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E-raamat: Scanning Probe Microscopy of Soft Matter - Fundamentals and Practices: Fundamentals and Practices [Wiley Online]

(Georgia Institute of Technology, Atlanta, USA), (Washington University in St. Louis, USA)
  • Formaat: 661 pages
  • Ilmumisaeg: 16-Nov-2011
  • Kirjastus: Blackwell Verlag GmbH
  • ISBN-10: 3527639950
  • ISBN-13: 9783527639953
Teised raamatud teemal:
  • Wiley Online
  • Hind: 216,75 €*
  • * hind, mis tagab piiramatu üheaegsete kasutajate arvuga ligipääsu piiramatuks ajaks
Scanning Probe Microscopy of Soft Matter - Fundamentals and Practices: Fundamentals and PracticesSuurem pilt
  • Formaat: 661 pages
  • Ilmumisaeg: 16-Nov-2011
  • Kirjastus: Blackwell Verlag GmbH
  • ISBN-10: 3527639950
  • ISBN-13: 9783527639953
Teised raamatud teemal:
Wiley Online e-raamatudRohkem infot Wiley Online kohta
Raamatu kodulehekülg: https://onlinelibrary.wiley.com/doi/book/10.1002/9783527639953
Tsukruk (materials science and engineering, Georgia Institute of Technology, US) and Singamanni (mechanical engineering and materials science, Washington U., Missouri) review the current state in using the imaging technology to characterize soft organic, polymeric, and biological materials. They cover microscopy fundamentals; probing nanoscale physical and chemical properties; scanning probe techniques for various soft materials; and nano-manipulation, patterning, and sensing. Specific topics include the basics of atomic force microscopy studies of soft matter, mechanical properties of polymers and macromolecules, highly branched macromolecules, biomaterials and biological structures, and dip-pen nanolithography. Annotation ©2012 Book News, Inc., Portland, OR (booknews.com)

Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy,
showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide
range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning.

This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy
in soft matter research.

From the contents:

* Atomic Force Microscopy and Other Advanced Imaging Modes
* Probing of Mechanical, Thermal Chemical and Electrical Properties
* Amorphous, Poorly Ordered and Organized Polymeric Materials
* Langmuir-Blodgett and Layer-by-Layer Structures
* Multi-Component Polymer Systems and Fibers
* Colloids and Microcapsules
* Biomaterials and Biological Structures
* Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography
* Microcantilever-Based Sensors
Preface xv
Part One Microscopy Fundamentals
1(98)
1 Introduction
3(6)
References
6(3)
2 Scanning Probe Microscopy Basics
9(26)
2.1 Basic Principles of Scanning Probe Microscopy
9(1)
2.2 Scanning Tunneling Microscopy
10(1)
2.3 Advent of Atomic Force Microscopy
10(1)
2.4 Overview of Instrumentation
11(5)
2.4.1 Scanners
11(1)
2.4.2 Microcantilevers as Force Sensors
12(3)
2.4.3 Electronic Feedback
15(1)
2.5 Probes and Cantilevers in Scanning Probe Microscopy
16(8)
2.5.1 Physical Attributes of Microcantilevers
18(3)
2.5.2 Tip Characterization
21(2)
2.5.3 Tip Modification
23(1)
2.6 Modes of Operation
24(4)
2.6.1 Contact Mode
25(1)
2.6.2 Noncontact Mode and Tapping Mode
26(2)
2.7 Advantages and Limitations
28(7)
References
29(6)
3 Basics of Atomic Force Microscopy Studies of Soft Matter
35(34)
3.1 Physical Principles: Forces of Interaction
35(7)
3.1.1 Long-Range Forces
36(1)
3.1.2 Short-Range Forces
36(2)
3.1.3 Other Forces of Interaction
38(2)
3.1.4 Resolution Criteria
40(1)
3.1.5 Scan Rates and Resonances
41(1)
3.2 Imaging in Controlled Environment
