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E-raamat: Electron Beam-Specimen Interactions and Simulation Methods in Microscopy [Wiley Online]

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Electron Beam-Specimen Interactions and Simulation Methods in MicroscopySuurem pilt
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Raamatu kodulehekülg: https://onlinelibrary.wiley.com/doi/book/10.1002/9781118696545

A detailed presentation of the physics of electron beam-specimen interactions

Electron microscopy is one of the most widely used characterisation techniques in materials science, physics, chemistry, and the life sciences. This book examines the interactions between the electron beam and the specimen, the fundamental starting point for all electron microscopy. Detailed explanations are provided to help reinforce understanding, and new topics at the forefront of current research are presented. It provides readers with a deeper knowledge of the subject, particularly if they intend to simulate electron beam-specimen interactions as part of their research projects. The book covers the vast majority of commonly used electron microscopy techniques. Some of the more advanced topics (annular bright field and dopant atom imaging, atomic resolution chemical analysis, band gap measurements) provide additional value, especially for readers who have access to advanced instrumentation, such as aberration-corrected and monochromated microscopes.

Electron Beam-Specimen Interactions and Simulation Methods in Microscopy offers enlightening coverage of: the Monte-Carlo Method; Multislice Simulations; Bloch Waves in Conventional and Analytical Transmission Electron Microscopy; Bloch Waves in Scanning Transmission Electron Microscopy; Low Energy Loss and Core Loss EELS. It also supplements each chapter with clear diagrams and provides appendices at the end of the book to assist with the pre-requisites.

  • A detailed presentation of the physics of electron beam-specimen interactions
  • Each chapter first discusses the background physics before moving onto simulation methods
  • Uses computer programs to simulate electron beam-specimen interactions (presented in the form of case studies)
  • Includes hot topics brought to light due to advances in instrumentation (particularly aberration-corrected and monochromated microscopes)

Electron Beam-Specimen Interactions and Simulation Methods in Microscopy benefits students undertaking higher education degrees, practicing electron microscopists who wish to learn more about their subject, and researchers who wish to obtain a deeper understanding of the subject matter for their own work.

Preface ix
1 Introduction
1(8)
1.1 Organisation and Scope of the Book
3(6)
References
8(1)
2 The Monte Carlo Method
9(44)
2.1 Physical Background and Implementation
11(16)
2.1.1 Elastic Scattering By an Atomic Nucleus
11(7)
2.1.2 Inelastic Scattering by Atomic Electrons
18(5)
2.1.3 Implementation of the Monte Carlo Algorithm
23(4)
2.2 Some Applications of the Monte Carlo Method
27(13)
2.2.1 Spatial Resolution and Backscattered Imaging
27(7)
2.2.2 Characteristic X-Ray Generation
34(3)
2.2.3 Cathodoluminescence and Electron Beam Induced Current Microscopy
37(3)
2.3 Further Topics in Monte Carlo Simulations
40(9)
2.3.1 Classical or Quantum Physics?
40(3)
2.3.2 Spin-Orbit Coupling and the Mott Cross-Section
43(3)
2.3.3 Dielectric Model of Stopping Power and Secondary Electron Emission
46(3)
2.4 Summary
49(4)
References
50(3)
3 Multislice Method
53(52)
3.1 Mathematical Treatment of the Multislice Method
56(22)
3.1.1 Specimen Transmission Function
59(7)
3.1.2 Fresnel Propagator Function
66(5)
3.1.3 Objective Lens Contrast Transfer Function and Partial Coherence
71(5)
3.1.4 Implementation of the Multislice Algorithm
76(2)
3.2 Applications of Multislice Simulations
78(15)
3.2.1 HREM Imaging and Electron Crystallography
78(9)
3.2.2 CBED and STEM Applications: Frozen Phonon Model
87(6)
3.3 Further Topics in Multislice Simulation
93(9)
3.3.1 Accuracy of Multislice Algorithms
93(4)
3.3.2 Is the Frozen Phonon Model Physically Realistic?
97(5)
3.4 Summary
102(3)
References
102(3)
4 Bloch Waves
105(60)
4.1 Basic Principles
106(26)
4.1.1 Mathematical Background
106(5)
4.1.2 Application to Two-Beam Theory
111(5)
4.1.3 Phenomenological Modelling of Thermal Diffuse Scattering
116(8)
4.1.4 Bloch States in Zone-Axis Orientations
124(8)
4.2 Applications of Bloch Wave Theory
132(17)
4.2.1 HREM Imaging
132(2)
4.2.2 HAADF Imaging
134(10)
4.2.3 Bloch Wave Scattering By Elastic Strain Fields
144(5)
4.3 Further Topics in Bloch Waves
149(11)
4.3.1 Dopant Atom Imaging in STEM
149(7)
4.3.2 Electron Channelling and Its Uses
156(4)
4.4 Summary
160(5)
References
161(4)
5 Single Electron Inelastic Scattering
165(50)
5.1 Fundamentals of Inelastic Scattering
166(35)
5.1.1 Electron Excitation in a Single Atom by a Plane Wave
166(14)
5.1.2 Mixed Dynamic Form Factor
180(9)
5.1.3 Yoshioka Equations and Inelastic Scattering within a Crystal
189(6)
5.1.4 Coherence in Inelastic Scattering
195(6)
5.2 Fine Structure of The Electron Energy Loss Signal
201(10)
5.2.1 Origin of Fine Structure
201(5)
5.2.2 Core Hole Effects
206(3)
5.2.3 Magnetic Circular Dichroism
209(2)
5.3 Summary
211(4)
References
212(3)
6 Electrodynamic Theory of Inelastic Scattering
215(48)
6.1 Bulk and Surface Energy Loss
216(28)
6.1.1 Energy Loss in an `Infinite' Solid
216(10)
6.1.2 Phonon Spectroscopy
226(6)
6.1.3 Interface and Surface Contributions
232(12)
6.2 Radiative Phenomena
244(9)
6.2.1 Cerenkov Radiation and Band Gap Measurement
244(5)
6.2.2 Transition Radiation
249(4)
6.3 Simulating Low Energy Loss EELS Spectra
253(6)
6.3.1 Discrete Dipole Approximation (DDA)
253(1)
6.3.2 Boundary Element Method (BEM)
254(5)
6.4 Summary
259(4)
References
259(4)
Appendix A The First Born Approximation and Atom Scattering Factor 263(4)
Appendix B Potential for an `Infinite' Perfect Crystal 267(2)
Appendix C The Transition Matrix Element in the One Electron Approximation 269(2)
Appendix D Bulk Energy Loss in the Retarded Regime 271(4)
Index 275
BUDHIKA G. MENDIS, PhD, is Associate Professor at the Department of Physics, Durham University, UK, where he teaches electron microscopy at both undergraduate and postgraduate levels. He has over 15 years of experience in all the major electron microscopy techniques, including aberration-correction, and has used many of the simulation methods discussed in this book as part of his own research.
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