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E-raamat: Linear and Chiral Dichroism in the Electron Microscope [Taylor & Francis e-raamat]

Edited by (Vienna University of Technology, Austria)
  • Formaat: 278 pages, 126 Illustrations, black and white
  • Ilmumisaeg: 01-Mar-2012
  • Kirjastus: Pan Stanford Publishing Pte Ltd
  • ISBN-13: 9780429066580
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Linear and Chiral Dichroism in the Electron MicroscopeSuurem pilt
  • Formaat: 278 pages, 126 Illustrations, black and white
  • Ilmumisaeg: 01-Mar-2012
  • Kirjastus: Pan Stanford Publishing Pte Ltd
  • ISBN-13: 9780429066580
Teised raamatud teemal:
Taylor & Francis e-raamatudRohkem infot Taylor & Francis e-raamatute kohta
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Responding to growing interest in the miniaturization of magnetic-storage media and the quest for novel spintronics applications, this account asserts energy-loss magnetic chiral dichroism (EMCD) as a promising technique for magnetic studies on the nanometer and subnanometer scale, providing the technical and logistic advantages of electron microscopy such as in situ chemical and structural information, easy access, and low cost. Regarding EMCD in the broader context of anisotropy in electron energy-loss spectroscopy (EELS), the role of the crystal as an electron interferometer for the setup of chiral electronic transitions, the appearance of retardation effects in EELS, theoretical approaches to X-ray absorption spectroscopy, and sum rules for spin and orbital moments, this intensive report explores the innovative methods being applied to research in the EMCD and X-ray magnetic circular dichroism (XMCD) fields.

Preface v
Foreword vii
Acknowledgments ix
Acronyms xv
Chapter 1 Anisotropy in Electron Energy Loss Spectrometry 1(22)
1.1 Introduction
1(1)
1.2 Interaction between a pair of electrons
2(2)
1.3 Fermi's golden rule
4(2)
1.4 The double differential scattering cross section
6(1)
1.5 The dipole approximation
7(4)
1.6 Scattering kinematics
11(1)
1.7 Experimental considerations
12(8)
1.8 Conclusion
20(3)
Chapter 2 The Principles of XMCD and Its Application to L-Edges in Transition Metals 23(20)
2.1 Introduction
23(1)
2.2 Experimental details
23(3)
2.3 The absorption coefficient and its magnetic part
26(1)
2.4 Origin of XMCD in a simple two-step model
27(6)
2.5 General formulation via the sum rules
33(3)
2.6 Magnetic X-ray microscopy
36(4)
2.7 Summary
40(3)
Chapter 3 Chirality in Electron Energy Loss Spectrometry 43(22)
3.1 Broken symmetries in EELS
43(1)
3.2 The effective photon
44(3)
3.3 Inelastic interference
47(3)
3.4 The mixed dynamic form factor
50(2)
3.5 Properties of the MDFF
52(3)
3.6 Equivalence to X-ray dichroism
55(2)
3.7 Experimental setup
57(5)
3.8 Chirality of transitions
62(3)
Chapter 4 Momentum-resolved ELNES and EMCD of L2,3 Edges from the Atomic Multiplet Theory 65(14)
4.1 Core level spectroscopy of transition metal oxides and strongly correlated materials
65(1)
4.2 Atomic multiplet theory for the calculation of X-ray absorption spectra
66(3)
4.3 Parameters for an atomic multiplet calculation
69(1)
4.4 Momentum-resolved EELS and EMCD spectra from the atomic multiplet theory
69(3)
4.5 EELS and EMCD spectra at the L2,3 edge of IRON in magnetite
72(4)
4.6 Conclusions
76(3)
Chapter 5 XMCD Spectra Based on Density Functional Theory 79(22)
5.1 Introduction
79(1)
5.2 Density functional theory
79(2)
5.3 The linearized augmented plane wave method
81(1)
5.4 XMCD
82(4)
5.5 Results
86(10)
5.6 Conclusions
96(5)
