Preface |
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xi | |
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1 | (6) |
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1.1 Technologies That Underline the Information Society |
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1 | (1) |
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1.2 World of Micro and Nano |
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2 | (3) |
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1.3 Contents and Construction of This Book |
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5 | (2) |
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2 Vacuum And Gas Kinetics |
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7 | (48) |
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7 | (1) |
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2.2 Vacuum and Equation of State |
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7 | (3) |
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7 | (2) |
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2.2.2 Ideal Gases and Behavior of Gases |
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9 | (1) |
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2.3 Gas Pressure and Internal Energy |
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10 | (4) |
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2.3.1 Gas Pressure and Speed of Gas Molecules |
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11 | (2) |
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2.3.2 Internal Energy of a Gas |
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13 | (1) |
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2.4 Total Pressure and Partial Pressure |
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14 | (2) |
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2.5 Distribution Law of Gas Velocity |
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16 | (11) |
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2.5.1 Maxwell-Boltzmann Gas Velocity Distribution |
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16 | (1) |
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2.5.1.1 Mean speeds and most probable speed |
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16 | (2) |
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2.5.1.2 Meaning of distribution function |
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18 | (2) |
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2.5.2 Number of Molecules Passing Through a Unit Area |
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20 | (1) |
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2.5.2.1 Flux of incident molecules |
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20 | (2) |
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2.5.2.2 Number of molecules passing through an orifice (in the case of molecular flow) |
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22 | (1) |
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2.5.2.3 Adsorption of molecules onto clean surface |
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23 | (1) |
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24 | (1) |
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24 | (3) |
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2.6 Mean Free Path and Collision Probability |
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27 | (6) |
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27 | (4) |
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2.6.2 Collision Probability |
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31 | (1) |
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2.6.3 Mean Free Path of a Gas Mixture |
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32 | (1) |
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2.7 Flow of Molecules Under Vacuum |
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33 | (7) |
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2.7.1 Viscous Flow and Molecular Flow |
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33 | (1) |
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34 | (1) |
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2.7.3 Conductance Calculus |
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35 | (2) |
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2.7.4 Vacuum Flow Rate and Pumping Speed |
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37 | (2) |
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2.7.5 Gas Admission, Pressure Regulation, and Average Residence Time |
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39 | (1) |
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40 | (15) |
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2.8.1 Vacuum Chamber and Pipe/Fitting |
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40 | (1) |
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41 | (1) |
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2.8.2.1 General classification |
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41 | (1) |
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2.8.2.2 Types of vacuum pumps |
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42 | (7) |
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2.8.2.3 Introduction to practical designing of vacuum pumping systems |
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49 | (6) |
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55 | (40) |
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55 | (1) |
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56 | (9) |
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3.2.1 Particles in a Plasma |
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56 | (5) |
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3.2.2 Motion of Charged Particles in an Electromagnetic Field |
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61 | (1) |
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3.2.2.1 Motion in electric field |
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61 | (2) |
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3.2.2.2 Conservation of energy |
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63 | (1) |
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3.2.2.3 Motion in a magnetic field |
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64 | (1) |
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3.3 Collision of Electrons and Molecules |
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65 | (9) |
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3.3.1 Elastic and Inelastic Collisions |
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65 | (4) |
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3.3.2 Collision Processes |
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69 | (4) |
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3.3.3 Collision Cross Section |
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73 | (1) |
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3.4 Plasma Adjacent to Electrodes |
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74 | (4) |
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3.5 Plasma Apparatus and the Interior of a Plasma |
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78 | (17) |
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78 | (1) |
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78 | (2) |
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3.5.1.2 Initiation of discharge |
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80 | (1) |
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3.5.1.3 Structure of DC glow discharge and plasma sustenance |
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80 | (3) |
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83 | (1) |
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3.5.2.1 Principle and setup |
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83 | (4) |
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3.5.2.2 Self-bias and its applications |
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87 | (2) |
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3.5.3 Development of Plasma for Micro- and Nanofabrication |
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89 | (1) |
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3.5.3.1 Inductively coupled plasma |
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90 | (1) |
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3.5.3.2 Magnetic field and ECR plasma |
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90 | (5) |
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4 Physical Vapor Deposition |
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95 | (38) |
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95 | (1) |
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96 | (17) |
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4.2.1 Evaporation and Deposition |
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96 | (1) |
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4.2.1.1 Vacuum evaporation |
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96 | (1) |
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4.2.1.2 Vacuum evaporator |
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96 | (2) |
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98 | (2) |
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4.2.1.4 Vaporization rate |
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100 | (1) |
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4.2.1.5 Deposition rate and film uniformity |
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101 | (4) |
