This overview of optical scanning technology brings together a wide range of principles and technologies related to optical information handling and transfer. Beiser offers concise chapters covering scanning theory and processes, resolution, positional error analysis and control, beam control and misplacement, active and passive scanning, and system architecture. The text includes a review of research on agile-beam steering and a comparison of major scanner types. Beiser is a retired data-scanning expert who has consulted for industry giants Xerox, Kodak, and Bell Labs. Annotation (c) Book News, Inc., Portland, OR (booknews.com)
Written by an award-winning leader in the field, this is a thoroughly integrated overview of the many facets and disciplines of optical scanning. Of particular utility to both practitioner and student are such features as:
- An overview of the technology and unifying principles, including active and passive scanning, optical transfer, and system architecture
- In-depth chapters on scanning theory and processes, scanned resolution, scanner devices and techniques, and the control of scanner beam misplacemen
- A comprehensive review of the government-sponsored research of agile beam steering, now primed for commercial adaptation
- A unique focus on the Lagrange invariant and its revealing resolution invariant
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Chapter
1. Introduction—Technology Overview and Unifying Principles. |
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1.1 Optical Scanning Characteristics and Disciplines. |
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1.2 Active and Passive Scanning. |
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1.3 Input, Output, and Remote Sensing Systems. |
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1.4 Optical and Resolution Invar |
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LEO BEISER retired recently as the president and research director of Leo Beiser Inc., a consulting and research company specializing in image and data scanning and recording for global clients including 3M, Agfa-Gevaert, Bell Labs, Boeing, Burroughs, Compugraphic, Kodak, Canon, General Electric, Polaroid, Scitex, and Xerox. Prior to that, as a staff researcher and project manager at CBS Laboratories, Autometric/Raytheon, Radio Receptor Corporation, and Polarad Electronics Corp., he pioneered formative advances in super-high resolution/speed image and data scanning and recording. An extensively published author and internationally renowned expert, Beiser has been recognized by his profession with numerous awards including the prestigious George W. Goddard Award from the International Society for Optical Engineering. Leo Beiser is Adjunct Professor in the Institute of Imaging Science, Polytechnic University, New York
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