Chapter 6 Multiple-Scattering Theory and Interpretation of XMCD 101(14)
6.1 Multiple-scattering theory of XMCD
101(2)
6.2 Applications to XMCD
103(3)
6.3 Examples: Rare earth metals
106(6)
6.4 Conclusions
112(3)
Chapter 7 Linear Dichroism and the Magic Angle 115(14)
7.1 Relativistic effects
115(7)
7.2 The Magic Angle
122(4)
7.3 Conclusion
126(3)
Chapter 8 Sum Rules in EMCD and XMCD 129(20)
8.1 Operator expansion approach and XMCD sum rules
130(1)
8.2 Error sources in XMCD sum rules
131(1)
8.3 Simplified derivation of EMCD sum rules
132(3)
8.4 Rotationally invariant form of the EMCD sum rules
135(6)
8.5 Sum rules for real part of MDFFs
141(1)
8.6 Dipole allowed sum rules for ELNES spectra-summary
142(1)
8.7 Error sources in EMCD sum rules
143(6)
Chapter 9 EMCD Techniques 149(26)
9.1 Basic geometry for EMCD
150(4)
9.2 Tilt series
154(1)
9.3 Detector shift
155(3)
9.4 Objective aperture shift
158(1)
9.5 Convergent beam methods
159(4)
9.6 Chiral STEM
163(1)
9.7 The q vs. E diagram
164(1)
9.8 Chiral EFTEM
165(4)
9.9 Considerations on the convergence and collection angles
169(1)
9.10 Conclusions
170(5)
Chapter 10 Artefacts and Data Treatment in EMCD Spectra 175(22)
10.1 Artefacts in the data cube
176(9)
10.2 Data treatment
185(10)
10.3 Conclusion
195(2)
Chapter 11 The Role of the Crystal in EMCD 197(16)
11.1 The Bloch wave formalism
197(2)
11.2 The density matrix formalism
199(1)
11.3 Density matrices in the electron microscope
200(2)
11.4 Simulating the inelastic diffraction pattern
202(4)
11.5 Obtaining the EMCD signal
206(1)
11.6 Simulation results
207(2)
11.7 Recommendations for experiments
209(4)
Chapter 12 EMCD on the Nanometre Scale 213(12)
12.1 Introduction
213(1)
12.2 EMCD in the STEM
214(3)
12.3 Serial STEM-EMCD
217(3)
12.4 Parallel STEM-EMCD
220(2)
12.5 Conclusion
222(3)
Chapter 13 Magnetic Dichroism in X-ray Holography 225(18)
13.1 Overview
225(2)
13.2 Holography with soft X-rays
227(5)
13.3 Holographic imaging of magnetic domains
232(5)
13.4 Recent developments and outlook
237(6)
Chapter 14 Prospects for Spin Mapping with Atomic Resolution 243(14)
14.1 Mapping of single spins
243(4)
14.2 Prospects for sub-lattice resolution in EMCD
247(3)
14.3 Angular momentum in EELS
250(7)
Index 257
Peter Schattschneider studied physics at the Vienna University of Technology, Austria, and finished in 1973 with a diploma thesis on diffusion profiles in thin films. In 1974, he enrolled in the study of college teacher for physics and mathematics at the University of Vienna and obtained a mag. rer. nat. degree in 1977. After his PhD thesis on X-ray diffraction of binary alloys, he left Vienna University of Technology in 1976 and came back in 1980 as assistant at the Institute for Applied and Technical Physics. In the meantime, he worked in an engineering enterprise, dealing with remote sensing (air- and spaceborne sensors). In 1981, he obtained the Theodor-Körner award for work on the EEL spectrometer installed at the old ELMISKOP IA. In 1988, he became assistant professor at the Institute for Applied and Technical Physics of the Vienna University of Technology, where his main research interests were electron microscopy, inelastic electronmatter interactions, and electron energy-loss spectrometry. In 1992 and 1993, he was employed by the CNRS (Centre Nationale de la Recherche Scientifique) in Paris. Since 1995, he has been professeur invité at the École Centrale Paris. From January 2000 to June 2006, he was head of the University Service Center for Transmission Electron Microscopy (USTEM).
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