Muutke küpsiste eelistusi

1999 IEEE International Reliability Physics Symposium 1999 ed. [Pehme köide]

Edited by , , Edited by , Edited by ,
  • Formaat: Paperback / softback, 458 pages, kõrgus x laius: 279x216 mm
  • Ilmumisaeg: 01-Sep-1999
  • Kirjastus: I.E.E.E.Press
  • ISBN-10: 0780352203
  • ISBN-13: 9780780352209
Teised raamatud teemal:
1999 IEEE International Reliability Physics Symposium 1999 ed.
  • Formaat: Paperback / softback, 458 pages, kõrgus x laius: 279x216 mm
  • Ilmumisaeg: 01-Sep-1999
  • Kirjastus: I.E.E.E.Press
  • ISBN-10: 0780352203
  • ISBN-13: 9780780352209
Teised raamatud teemal:
Püsilink: https://www.kriso.ee/db/9780780352209.html
This collection from the 1999 International Reliability Physics Symposium, includes work that identifies microelectronic failure of degeneration mechanisms, improves understanding of existing failure mechanisms, and demonstrates innovative analytical techniques and ways to build in reliability.