The 60 full papers and 16 short ones were selected for the conference and the proceedings for their innovation and novelty of solution, as long as they were correct, coherent, and useful, of course. They cover test generation and fault simulation; software testing and reliability model; failure analysis and fault modeling; built-in self-test and embedded testing; design for testability, reliability, dependability, and so on; yield enhancement and silicon debut; automatic test equipment; analog, mixed-signal, radio-frequency and high-speed input-output testing; delay fault testing; low power testing; system-on-chip and system-in-package test; memory and field-programmable gate array testing; board and system and on-line testing; and test economics, functional verification, and failure analysis. There is no subject index. Annotation ©2011 Book News, Inc., Portland, OR (booknews.com)
