Viimati ilmunud raamatud

Dimensional Metrology

Tue, 22 Jul 2025 00:00:00 GMT

Han Haitjema, Richard Leach
ISBN: 9780367420925
Kirjastus: CRC Press
Formaat: K�va k�ide, Ilmumisaeg: 22-Jul-2025
Hind: 164,80 �

Metrology and Measurement Uncertainty: Concepts and Applications

Thu, 01 May 2025 00:00:00 GMT

Pedro Paulo Novellino do Rosario, Alexandre Mendes
ISBN: 9783031823022
Kirjastus: Springer International Publishing AG
Formaat: K�va k�ide, Ilmumisaeg: 01-May-2025
Hind: 71,86 �

Industrial and Laboratory Measuring Systems: Sensors, Distributed, Modular and Wireless Systems

Fri, 04 Oct 2024 00:00:00 GMT

Josef Vedral
ISBN: 9788770041508
Kirjastus: River Publishers
Formaat: K�va k�ide, Ilmumisaeg: 04-Oct-2024
Hind: 158,05 �

Practical Handbook on Measurement Uncertainty: FAQs and fundamentals for metrologists

Mon, 29 Jul 2024 00:00:00 GMT

Swanand Rishi
ISBN: 9780750364584
Kirjastus: Institute of Physics Publishing
Formaat: K�va k�ide, Ilmumisaeg: 29-Jul-2024
Hind: 164,80 �

Physics of Laser RadiationMatter Interaction: Fundamentals, and Selected Applications in Metrology 2022 ed.

Tue, 21 Nov 2023 00:00:00 GMT

Alexander Horn
ISBN: 9783031158643
Kirjastus: Springer International Publishing AG
Formaat: Pehme k�ide, Ilmumisaeg: 21-Nov-2023
Hind: 62,59 �

Forensic Metrology: An Introduction to the Fundamentals of Metrology for Judges, Lawyers and Forensic Scientists 2022 ed.

Mon, 23 Oct 2023 00:00:00 GMT

Alessandro Ferrero, Veronica Scotti
ISBN: 9783031146213
Kirjastus: Springer International Publishing AG
Formaat: Pehme k�ide, Ilmumisaeg: 23-Oct-2023
Hind: 113,55 �

Metrological Infrastructure

Mon, 24 Jul 2023 00:00:00 GMT

Beat Jeckelmann, Robert Edelmaier
ISBN: 9783110715682
Kirjastus: De Gruyter Oldenbourg
Formaat: K�va k�ide, Ilmumisaeg: 24-Jul-2023
Hind: 155,35 �

Reflection, Scattering, and Diffraction from Surfaces VI

Wed, 01 Feb 2023 00:00:00 GMT

Leonard Hanssen
ISBN: 9781510620711
Kirjastus: SPIE Press
Formaat: Pehme k�ide, Ilmumisaeg: 01-Feb-2023
Hind: 106,75 �

Economics and Science of Measurement: A Study of Metrology

Mon, 09 Jan 2023 00:00:00 GMT

Albert N. Link
ISBN: 9781032033679
Kirjastus: Routledge
Formaat: Pehme k�ide, Ilmumisaeg: 09-Jan-2023
Hind: 28,44 �

Full Field Optical Metrology and Applications

Thu, 29 Dec 2022 00:00:00 GMT

Fernando Mendoza-Santoyo, Manuel De la Torre-Ibarra, Mar�a del Socorro Hern�ndez-Montes, Jorge Mauricio Flores Moreno
ISBN: 9780750330251
Kirjastus: Institute of Physics Publishing
Formaat: K�va k�ide, Ilmumisaeg: 29-Dec-2022
Hind: 164,80 �

Physics of Laser RadiationMatter Interaction: Fundamentals, and Selected Applications in Metrology 2022 ed.

Mon, 21 Nov 2022 00:00:00 GMT

Alexander Horn
ISBN: 9783031158612
Kirjastus: Springer International Publishing AG
Formaat: K�va k�ide, Ilmumisaeg: 21-Nov-2022
Hind: 85,76 �

Forensic Metrology: An Introduction to the Fundamentals of Metrology for Judges, Lawyers and Forensic Scientists 2022 ed.

Sat, 22 Oct 2022 00:00:00 GMT

Alessandro Ferrero, Veronica Scotti
ISBN: 9783031146183
Kirjastus: Springer International Publishing AG
Formaat: K�va k�ide, Ilmumisaeg: 22-Oct-2022
Hind: 150,61 �

Recent Advances in Metrology: Select Proceedings of AdMet 2022 1st ed. 2024

Fri, 02 Sep 2022 00:00:00 GMT

Sanjay Yadav, Naveen Garg, Shankar G. Aggarwal, Shiv Kumar Jaiswal, Harish Kumar, Venu Gopal Achanta
ISBN: 9789819945962
Kirjastus: Springer Verlag, Singapore
Formaat: Pehme k�ide, Ilmumisaeg: 02-Sep-2022
Hind: 206,20 �

Recent Advances in Metrology: Select Proceedings of AdMet 2021 2023 ed.

Thu, 28 Jul 2022 00:00:00 GMT

Sanjay Yadav, K.P. Chaudhary, Ajay Gahlot, Yogendra Arya, Aman Dahiya, Naveen Garg
ISBN: 9789811924705
Kirjastus: Springer Verlag, Singapore
Formaat: Pehme k�ide, Ilmumisaeg: 28-Jul-2022
Hind: 215,47 �

Handbook of Speckle Interferometry

Mon, 30 May 2022 00:00:00 GMT

Abundio D�vila
ISBN: 9781510645387
Kirjastus: SPIE Press
Formaat: Pehme k�ide, Ilmumisaeg: 30-May-2022
Hind: 62,20 