Advances in Imaging and Electron Physics, Volume 211, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter
- Informs and updates on the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
| Contributors |
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vii | |
| Preface |
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ix | |
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1 Simulation of atomically resolved elemental maps with a multislice algorithm for relativistic electrons |
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1 | (120) |
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2 | (5) |
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2 Image formation in the transmission electron microscope |
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7 | (10) |
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17 | (30) |
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47 | (16) |
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63 | (35) |
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98 | (3) |
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101 | (16) |
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117 | (4) |
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2 Reviewing the revised International System of Units (SI) |
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121 | (66) |
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1 The revised International System of Units (SI) |
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121 | (5) |
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2 Constants and units since the origins of the Metre Convention |
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126 | (5) |
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3 Defining constants in the revised SI |
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131 | (6) |
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4 Electric kilogram versus atomic kilogram |
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137 | (9) |
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5 The decade that followed the 2005 decision |
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146 | (17) |
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6 Open questions after evidences of unknown systematic effects just before the redefinition of the SI |
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163 | (8) |
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171 | (9) |
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180 | (7) |
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181 | (1) |
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182 | (1) |
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182 | (5) |
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3 Electron energy loss spectroscopy in the electron microscope |
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187 | (118) |
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188 | (2) |
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2 Fundamentals of inelastic scattering |
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190 | (15) |
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3 The low-energy loss region: plasmons and interband transitions |
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205 | (13) |
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4 High-energy loss region: inner shell excitations |
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218 | (37) |
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5 Developments in instrumentation |
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255 | (16) |
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6 EELS as a microanalytical tool |
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271 | (22) |
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293 | (12) |
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297 | (1) |
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297 | (1) |
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298 | (6) |
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304 | (1) |
| Index |
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305 | |
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Dr Martin H˙tch, serial editor for the book series Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.
