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E-raamat: Advanced Tomographic Methods in Materials Research and Engineering [Oxford Scholarship Online e-raamatud]

Edited by (Department of Materials Science, Hahn-Meitner-Institute, Berlin)
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Tomography provides three-dimensional images of heterogeneous materials or engineering components, and offers an unprecedented insight into their internal structure. By using X-rays generated by synchrotrons, neutrons from nuclear reactors, or electrons provided by transmission electron microscopes, hitherto invisible structures can be revealed which are not accessible to conventional tomography based on X-ray tubes.

This book is mainly written for applied physicists, materials scientists and engineers. It provides detailed descriptions of the recent developments in this field, especially the extension of tomography to materials research and engineering. The book is grouped into four parts: a general introduction into the principles of tomography, image analysis and the interactions between radiation and matter, and one part each for synchrotron X-ray tomography, neutron tomography, and electron tomography. Within these parts, individual chapters written by different authors describe important versions of tomography, and also provide examples of applications to demonstrate the capacity of the methods. The accompanying CD-ROM contains some typical data sets and programs to reconstruct, analyse and visualise the three-dimensional data.
Basic Concepts
Introduction
3(16)
History and motivation
3(4)
What is tomography?
7(2)
Non-destructive techniques using simple projections
8(1)
Non-destructive techniques using information beyond simple projection data
8(1)
Destructive techniques
8(1)
What is resolution?
9(2)
Tomographic methods not further treated in this book
11(4)
Positron emission tomography
11(1)
Electrical impedance or resistance tomography
12(1)
Electrical capacitance tomography
12(1)
Magnetic resonance imaging
13(1)
Seismic tomography
13(1)
Tomographic imaging by sectional slicing
14(1)
3D atom probe tomography
14(1)
Summary
15(2)
References
17(2)
Some mathematical concepts for tomographic reconstruction
19(18)
Foundations of reconstruction from projections
19(4)
Notation, definitions, the reconstruction problem
19(1)
Theoretical background to the solution of the reconstruction problem
20(3)
Examples of reconstruction methods
23(8)
Filtered backprojection
23(2)
Algebraic reconstruction techniques
25(4)
Discrete tomography
29(2)
Some problems associated with the application of reconstruction algorithms
31(3)
Resolution and sampling
31(1)
Incomplete data
32(1)
Beam hardening
33(1)
Summary
34(1)
References
34(3)
Visualization, processing and analysis of tomographic data
37(70)
Lattices, adjacency of lattice points, and images
37(9)
Homogeneous lattices
38(1)
Image data
39(1)
Adjacency and Euler number
40(5)
Connected components
45(1)
Visualization
46(6)
Volume rendering
46(3)
Surface rendering
49(3)
Processing of image data
52(20)
Fourier transform
52(2)
Morphological transforms
54(3)
Geodesic morphological transforms
57(2)
Linear filters
59(5)
Non-linear filters
64(5)
Distance transforms
69(1)
Skeletonization
70(2)
Segmentation
72(9)
Binarization
72(4)
Connected-component labelling
76(2)
Watershed transform
78(2)
Further segmentation methods
80(1)
Analysis of image data
81(13)
Features of connected components
82(4)
Field features
86(2)
Fluctuations
88(6)
Modelling materials properties
94(6)
Linear elasticity
95(1)
Finite element method
96(4)
References
100(7)
Radiation sources and interaction of radiation with matter
107(34)
General definitions
107(7)
Scattering from a single target
108(2)
Scattering from an ensemble of targets
110(1)
Absorption and attenuation coefficients
111(3)
Refraction and reflection
114(1)
Generation of X-rays and their interaction with matter
114(9)
X-ray sources
114(5)