42(4)
3.2.1 AFM Imaging in Liquid
42(2)
3.2.2 AFM at Controlled Temperature
44(1)
3.2.3 Imaging in Controlled Humidity
44(2)
3.3 Artifacts in AFM Imaging of Soft Materials
46(13)
3.3.1 Surface Damage and Deformation
47(1)
3.3.2 Tip Dilation
47(1)
3.3.3 Damaged and Contaminated Tip or Surface
48(2)
3.3.4 Noises and Vibrations
50(1)
3.3.5 Tip Artifacts
51(2)
3.3.6 Thermal Drift and Piezoelement Creep
53(2)
3.3.7 Oscillations and Artificial Periodicities
55(1)
3.3.8 Image Processing Artifacts
56(3)
3.4 Some Suggestions and Hints for Avoiding Artifacts
59(10)
3.4.1 Tip Testing and Deconvolution
59(2)
3.4.2 Force Control
61(2)
3.4.3 Tip Contamination and Cleaning
63(2)
References
65(4)
4 Advanced Imaging Modes
69(30)
4.1 Surface Force Spectroscopy
69(3)
4.1.1 Introduction to Force Spectroscopy
69(1)
4.1.2 Force---Distance Curves
70(2)
4.1.3 Force Mapping Mode
72(1)
4.2 Friction Force Microscopy
72(2)
4.3 Shear Modulation Force Microscopy
74(1)
4.4 Chemical Force Microscopy (CFM)
75(2)
4.5 Pulsed Force Microscopy
77(1)
4.6 Colloidal Probe Microscopy
78(1)
4.7 Scanning Thermal Microscopy
79(7)
4.7.1 Thermal Resistive Probes and Spatial Resolution
81(1)
4.7.2 Localized Thermal Analysis
82(1)
4.7.3 Thermal Conductivity
83(3)
4.8 Kelvin Probe and Electrostatic Force Microscopy
86(2)
4.9 Conductive Force Microscopy
88(1)
4.10 Magnetic Force Microscopy
89(1)
4.11 Scanning Acoustic Force Microscopy
90(2)
4.11.1 Force Modulation
90(1)
4.11.2 Ultrasonic Force Microscopy
90(2)
4.12 High-Speed Scanning Probe Microscopy
92(7)
References
94(5)
Part Two Probing Nanoscale Physical and Chemical Properties
99(124)
5 Mechanical Properties of Polymers and Macromolecules
101(52)
5.1 Elements of Contact Mechanics and Elastic Modulus
102(10)
5.1.1 General SFS Nanoprobing Principles
102(4)
5.1.2 Substrate Effects
106(2)
5.1.3 Issues and Key Assumptions with Nanomechanical Probing
108(4)
5.2 Probing of Elastic Moduli for Different Materials: Selected Examples
112(13)
5.2.1 Bulk Materials and Blends
112(5)
5.2.2 Ultrathin Polymer Films from Different Polymers
117(5)
5.2.3 Probing Individual Macromolecules
122(3)
5.3 Adhesion Measurements
125(6)
5.4 Viscoelasticity Measurements
131(4)
5.5 Friction
135(4)
5.6 Unfolding of Macromolecules
139(14)
References
144(9)
6 Probing of Microthermal Properties
153(22)
6.1 Introduction
153(1)
6.2 Measurements of Glass Transition
154(6)
6.2.1 Ultrathin Polymer Films
154(1)
6.2.2 Polymer Brushes
155(2)
6.2.3 Thin Films from Polymer Blends
157(2)
6.2.4 Depth Variation of Glass Transition in Photodegradable Polymers
159(1)
6.3 Melting, Crystallization, and Liquid Crystalline Phase Transformations
160(5)
6.4 Thermal Expansion of Microstructures
165(4)
6.5 Surface Thermal Conductivity
169(6)
References
173(2)
7 Chemical and Electrical Properties
175(24)
7.1 Chemical Interactions
175(7)
7.1.1 Chemical Interactions between Molecular Assemblies
176(3)
7.1.2 Chemical Interactions of Polymer Surfaces
179(3)
7.2 Electrochemical Properties
182(1)
7.3 Work Function and Surface Potential
183(5)
7.3.1 Effect of Tip Shape on Surface Potential and Work Function Measurements
184(1)
7.3.2 Surface Potential and Work Function of Molecular and Polymeric Surfaces
185(2)
7.3.3 Surface Potential and Work Function of Low-Dimensional Carbon Systems
187(1)
7.4 Conductivity
188(6)
7.4.1 Conductive Probes
190(1)
7.4.2 Effect of Tip---Sample Interaction on Conductivity Measurements
191(1)
7.4.3 C-AFM of Polymeric and Molecular Systems
192(2)
7.5 Magnetic Properties
194(5)
References
195(4)
