The proceedings of the March 2006 symposium consists of 93 papers and 29 posters on electronic design for manufacturability and quality, with a special focus on device modeling, circuits, and architectures for building robust systems with increasingly variable and leaky transistors. The 18 sessions address such issues as interconnect analysis and optimization, analog test and self-checking design, memory management, reliability models, and digital diagnosis techniques. Topics include variational interconnect delay metrics for statistical timing analysis, reducing the data switching activity on serial link buses, decoupling capacitor designs for sub-90nm CMOS technology, and a watermarking system for IP protection. No subject index is provided. Annotation ©2006 Book News, Inc., Portland, OR (booknews.com)
