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Advances in Metrology for X-ray and EUV Optics II [Pehme köide]

  • Formaat: Paperback / softback, 168 pages, Illustrations
  • Sari: Proceedings of SPIE
  • Ilmumisaeg: 01-Jan-2007
  • Kirjastus: SPIE Press
  • ISBN-10: 0819468525
  • ISBN-13: 9780819468529
Teised raamatud teemal:
Advances in Metrology for X-ray and EUV Optics II
  • Formaat: Paperback / softback, 168 pages, Illustrations
  • Sari: Proceedings of SPIE
  • Ilmumisaeg: 01-Jan-2007
  • Kirjastus: SPIE Press
  • ISBN-10: 0819468525
  • ISBN-13: 9780819468529
Teised raamatud teemal:
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.