8 Scanning Probe Optical Techniques
199(24)
8.1 Fundamental Principles
199(1)
8.2 Introduction to Scanning Near-Field Optical Microscopy
199(4)
8.2.1 Aperture NSOM
200(1)
8.2.2 Apertureless NSOM
201(1)
8.2.3 Artifacts in NSOM
202(1)
8.3 Examples of NSOM Studies of Polymer and Polymer Blends
203(3)
8.3.1 NSOM for Monitoring the Composition and Physical State
203(2)
8.3.2 Optical Properties of Conjugated Polymers and Their Blends
205(1)
8.4 Multicolor NSOM Measurements
206(1)
8.5 Tip-Enhanced Raman Spectroscopy and Microscopy
207(5)
8.6 AFM Tip-Enhanced Fluorescence
212(2)
8.7 Integrating AFM with Fluorescence Optical Microscopy
214(1)
8.8 Integrating AFM with Confocal Raman Microscopy
215(8)
References
218(5)
Part Three Scanning Probe Techniques for Various Soft Materials
223(304)
9 Amorphous and Poorly Ordered Polymers
225(32)
9.1 Introduction
225(1)
9.2 Glassy Amorphous Polymers
226(8)
9.3 Rubbers
234(7)
9.4 Polymer Gels
241(10)
9.5 Interpenetrating Polymer Networks
251(6)
References
253(4)
10 Organized Polymeric Materials
257(38)
10.1 Crystalline Polymers
257(14)
10.1.1 Polyethylene Crystals
258(2)
10.1.2 Polypropylene Crystals and Materials
260(3)
10.1.3 Polyethylene Oxide Crystals
263(3)
10.1.4 Poly-ε-Caprolactone Crystals
266(1)
10.1.5 Polylactic Acid Crystals
267(1)
10.1.6 Crystalline Block Copolymers
267(2)
10.1.7 Other Polymer Crystals
269(2)
10.2 Liquid Crystalline Polymeric Materials
271(4)
10.3 Periodic Polymeric Structures
275(20)
References
287(8)
11 Highly Branched Macromolecules
295(34)
11.1 Dendrimers and Dendritic Molecules
295(6)
11.2 Brush Molecules
301(4)
11.3 Hyperbranched Polymers
305(7)
11.4 Star Molecules
312(6)
11.5 Highly Branched Nanoparticles
318(11)
References
320(9)
12 Multicomponent Polymer Systems and Fibers
329(40)
12.1 Polymer Blends
330(7)
12.2 Block Copolymers
337(9)
12.3 Polymer Nanocomposites
346(6)
12.4 Porous Membranes
352(4)
12.5 Micro- and Nanofibers
356(13)
References
364(5)
13 Engineered Surface and Interfacial Materials
369(48)
13.1 Surface Brush Layers
369(22)
13.1.1 Homopolymer Brush Layers
371(9)
13.1.2 Grafted Diblock Copolymers
380(7)
13.1.3 Mixed Brush Layers
387(4)
13.2 Self-Assembled Monolayers
391(13)
13.2.1 Growth Modes of SAMs
393(1)
13.2.2 Thiol SAMs
394(2)
13.2.3 Alkylsilane SAMs
396(3)
13.2.4 Nanotribological Studies
399(2)
13.2.5 Adsorption Control with Surface Modifications
401(3)
13.3 Adsorbed Macromolecules on Different Substrates
404(13)
13.3.1 Short-Chain Linear Molecules
404(1)
13.3.2 Long-Chain Macromolecules
405(1)
13.3.3 Brush-Like Macromolecules
406(3)
References
409(8)
14 Langmuir---Blodgett and Layer-by-Layer Structures
417(42)
14.1 LbL films
418(16)
14.1.1 Conventional LbL Films
418(4)
14.1.2 Composite LbL Films
422(10)
14.1.3 Porous LbL Films
432(2)
14.2 Langmuir---Blodgett Films
434(25)
14.2.1 Molecular Order and Defects
435(6)
14.2.2 Mixed and Composite LB Films
441(6)
14.2.3 Mechanical and Tribological Properties
447(6)
References
453(6)
15 Colloids and Microcapsules
459(34)
15.1 Colloids and Latexes
460(8)
15.1.1 Individual and Aggregated Solid Microparticles
461(2)
15.1.2 Composite Microparticles
463(5)
15.2 Thin Shell Microcapsules
468(9)
15.2.1 LbL Microcapsules
468(4)
15.2.2 Hollow Biomolecular and Biotemplated Microcapsules
472(2)
15.2.3 AFM Testing of Mechanical Properties of LbL Microcapsules
474(3)
15.3 Replicas and Anisotropic Template Structures
477(3)
15.3.1 Anisotropic Replicas
477(2)
15.3.2 Colloidal Templated Crystals
479(1)
15.4 Interfacial Adhesion between Particles and Surfaces
480(13)
References
