This book explores the synergy between VLSI and Machine Learning and its applications across various domains. It will investigate how Machine Learning techniques can enhance the design and testing of VLSI circuits, improve power efficiency, optimi...Loe edasi...
This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implemen...Loe edasi...
This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The...Loe edasi...
The Complete, Modern Tutorial on Practical VLSI Chip Design, Validation, and Analysis As microelectronics engineers design complex chips using existing circuit libraries, they must ensure correct logical, physical, and electrical prop...Loe edasi...
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system levelDescribes rang...Loe edasi...
The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable for the researchers working on power- and thermal...Loe edasi...
Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, D. Boolchandani, Virendra Sing, Adit Singh
Sari: Communications in Computer and Information Science
(Ilmumisaeg: 10-Dec-2013, Paperback / softback, Kirjastus: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, ISBN-13: 9783642420238)
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers...Loe edasi...
(Ilmumisaeg: 02-Jul-2012, Paperback / softback, Kirjastus: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, ISBN-13: 9783642314933)
This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012.The 30 revised regular papers presented together with 10 short papers and 13 poster sessions w...Loe edasi...
(Ilmumisaeg: 08-Jan-2008, Hardback, Kirjastus: Morgan Kaufmann Publishers In, ISBN-13: 9780123739735)
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-c...Loe edasi...
(Ilmumisaeg: 21-Jun-2007, Hardback, Kirjastus: Springer-Verlag New York Inc., ISBN-13: 9780387465463)
Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to significant challenges for IC testing. As the variation of fundamental parameters such as channel length, threshold voltage, thin oxide thickness and...Loe edasi...
Laung-Terng Wang, Mike Peng Li, Cheng-Wen Wu, Xiaoqing Wen, Khader S. Abdel-Hafez, Wen-Ben Jone, Rohit Kapur, Brion Keller, Kuen-Jong Lee, James C.-M. Li...
(Ilmumisaeg: 14-Aug-2006, Hardback, Kirjastus: Morgan Kaufmann Publishers In, ISBN-13: 9780123705976)
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.· Most up-t...Loe edasi...
The proceedings of the March 2006 symposium consists of 93 papers and 29 posters on electronic design for manufacturability and quality, with a special focus on device modeling, circuits, and architectures for building robust systems with increasingl...Loe edasi...
In response to semiconductor fabrication scaling, the proceedings of the March 2005 symposium examines device modeling, circuits, and architectures for building robust systems with increasingly variable and leaky transistors. The 83 papers and 23 pos...Loe edasi...
A March 2004 symposium brought together industry practitioners and academics engaged in deep sub-micron integrated circuit design and development. Papers from the symposium span numerous disciplines that define the integrated circuit industry. A tuto...Loe edasi...
Papers from a March 2003 symposium describe the latest research in deep submicron integrated circuit design and development. Some areas discussed include reliability and design in deep submicron technologies, reducing leakage currents in VLSI circuit...Loe edasi...
(Ilmumisaeg: 15-Oct-1997, Hardback, Kirjastus: Institution of Engineering and Technology, ISBN-13: 9780852969014)
Hurst, an editor at the Microelectronics Journal , analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions avai...Loe edasi...
(Ilmumisaeg: 30-Sep-1994, Hardback, Kirjastus: Artech House Publishers, ISBN-13: 9780890067260)
Discusses issues in complementary metal-oxide semiconductor testing, such as logic testing, fault models, and physical defects. Includes Iddq test examples covering internal bridging, shorts between two metal lines, and gate-oxide defects, with corre...Loe edasi...
Inaugurates a new Ablex series covering the state-of-the-art in various aspects of VLSI testing, fault modeling, environments, routing and placement, and logic design. Among the topics addressed in the present text are physical fault modeling and sim...Loe edasi...
