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Advances in Imaging and Electron Physics, Volume 218 [Kõva köide]

Series edited by (Senior Scientist, French National Centre for Research (CNRS), Toulouse, France), Series edited by (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several mi)
  • Formaat: Hardback, 276 pages, kõrgus x laius: 229x152 mm, kaal: 590 g
  • Sari: Advances in Imaging and Electron Physics
  • Ilmumisaeg: 15-Jun-2021
  • Kirjastus: Academic Press Inc
  • ISBN-10: 0323915051
  • ISBN-13: 9780323915052
Teised raamatud teemal:
Advances in Imaging and Electron Physics, Volume 218Suurem pilt
  • Formaat: Hardback, 276 pages, kõrgus x laius: 229x152 mm, kaal: 590 g
  • Sari: Advances in Imaging and Electron Physics
  • Ilmumisaeg: 15-Jun-2021
  • Kirjastus: Academic Press Inc
  • ISBN-10: 0323915051
  • ISBN-13: 9780323915052
Teised raamatud teemal:
Püsilink: https://www.kriso.ee/db/9780323915052.html
Märksõnad:
Advances in Imaging and Electron Physics, Volume 218 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics – with review of the physics, and more.
  • Provides the authority and expertise of leading contributors from an international board of authors
  • Presents the latest release in the Advances in Imaging and Electron Physics series
  • Updated release includes the latest information on the Coulomb Interactions in Charged Particle Beams
Contributors ix
Preface xi
1 Phase retrieval methods applied to coherent imaging
1(62)
Tatiana Latychevskaia
1 Introduction to the imaging of a non-crystalline object and the phase problem
1(4)
1.1 Coherence
3(1)
1.2 Resolution
4(1)
1.3 Imaging of individual biological macromolecules: radiation damage
5(1)
2 Survey of interferometric/coherent imaging schemes
5(15)
2.1 Gabor in-line holography and point projection microscopy
5(3)
2.2 Coherent diffractive imaging (CDI)
8(7)
2.3 Fourier transform holography (FTH)
15(2)
2.4 Fresnel coherent diffractive imaging (FCDI)
17(2)
2.5 Ptychography
19(1)
3 Development of in-line holography and CDI with low-energy electrons
20(22)
3.1 Experimental setups
20(3)
3.2 Theory of formation and reconstruction of in-line holograms
23(12)
3.3 Gabor in-line holography with low-energy electrons
35(5)
3.4 CDI with low-energy electrons
40(2)
4 Future directions
42(21)
4.1 Volumetric 3D deconvolution
42(4)
4.2 Merging holography and coherent diffractive imaging, HCDI
46(1)
4.3 Extrapolation
47(6)
4.4 Outlook
53(1)
References
54(9)
2 X-ray phase-contrast imaging: a broad overview of some fundamentals
63(96)
David M. Paganin
Daniele Pelliccia
1 Introduction
64(3)
2 X-ray imaging basics
67(26)
2.1 Vector vacuum wave equations
67(2)
2.2 Scalar vacuum wave equation and complex wave-function
69(1)
2.3 Physical meaning of intensity and phase
69(2)
2.4 Fully coherent fields
71(2)
2.5 Coherent paraxial fields
73(2)
2.6 Projection approximation and absorption contrast
75(3)
2.7 Fresnel diffraction and propagation-based phase contrast
78(4)
2.8 Validity of the projection approximation
82(4)
2.9 Describing the propagation through thick samples: multi-slice approach
86(6)
2.10 Fresnel scaling theorem
92(1)
3 The forward problem: modeling X-ray phase-contrast images
93(33)
3.1 Transport-of-intensity equation
95(2)
3.2 Arbitrary imaging systems
97(1)
3.3 Arbitrary linear imaging systems
98(3)
3.4 Arbitrary linear shift-invariant imaging systems
101(1)
3.5 Transfer function formalism
102(4)
3.6 Phase contrast
106(1)
3.7 Introducing partial coherence: source blurring
107(2)
3.8 Partial coherence
109(3)
3.9 Modeling a wide class of partially-coherent X-ray phase-contrast imaging systems
112(8)
3.10 Fokker-Planck equation for paraxial X-ray optics
120(6)
4 The inverse problem: retrieving sample information from X-ray phase-contrast images
126(33)
4.1 Two inverse problems
129(7)
4.2 Phase retrieval methods based on refraction
136(3)
4.3 One method for X-ray phase-contrast imaging employing free-space propagation
139(2)
4.4 Phase-gradient methods
141(6)
Acknowledgments
147(1)
References
148(11)
3 Graphyne and borophene as nanoscopic materials for electronics -- with review of the physics
159(22)
C.M. Krowne
1 Introduction
159(1)
2 Formulation of the bandstructure equations in a tractable tight-binding format
160(6)
3 Eigenenergies, Fermi velocities, overlap & hopping integrals
166(4)
4 Eigenvectors based upon 2-spinors
170(4)
5 Eigenvectors based upon 4-spinors
174(3)
6 Conclusions and future outlook
177(4)
References
179(2)
4 The ESAB effect and the physical meaning of the vector potential
181(14)
Robert Carles
Olivier Pujol
Jose-Philippe Perez
1 Introduction
181(2)
2 ESAB effect
183(3)
3 Experimental tests
186(1)
4 Analysis
187(5)
4.1 Quantitative aspects of the ESAB effect
187(2)
4.2 Classical approximation
189(1)
4.3 Single electron interferometry
189(1)
4.4 Locality or pantopia?
190(2)
5 Conclusion
192(3)
References
192(3)
5 Electron image plane off-axis holography of atomic structures
195(65)
Hannes Lichte
1 Introduction
195(8)
2 Principles of off-axis image plane electron holography
203(8)
2.1 Taking the electron hologram
203(3)
2.2 Reconstruction of the electron image wave
206(5)
3 Performance of image plane electron holography
211(18)
3.1 Effect of restricted coherence
211(5)
3.2 Quantum noise
216(1)
3.3 Information transfer capacity
217(1)
3.4 Lateral resolution and field of view
218(3)
3.5 Artefacts in the recorded wave
221(3)
3.6 Problems of recording an electron hologram
224(5)
4 Influence of the lens aberrations in the high-resolution domain
229(10)
4.1 Coherent aberrations
230(6)
4.2 Incoherent aberrations
236(3)
5 Reconstruction of the image wave and correction of aberrations
239(1)
6 Experimental realization of holography of atomic structures
240(13)
6.1 Experimental set-up
240(4)
6.2 Experimental results
244(1)
6.3 First results with atomic structures of weak objects
244(4)
6.4 Holographic imaging of strong objects
248(2)
6.5 Numerical reconstruction, including a preliminary correction of aberrations
250(3)
7 Conclusion
253(3)
8 List of symbols
256(4)
Acknowledgments
258(1)
References
259(1)
Further reading 260(1)
Index 261
Dr Martin H˙tch, serial editor for the book series Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops. Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.