484(9)
16 Biomaterials and Biological Structures
493(34)
16.1 Imaging Adsorbed Biomacromolecules
493(11)
16.1.1 General Approaches and Selected Examples
493(9)
16.1.2 Peptides
502(2)
16.2 Probing Specific Biomolecular Interactions
504(3)
16.2.1 General Approaches to Nanoprobing
504(1)
16.2.2 Examples of Biomolecular Interactions
505(2)
16.3 Mechanics of Individual Biomacromolecules
507(8)
16.3.1 Stretching and Pulling of Long-Chain Molecules
507(4)
16.3.2 Unfolding of Different Biomacromolecules
511(4)
16.4 Single-Cell Elasticity
515(3)
16.5 Lipid Bilayers as Cell Membrane Mimics
518(9)
References
522(5)
Part Four Nanomanipulation, Patterning, and Sensing
527(96)
17 Scanning Probe Microscopy on Practical Devices
529(22)
17.1 Electrical SPM of Active Electronic and Optoelectronic Devices
529(11)
17.2 Magnetic Force Microscopy of Storage Devices
540(2)
17.3 NSOM of Electrooptical Devices and Nanostructures
542(3)
17.4 Friction Force Microscopy of Storage Media and MEMS Devices
545(6)
References
547(4)
18 Nanolithography with Intrusive AFM Tip
551(26)
18.1 Introduction to AFM Nanolithography
551(1)
18.2 Mechanical Lithography
552(7)
18.3 Local Oxidative Lithography
559(2)
18.4 Electrostatic Nanolithography
561(6)
18.5 Thermomechanical Nanolithography
567(10)
References
572(5)
19 Dip-Pen Nanolithography
577(20)
19.1 Basics of the Ink and Pen Approach
577(4)
19.2 Writing with a Single Pen
581(6)
19.3 Simultaneous Writing with Multiple Pens and Large-Scale DPN
587(10)
References
592(5)
20 Microcantilever-Based Sensors
597(26)
20.1 Basic Modes of Operation
597(6)
20.1.1 General Introduction
597(1)
20.1.2 Static Deflection Mode
598(2)
20.1.3 Dynamic Resonance Frequency Shift Mode
600(1)
20.1.4 Heat Sensing Behavior
601(2)
20.2 Thermal and Vapor Sensing
603(8)
20.2.1 Microcantilever Thermal Sensors
603(3)
20.2.2 Chemical Sensors
606(5)
20.3 Sensing in Liquid Environment
611(12)
References
615(8)
Index 623
Vladimir V. Tsukruk received his MS degree in physics from the National University of Ukraine, and his PhD and DSc in chemistry from the National Academy of Sciences of Ukraine. He carried out his post-doc at the universities of Marburg, Germany, and Akron, USA, and is currently a professor at the School of Materials Science and Engineering, Georgia Institute of Technology. He was elected an APS Fellow in 2010 and an MRS Fellow in 2011. He serves on the editorial advisory boards of five professional journals and has co-authored around 300 refereed articles in archival journals, as well as five books. Professor Tsukruk's research in the fields of surfaces/ interfaces, molecular assembly, nano- and bioinspired materials has been recognized by the Humboldt Research Award and the NSF Special Creativity Award, among others.

Currently an assistant professor in the Department of Mechanical Engineering and Materials Science at Washington University in St. Louis, Srikanth Singamaneni received his MS degree in electrical engineering from Western Michigan University and his PhD in polymer materials science and engineering from Georgia Institute of Technology. A recipient of the Materials Research Society Graduate Student Gold Award, he has co-authored over 60 refereed articles in archival journals as well as five book chapters. His current research interests include applications of scanning probe microscopy in biology, physical/chemical sensors based on organic/inorganic hybrids and plasmonic biosensors for label-free and point of care diagnostics.
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