db-9780780356498.html <a href="https://www.kriso.ee/international-integrated-reliability-workshop-1999-1999-db-9780780356498.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Institute of Electrical and Electronics Engineers<br>ISBN: 9780780356498<br> Kirjastus: I.E.E.E.Press<br> Formaat: Pehme köide, Ilmumisaeg: 01-Feb-2000<br> Hind: 138,62 € https://www.kriso.ee/db/9780780356498.html Tue, 01 Feb 2000 00:00:00 GMT Gate Dielectric Integrity: Material, Process and Tool Qualification: Material, Process and Tool Qualification https://www.kriso.ee/gate-dielectric-integrity-material-process-tool-db-9780803126152.html <a href="https://www.kriso.ee/gate-dielectric-integrity-material-process-tool-db-9780803126152.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978080/9780803126152.jpg" align="left" hspace="5" > </a>Dinesh C. Gupta, George A. Brown<br>ISBN: 9780803126152<br> Kirjastus: American Society for Testing & Materials<br> Formaat: Pehme köide, Ilmumisaeg: 01-Jan-2000<br> Hind: 54,10 € https://www.kriso.ee/db/9780803126152.html Sat, 01 Jan 2000 00:00:00 GMT