Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature....Loe edasi...
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature....Loe edasi...
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature....Loe edasi...
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature....Loe edasi...
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature....Loe edasi...
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature....Loe edasi...
Michael Mastro, Jeffrey LaRoche, Fan Ren, Jen-Inn Chyi, Jihyun Kim
Sari: MRS Proceedings
(Ilmumisaeg: 08-Apr-2009, Hardback, Kirjastus: Materials Research Society, ISBN-13: 9781605110806)
saadame teile pakkumise kasutatud raamatule, mille hind võib erineda kodulehel olevast hinnast
Papers from a winter 2008 symposium, held at the MRS Fall Meeting in Boston, present recent results from universities, national laboratories, and industries, concentrating on fundamental materials and device issues in performance and reliability. The...Loe edasi...
Jen-Inn Chyi, Stephen J. Pearton, Jung Han, Albert G. Baca, Wayne H. Chang
Sari: MRS Proceedings
(Ilmumisaeg: 29-Sep-2003, Hardback, Kirjastus: Materials Research Society, ISBN-13: 9781558997011)
saadame teile pakkumise kasutatud raamatule, mille hind võib erineda kodulehel olevast hinnast
Papers from an April 2003 symposium report on the uses of wide-bandgap semiconductors in applications such as solid-state lighting, sensors, filters, high-power electronics, biological detection, and spintronics, and point to the need for further res...Loe edasi...
