Advances in Imaging and Electron Physics, Volume 200, the latest release in a series that merges two long-running serials,
Advances in Electronics and Electron Physics and
Advances in Optical and Electron Microscopy, features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter
- Informs and updates on all the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
Muu info
Comprehensive, cutting-edge articles on the latest developments in microscopy, image science, and many related subjects in electron physics
| Contributors |
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vii | |
| Preface |
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ix | |
| Future Contributions |
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xi | |
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1 Past and Present Attempts to Attain the Resolution Limit of the Transmission Electron Microscope |
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1 | (60) |
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1 The Limits of Resolving Power and the Sources of Aberrations |
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2 | (21) |
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2 The Single-Field Condenser Objective |
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23 | (12) |
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3 Movement of the Image During Photographic Exposure |
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35 | (3) |
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4 Lack of Sharpness of the Image |
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38 | (1) |
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5 Changes in the Specimen |
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39 | (14) |
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6 Self-Structure of Supporting Films |
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53 | (8) |
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58 | (3) |
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2 Phase Plates for Transmission Electron Microscopy |
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61 | (42) |
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62 | (6) |
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68 | (6) |
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3 Theory for Postspecimen Plates |
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74 | (7) |
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4 Images With Zernike Plates |
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81 | (8) |
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5 Images With Straight-Edged Plates on the Cylindrical Axis |
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89 | (4) |
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93 | (1) |
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94 | (9) |
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95 | (1) |
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Appendix A The 2D Transform in Cylindrical Coordinates |
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95 | (1) |
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95 | (1) |
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95 | (1) |
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A.3 Conversion From Cartesian Form |
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96 | (2) |
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98 | (1) |
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98 | (5) |
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3 X-Ray Lasers in Biology: Structure and Dynamics |
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103 | (50) |
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103 | (4) |
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2 The X-Ray Free-Electron Laser |
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107 | (4) |
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3 Data Acquisition Modes and Sample Delivery for XFEL Structural Biology |
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111 | (5) |
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4 Radiation Damage Limits Resolution |
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116 | (4) |
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5 Serial Crystallography at XFELs for Structural Biology |
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120 | (2) |
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6 Molecular Machines and Single-Particle Imaging |
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122 | (4) |
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7 Time-Resolved Serial Crystallography, Optical Pump-Probe Methods, and Photosynthesis |
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126 | (3) |
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8 Time-Resolved SFX for Slower Processes: Mixing Jets and Other Excitations |
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129 | (1) |
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9 Fast Solution Scattering and Angular Correlation Function Methods |
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130 | (3) |
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133 | (10) |
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143 | (10) |
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144 | (1) |
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144 | (9) |
| Index |
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153 | |
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
