Suman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra
(Ilmumisaeg: 18-Aug-2020, EPUB+DRM, Kirjastus: Taylor & Francis Ltd, ISBN-13: 9781000168174)
This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic co...Loe edasi...
Suman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra
(Ilmumisaeg: 18-Aug-2020, PDF+DRM, Kirjastus: Taylor & Francis Ltd, ISBN-13: 9781000168150)
This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic co...Loe edasi...
The Complete, Modern Tutorial on Practical VLSI Chip Design, Validation, and Analysis As microelectronics engineers design complex chips using existing circuit libraries, they must ensure correct logical, physical, and electrical properties, and pre...Loe edasi...
(Ilmumisaeg: 24-Apr-2018, PDF+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781351227773)
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system levelDescribes range of algorithms for addressing thermal-aware test issue, presents...Loe edasi...
(Ilmumisaeg: 24-Apr-2018, EPUB+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781351227766)
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system levelDescribes range of algorithms for addressing thermal-aware test issue, presents...Loe edasi...
Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, D. Boolchandani, Virendra Sing, Adit Singh
Sari: Communications in Computer and Information Science
(Ilmumisaeg: 13-Dec-2013, PDF+DRM, Kirjastus: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, ISBN-13: 9783642420245)
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers...Loe edasi...
Sari: Theoretical Computer Science and General Issues
(Ilmumisaeg: 26-Jun-2012, PDF+DRM, Kirjastus: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, ISBN-13: 9783642314940)
This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster session...Loe edasi...
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-c...Loe edasi...
(Ilmumisaeg: 04-Jun-2007, PDF+DRM, Kirjastus: Springer-Verlag New York Inc., ISBN-13: 9780387465470)
Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have...Loe edasi...
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-dat...Loe edasi...
