https://www.kriso.ee Mon, 30 Dec 2019 00:00:00 GMT Mon, 30 Dec 2019 00:00:00 GMT https://www.kriso.ee/microelectronics-failure-analysis-desk-reference-seventh-db-9781627082457.html <a href="https://www.kriso.ee/microelectronics-failure-analysis-desk-reference-seventh-db-9781627082457.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978162/9781627082457.jpg" align="left" hspace="5" > </a>Tejinder Gandhi<br>ISBN: 9781627082457<br> Kirjastus: A S M International<br> Formaat: Kõva köide, Ilmumisaeg: 30-Dec-2019<br> Hind: 272,80 € https://www.kriso.ee/db/9781627082457.html Mon, 30 Dec 2019 00:00:00 GMT https://www.kriso.ee/defects-microelectronic-materials-devices-db-9780367386399.html <a href="https://www.kriso.ee/defects-microelectronic-materials-devices-db-9780367386399.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978036/9780367386399.jpg" align="left" hspace="5" > </a>Daniel M. Fleetwood, Ronald D. Schrimpf<br>ISBN: 9780367386399<br> Kirjastus: CRC Press<br> Formaat: Pehme köide, Ilmumisaeg: 07-Oct-2019<br> Hind: 91,89 € https://www.kriso.ee/db/9780367386399.html Mon, 07 Oct 2019 00:00:00 GMT https://www.kriso.ee/basic-semiconductor-physics-3rd-ed-2017-db-9783319668598.html <a href="https://www.kriso.ee/basic-semiconductor-physics-3rd-ed-2017-db-9783319668598.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978331/9783319668598.jpg" align="left" hspace="5" > </a>Chihiro Hamaguchi<br>ISBN: 9783319668598<br> Kirjastus: Springer International Publishing AG<br> Formaat: Kõva köide, Ilmumisaeg: 08-Dec-2017<br> Hind: 142,75 € https://www.kriso.ee/db/9783319668598.html Fri, 08 Dec 2017 00:00:00 GMT https://www.kriso.ee/microelectronics-failure-analysis-desk-reference-sixth-db-9781615037254.html <a href="https://www.kriso.ee/microelectronics-failure-analysis-desk-reference-sixth-db-9781615037254.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978161/9781615037254.jpg" align="left" hspace="5" > </a>Electronic Device Failure Analysis Society<br>ISBN: 9781615037254<br> Kirjastus: ASM International<br> Formaat: Multiple-component retail product, Ilmumisaeg: 01-Dec-2011<br> Hind: 261,10 € https://www.kriso.ee/db/9781615037254.html Thu, 01 Dec 2011 00:00:00 GMT https://www.kriso.ee/digital-holography-mems-microsystem-metrology-db-9781119997290.html <a href="https://www.kriso.ee/digital-holography-mems-microsystem-metrology-db-9781119997290.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>A Asundi<br>ISBN: 9781119997290<br> Kirjastus: John Wiley & Sons Inc<br> Formaat: Other digital carrier, Ilmumisaeg: 06-Jul-2011<br> Hind: 112,08 € https://www.kriso.ee/db/9781119997290.html Wed, 06 Jul 2011 00:00:00 GMT https://www.kriso.ee/defects-microelectronic-materials-devices-db-9781420043761.html <a href="https://www.kriso.ee/defects-microelectronic-materials-devices-db-9781420043761.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978142/9781420043761.jpg" align="left" hspace="5" > </a>Daniel M. Fleetwood, Ronald D. Schrimpf<br>ISBN: 9781420043761<br> Kirjastus: CRC Press Inc<br> Formaat: Kõva köide, Ilmumisaeg: 19-Nov-2008<br> Hind: 259,30 € https://www.kriso.ee/db/9781420043761.html Wed, 19 Nov 2008 00:00:00 GMT https://www.kriso.ee/microelectronics-failure-analysis-desk-reference-5th-db-9780871708045.html <a href="https://www.kriso.ee/microelectronics-failure-analysis-desk-reference-5th-db-9780871708045.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978087/9780871708045.jpg" align="left" hspace="5" > </a>Scott Henry<br>ISBN: 9780871708045<br> Kirjastus: ASM International<br> Formaat: Multiple-component retail product, Ilmumisaeg: 01-Jan-2004<br> Hind: 245,80 € https://www.kriso.ee/db/9780871708045.html Thu, 01 Jan 2004 00:00:00 GMT https://www.kriso.ee/microelectronic-failure-analysis-desk-reference-4th-db-9780871706386.html <a href="https://www.kriso.ee/microelectronic-failure-analysis-desk-reference-4th-db-9780871706386.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978087/9780871706386.jpg" align="left" hspace="5" > </a>Christian Boit<br>ISBN: 9780871706386<br> Kirjastus: ASM International<br> Formaat: Kõva köide, Ilmumisaeg: 01-Oct-2002<br> Hind: 203,95 € https://www.kriso.ee/db/9780871706386.html Tue, 01 Oct 2002 00:00:00 GMT https://www.kriso.ee/optical-diagnostics-materials-devices-opto-micro-db-9780819428080.html <a href="https://www.kriso.ee/optical-diagnostics-materials-devices-opto-micro-db-9780819428080.html"><img border="0" src="https://www.kriso.ee/covers/thumb/978081/9780819428080.jpg" align="left" hspace="5" > </a>Svechnikov<br>ISBN: 9780819428080<br> Kirjastus: SPIE Press<br> Formaat: Pehme köide, Ilmumisaeg: 01-Jan-1998<br> Hind: 158,05 € https://www.kriso.ee/db/9780819428080.html Thu, 01 Jan 1998 00:00:00 GMT https://www.kriso.ee/microelectronic-failure-analysis-desk-reference-3rd-db-9780871704795.html <a href="https://www.kriso.ee/microelectronic-failure-analysis-desk-reference-3rd-db-9780871704795.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Thomas W. Lee<br>ISBN: 9780871704795<br> Kirjastus: ASM International<br> Formaat: Kõva köide, Ilmumisaeg: 30-Nov-1993<br> Hind: 155,35 € https://www.kriso.ee/db/9780871704795.html Tue, 30 Nov 1993 00:00:00 GMT https://www.kriso.ee/analysis-microelectronic-materials-devices-db-9780471917137.html <a href="https://www.kriso.ee/analysis-microelectronic-materials-devices-db-9780471917137.html"><img border="0" src="https://www.kriso.ee/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>M. Grasserbauer, H. W. Werner<br>ISBN: 9780471917137<br> Kirjastus: John Wiley & Sons Ltd<br> Formaat: Kõva köide, Ilmumisaeg: 24-Sep-1991<br> Hind: 189,55 € https://www.kriso.ee/db/9780471917137.html Tue, 24 Sep 1991 00:00:00 GMT