This book explores the synergy between VLSI and Machine Learning and its applications across various domains. It will investigate how Machine Learning techniques can enhance the design and testing of VLSI circuits, improve power efficiency, optimi...Loe edasi...
Inaugurates a new Ablex series covering the state-of-the-art in various aspects of VLSI testing, fault modeling, environments, routing and placement, and logic design. Among the topics addressed in the present text are physical fault modeling and sim...Loe edasi...