X-ray interactions: overview
119(1)
Photoelectric effect
120(2)
Elastic scattering
122(1)
Inelastic scattering
122(1)
Total interaction
123(1)
Refraction
123(1)
Generation of electrons and their interaction with matter
123(6)
Electron sources
125(1)
Electron interactions: overview
125(1)
Elastic scattering
126(2)
Inelastic scattering
128(1)
Generation of neutrons and their interaction with matter
129(7)
Neutron sources
129(3)
Neutron interactions: overview
132(1)
Nuclear scattering
132(3)
Magnetic interactions
135(1)
Nuclear absorption
135(1)
Total attenuation
135(1)
Refraction
136(1)
Comparison of interactions
136(1)
Summary
137(1)
References
137(4)
Synchrotron X-ray Tomography
Synchrotron X-ray absorption tomography
141(20)
Synchrotron radiation for tomography
141(1)
Principles of synchrotron X-ray tomography
142(2)
Data reconstruction
144(1)
Image artefacts
145(4)
Ring artefacts
145(1)
Image noise
146(1)
Edge artefacts
146(1)
Motion artefacts
147(1)
Beam hardening
148(1)
Metal artefacts
149(1)
Centring errors of the rotation axis
149(1)
Applications and 3D image analysis
149(8)
Metal-foam stabilization by silicon carbide particles
149(4)
Discharge processes in alkaline cells
153(2)
Ceramic foams as artificial bone marrow
155(2)
Summary
157(1)
References
158(3)
Phase-contrast and holographic tomography
161(20)
Propagation of light and phase contrast
161(2)
Interferometry for phase tomography
163(1)
Bonse-Hart interferometry
163(1)
Differential interferometry
164(1)
Zernike phase contrast for tomography
165(1)
Diffraction-enhanced imaging
165(2)
Propagation-based phase tomography
167(6)
Transport of intensity approaches
168(3)
Holotomography
171(2)
Integrated approach
173(1)
Coherent diffractive imaging
173(2)
Polychromatic phase imaging
175(1)
Summary
176(1)
References
177(4)
Tomography using magnifying optics
181(30)
Fresnel zone-plate microscopy and microtomography
183(19)
Fresnel zone-plate for hard X-rays
183(4)
Optical system and imaging properties of FZP microscope
187(7)
Microtomography with Fresnel zone-plate objectives
194(3)
Applications to materials science and engineering
197(5)
Hard X-ray microscopy and tomography based on refractive and reflective optics
202(5)
Refraction and total external reflection of hard X-rays
202(2)
Tomography based on hard X-ray full-field microscopy
204(2)
Tomography using a hard X-ray microscope based on magnified projection imaging
206(1)
Summary
207(1)
References
208(3)
Scanning tomography
211(38)
Fluorescence tomography
211(24)
History
211(2)
Description of fluorescence tomography signal and relevant parameters
213(7)
Reconstruction algorithm
220(3)
3D fluorescence tomography helical scan
223(1)
Instrumental setup
224(2)
Time-saving strategies in fluorescence tomography
226(5)
Applications
231(4)
X-ray absorption and small-angle scattering tomographies
235(8)
Introduction
235(1)
Tomographic imaging by absorption spectroscopy
236(4)
Tomographic imaging by small-angle X-ray scattering
240(3)
Summary
243(1)
References
244(5)
Three-dimensional X-ray diffraction
249(28)
Basic setup and strategy
250(3)
Indexing and characterization of average properties of each grain
253(5)
Polycrystal indexing
253(2)
A statistical description of dynamics
255(1)
Applications
255(3)
Mapping of grains within undeformed specimens
258(6)
Forward projection
260(1)
Algebraic solution
260(2)
Monte-Carlo-based reconstruction
262(1)
Applications
263(1)
Mapping of orientations within deformed specimens
264(3)
Discrete tomography algorithm for moderately deformed specimens
265(2)
Heavily deformed materials
267(1)
Combining 3DXRD and tomography
267(2)
3DXRD microscopes
269(1)
Geometric principles
269(4)
Diffraction geometry
270(1)
Representation of crystallographic orientation
271(2)
Summary and outlook
273(1)
References
273(4)
Detectors for synchrotron tomography
277(28)
Scintillation mechanism
278(1)
Spatial resolution and detective quantum efficiency
279(4)
Powder screens
283(1)
Crystal converter screens