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4.2.1.6 Multicomponent deposition and impurity incorporation |
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105 | (3) |
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4.2.2 Evaporation Sources and Derivative Methods |
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108 | (1) |
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4.2.2.1 Resistive evaporation |
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108 | (1) |
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4.2.2.2 Electron beam evaporation |
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109 | (1) |
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4.2.2.3 Reactive evaporation |
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110 | (1) |
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110 | (2) |
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4.2.3 Features of Vacuum Evaporation |
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112 | (1) |
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113 | (20) |
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4.3.1 Principle of Sputtering |
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113 | (1) |
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4.3.1.1 Sputtering phenomenon |
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114 | (3) |
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117 | (2) |
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4.3.1.3 Solid angular distribution of sputtered particles |
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119 | (1) |
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4.3.1.4 Film thickness distribution |
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120 | (2) |
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4.3.1.5 Properties of sputter-deposited films |
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122 | (2) |
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4.3.2 Sputter Deposition Apparatus |
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124 | (1) |
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4.3.2.1 DC sputter apparatus and RF sputter apparatus |
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124 | (1) |
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4.3.2.2 Magnetron sputtering |
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124 | (2) |
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4.3.3 Applied Sputter Deposition |
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126 | (1) |
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4.3.3.1 Reactive sputtering |
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126 | (1) |
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4.3.3.2 Deposition of alloys and compounds |
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127 | (2) |
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4.3.3.3 Ion beam sputtering |
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129 | (4) |
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133 | (26) |
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133 | (1) |
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133 | (6) |
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5.2.1 Atom Stacking and Development of a Film |
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133 | (3) |
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136 | (3) |
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139 | (8) |
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140 | (1) |
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5.3.1.1 Homogeneous nucleation |
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140 | (1) |
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5.3.1.2 Heterogeneous nucleation |
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141 | (2) |
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5.3.1.3 Surface and interfacial energy and growth mode |
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143 | (1) |
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5.3.2 Kinetics of Nucleation |
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144 | (1) |
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5.3.2.1 Adsorption and desorption |
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144 | (1) |
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5.3.2.2 Rate of nucleation |
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145 | (2) |
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5.4 Development of Film Microstructures |
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147 | (12) |
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5.4.1 Island Growth and Coalescence |
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147 | (3) |
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5.4.2 Development of Polycrystalline Film Structures |
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150 | (3) |
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153 | (6) |
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159 | (30) |
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159 | (1) |
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6.2 Classification of Etching |
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159 | (6) |
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165 | (3) |
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165 | (1) |
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6.3.2 Anisotropic Etching |
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166 | (2) |
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168 | (3) |
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171 | (7) |
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6.5.1 Thermoreactive chemical etching |
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171 | (1) |
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172 | (2) |
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6.5.2.1 Si etching under F-based chemistry |
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174 | (1) |
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6.5.2.2 Etching of SiO2 and Si3N4 using fluorinated gases |
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175 | (1) |
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6.5.2.3 Selective etching Si and Si02 |
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176 | (2) |
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6.5.3 Photo-Assisted Chemical Etching and Electric Charging |
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178 | (1) |
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6.6 Physical and Chemical Dry Etching |
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178 | (11) |
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6.6.1 Reactive-Ion Etching |
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179 | (1) |
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6.6.1.1 Principle and apparatus of RIE |
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179 | (1) |
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6.6.1.2 Reaction mechanisms |
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179 | (3) |
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6.6.1.3 Anisotropic etching by sidewall protection |
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182 | (1) |
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6.6.2 Other Types of Ion-Assisted Etching Techniques |
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183 | (1) |
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6.6.2.1 Reactive-ion beam etching |
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183 | (1) |
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6.6.2.2 Remote plasma etching |
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184 | (5) |
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189 | (22) |
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189 | (1) |
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7.2 Introduction to Photolithography |
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190 | (3) |
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193 | (4) |
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7.3.1 Photoresist Materials |
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194 | (1) |
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7.3.2 Photoresist Coating |
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195 | (2) |
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197 | (3) |
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7.4.1 Photomask Materials |
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197 | (1) |
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7.4.2 Designing Photomask Patterns |
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198 | (2) |
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200 | (11) |
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200 | (1) |
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7.5.1.1 Contact and proximity printers |
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200 | (1) |
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7.5.1.2 Projection printers and steppers |
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201 | (7) |
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208 | (3) |
Appendix A Symbols and Variables |
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211 | (2) |
Appendix B Basic Physical Constants |
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213 | (2) |
Appendix C Development of Facets |
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215 | (4) |
Index |
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219 | |