Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices, especially semiconductor devices, particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter
- Informs and updates on all the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
- Features extended articles on the physics of electron devices, especially semiconductor devices, particle optics at high and low energies, microlithography, image science, and digital image processing
Muu info
Presents cutting-edge articles on the latest developments in all areas of microscopy, image science, and many related subjects in electron physics
| Contributors |
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vii | |
| Delia Grayson, a Tribute |
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ix | |
| Preface |
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xi | |
| Future Contributions |
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xiii | |
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1 Direct Digital Electron Detectors |
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1 | (42) |
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1 | (2) |
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2 Detector Characterization |
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3 | (12) |
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15 | (23) |
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38 | (5) |
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38 | (5) |
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2 Transmission Electron Microscopy: Emerging Investigations for Cultural Heritage Materials |
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43 | (26) |
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43 | (5) |
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2 Sampling and Sample Preparation |
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48 | (4) |
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52 | (6) |
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4 Advanced Techniques and Further Developments |
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58 | (4) |
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62 | (7) |
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63 | (6) |
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3 Quest for Ultimate Resolution Using Coherent Electron Waves: An Aberration-Corrected High-Voltage Electron Microscope |
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69 | (58) |
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69 | (2) |
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71 | (2) |
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3 Early Efforts In Electron Microscopy |
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73 | (2) |
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4 Birth of Coherent Electron Waves |
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75 | (7) |
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5 Development of the High-Voltage Electron Microscope |
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82 | (5) |
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6 The Era of the Aberration-Corrected Electron Microscope |
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87 | (11) |
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7 Aberration-Corrected High-Voltage TEM |
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98 | (15) |
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113 | (14) |
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115 | (1) |
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115 | (12) |
| Index |
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127 | (4) |
| Contents of Volumes 151--197 |
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131 | |
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
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