284(5)
Essential properties of crystal converter screens
285(1)
Bulk converter screens
285(2)
Composed converter screens
287(1)
Polycrystalline scintillators
288(1)
Optical coupling
289(4)
Lens coupling: finite-focused versus infinity-focused systems
291(2)
Fibre-optical coupling
293(1)
Readout based on CCD cameras
293(4)
Categories of CCD cameras
294(2)
Noise factors in CCD cameras
296(1)
Readout schemes of CCD cameras
296(1)
Review of potential solutions for large field of view detector
297(2)
a-Si-based flat panels
297(1)
CMOS photodiode arrays
298(1)
Summary
299(1)
References
300(5)
Electron Tomography
Fundamentals of electron tomography
305(30)
Introduction
305(1)
Tomography using the electron microscope
306(4)
The projection requirement
306(1)
Acquisition
307(3)
Alignment and reconstruction
310(8)
Alignment of tilt series
310(1)
Alignment by cross-correlation
311(1)
Alignment by tracking of fiducial markers
312(1)
Tilt-axis alignment without fiducial markers
312(3)
Reconstruction
315(2)
Segmentation
317(1)
Quantitative analysis
318(1)
Bright-field and dark-field electron tomography
318(2)
Bright-field tomography
318(1)
Dark-field (DF) tomography
319(1)
HAADF STEM tomography
320(4)
EFTEM tomography
324(2)
Unconventional modes for electron tomography
326(3)
Energy-dispersive X-ray (EDX) mapping
326(1)
Holographic tomography
327(1)
Confocal STEM
328(1)
Atomic-resolution tomography
328(1)
References
329(6)
Applications of electron tomography
335(40)
Applications in materials research
335(15)
Heterogeneous catalysts
335(1)
Polymers
336(2)
Nanotubes and semiconductor nanostructures
338(4)
Biomaterials
342(4)
Metallic nanostructures
346(2)
3D electrostatic potentials
348(1)
3D visualization of defects by dark-field tomography
348(2)
Applications in semiconductor industry
350(18)
Electron tomography in semiconductor manufacturing
350(1)
Technical requirements and methodical problems
351(6)
Application examples
357(10)
Future prospects
367(1)
References
368(7)
Neutron Tomography
Neutron absorption tomography
375(34)
Interaction of neutron radiation with matter and comparison to X-rays
375(3)
Specifics of neutron tomography
378(16)
Principle
378(2)
Neutron sources and beam characteristics
380(2)
Geometry (beamline design)
382(2)
Detectors
384(7)
Sample stage
391(1)
Shielding
391(1)
Data acquisition and processing
392(2)
Limitations in neutron tomography
394(2)
Temporal and spatial resolution
394(1)
Sample activation
395(1)
Selected applications and experimental options
396(10)
Conventional tomography
396(7)
Simultaneous application of neutron and X-ray tomography
403(1)
Energy-selective tomography
403(3)
Summary
406(1)
References
406(3)
Neutron phase-contrast and polarized neutron tomography
409(16)
Theory of phase-contrast imaging
410(2)
Experimental techniques for phase-contrast imaging
412(7)
Interferometric technique
412(2)
Free-path propagation technique
414(3)
Differential phase contrast
417(2)
Imaging with polarized neutrons
419(3)
Conclusions and outlook
422(1)
References
422(3)
Neutron-refraction and small-angle scattering tomography
425(16)
Refraction tomography
426(2)
Small-angle scattering tomography
428(1)
Experimental results: refraction tomography
429(8)
Experimental results: small-angle tomography
437(3)
References
440(1)
Facilities for tomography
441(8)
Synchrotron tomography
441(1)
Neutron tomography
441(1)
Electron tomography
442(5)
References
447(2)
Examples on CD-ROM
449(4)
References
451(2)
Index 453
John Banhart - Editor Professor for Materials Science at Technical University Berlin and Head of the Department of Materials Research at Hahn-Meitner Institute Berlin



1984: Degree in Physics, University of Munich

1989: PhD in Physical Chemistry, University of Munich

1990: Postdoc at University of Vienna

1998: Habilitation (2nd PhD) in Solid State Physics, University of Bremen

1991-2001: Senior Scientist at Fraunhofer-Institute for Materials Research Bremen

2002: Current Position