Papers from a March 2003 symposium describe the latest research in deep submicron integrated circuit design and development. Some areas discussed include reliability and design in deep submicron technologies, reducing leakage currents in VLSI circuits, SoC methodology, testing of SoCs, and design considerations in advanced technology. Other topics include interconnect and substrate noise, the impact of new standards for design data modeling and manufacturing interface, power analysis and low power design, and timing and noise issues in physical design. There is no subject index. Annotation (c) Book News, Inc., Portland, OR (booknews.com)
