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1997 IEEE International Conference on Microelectronics Test Structures Proceedings: Proceedings ... / Sponsored by the IEEE Electron Devices Society. [Pehme köide]

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  • Formaat: Paperback / softback, 225 pages, kõrgus x laius: 286x222 mm, kaal: 771 g
  • Ilmumisaeg: 01-Jan-1997
  • Kirjastus: I.E.E.E.Press
  • ISBN-10: 0780332431
  • ISBN-13: 9780780332430
Teised raamatud teemal:
1997 IEEE International Conference on Microelectronics Test Structures Proceedings: Proceedings ... / Sponsored by the IEEE Electron Devices Society.Suurem pilt
  • Formaat: Paperback / softback, 225 pages, kõrgus x laius: 286x222 mm, kaal: 771 g
  • Ilmumisaeg: 01-Jan-1997
  • Kirjastus: I.E.E.E.Press
  • ISBN-10: 0780332431
  • ISBN-13: 9780780332430
Teised raamatud teemal:
Püsilink: https://www.kriso.ee/db/9780780332430.html
Chairman's Letter ii(1)
Conference, Steering, and Technical Program Committee iii(1)
Table of Contents
iv
Technical Papers
1-223(222)
Session 1
1(15)
Session 2
16(23)
Session 3
39(17)
Session 4
56(21)
Session 5
77(22)
Session 6
99(22)
Session 7
121(63)
Session 8
184(19)
Session 9
203(21)
Author's Index 224