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Advances in Optical Surface Texture Metrology [Kõva köide]

Edited by (University of Nottingham, UK), Contributions by (Shanghai J), Contributions by (Shanghai Jiao Tong University), Contributions by (Bruker Alicona), Contributions by (Sensofar Tech SL), Contributions by (Bruker Alicona), Contributions by (Bruker Alicona), Contributions by (Bruker Alicona), Contributions by (Shanghai Jiao Tong University), Contributions by (University of Nottingham)
  • Formaat: Hardback, 198 pages, kõrgus x laius x paksus: 254x178x13 mm, kaal: 565 g, With figures in colour and black and white
  • Sari: IOP Series in Emerging Technologies in Optics and Photonics
  • Ilmumisaeg: 11-Dec-2020
  • Kirjastus: Institute of Physics Publishing
  • ISBN-10: 0750325267
  • ISBN-13: 9780750325264
Teised raamatud teemal:
Advances in Optical Surface Texture MetrologySuurem pilt
  • Formaat: Hardback, 198 pages, kõrgus x laius x paksus: 254x178x13 mm, kaal: 565 g, With figures in colour and black and white
  • Sari: IOP Series in Emerging Technologies in Optics and Photonics
  • Ilmumisaeg: 11-Dec-2020
  • Kirjastus: Institute of Physics Publishing
  • ISBN-10: 0750325267
  • ISBN-13: 9780750325264
Teised raamatud teemal:
Püsilink: https://www.kriso.ee/db/9780750325264.html
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