Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter
- Informs and updates on all the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
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Cutting-edge articles on the latest developments in all areas of microscopy, image science, and many related subjects in electron physics
| Contributors |
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vii | |
| Preface |
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ix | |
| Future Contributions |
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xi | |
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1 Micro-XRF in Scanning Electron Microscopes |
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1 | (60) |
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2 | (2) |
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2 Differences and Synergies of SEM-EDS and u-XRF |
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4 | (20) |
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3 Design of an Microspot X-Ray Source for SEM |
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24 | (12) |
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4 Performing a Measurement |
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36 | (3) |
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39 | (17) |
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56 | (5) |
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58 | (3) |
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2 A Variational Approach for Simulation of Equilibrium Ion Distributions in Ion Traps With Regard to Coulomb Interaction |
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61 | (14) |
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61 | (2) |
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2 Physical Grounds of the Simulation Method |
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63 | (3) |
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66 | (5) |
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71 | (4) |
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71 | (1) |
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71 | (4) |
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3 Analytical Review of Direct Stem Imaging Techniques for Thin Samples |
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75 | (110) |
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76 | (24) |
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2 Linear CBED COM STEM Imaging Techniques |
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100 | (11) |
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3 STEM Imaging Techniques Using a Symmetric Scalar Detector |
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111 | (28) |
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4 STEM Imaging Using an Antisymmetric Vector Detector: iDPC |
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139 | (19) |
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5 Experimental Results Using iDPC-STEM Imaging |
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158 | (9) |
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6 Summary and Conclusions |
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167 | (18) |
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170 | (1) |
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Appendix A Resolution of STEM Imaging |
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170 | (2) |
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Appendix B Derivation of the Ideal, Linear COM STEM Vector Image Formation Formula |
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172 | (2) |
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Appendix C Derivation of the General, Nonlinear STEM Image Formation Formula |
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174 | (3) |
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Appendix D CTFs for Aberration-Free MIDI-STEM |
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177 | (2) |
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Appendix E Determination of the Scaling Factors in the Fourier Series in Azimuthal Direction for Wedge-Shaped DPC Detectors |
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179 | (2) |
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Appendix F CTFiS and CTFiC for the COM-STEM Detector |
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181 | (1) |
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Appendix G List of Abbreviations |
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182 | (1) |
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182 | (3) |
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4 Quantum Nanooptics in the Electron Microscope |
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185 | (52) |
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186 | (2) |
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188 | (13) |
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3 Primary Excitations in Bulk and Quantum-Confined Materials |
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201 | (8) |
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209 | (6) |
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5 Single-Photon Detection in the Electron Microscope |
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215 | (10) |
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225 | (3) |
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7 Lifetime Measurements at the Nanometer Scale |
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228 | (3) |
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231 | (6) |
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231 | (1) |
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232 | (5) |
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5 Component Identification and Interpretation: A Perspective on Tower of Knowledge |
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237 | (66) |
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237 | (1) |
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2 Component Identification by a Voting Method |
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238 | (19) |
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3 Component Interpretation by ToK |
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257 | (40) |
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297 | (6) |
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298 | (5) |
| Index |
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303 | |
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
