Muutke küpsiste eelistusi

Computer-Aided Design of Microfluidic Very Large Scale Integration (mVLSI) Biochips: Design Automation, Testing, and Design-for-Testability 1st ed. 2017 [Kõva köide]

  • Formaat: Hardback, 142 pages, kõrgus x laius: 235x155 mm, kaal: 3613 g, 55 Illustrations, color; 9 Illustrations, black and white; XIII, 142 p. 64 illus., 55 illus. in color., 1 Hardback
  • Ilmumisaeg: 18-Apr-2017
  • Kirjastus: Springer International Publishing AG
  • ISBN-10: 3319562541
  • ISBN-13: 9783319562544
  • Kõva köide
  • Hind: 95,02 €*
  • * hind on lõplik, st. muud allahindlused enam ei rakendu
  • Tavahind: 111,79 €
  • Säästad 15%
  • Raamatu kohalejõudmiseks kirjastusest kulub orienteeruvalt 2-4 nädalat
  • Kogus:
  • Lisa ostukorvi
  • Tasuta tarne
  • Tellimisaeg 2-4 nädalat
  • Lisa soovinimekirja
  • Formaat: Hardback, 142 pages, kõrgus x laius: 235x155 mm, kaal: 3613 g, 55 Illustrations, color; 9 Illustrations, black and white; XIII, 142 p. 64 illus., 55 illus. in color., 1 Hardback
  • Ilmumisaeg: 18-Apr-2017
  • Kirjastus: Springer International Publishing AG
  • ISBN-10: 3319562541
  • ISBN-13: 9783319562544

This book provides a comprehensive overview of flow-based, microfluidic VLSI. The authors describe and solve in a comprehensive and holistic manner practical challenges such as control synthesis, wash optimization, design for testability, and diagnosis of modern flow-based microfluidic biochips. They introduce practical solutions, based on rigorous optimization and formal models. The technical contributions presented in this book will not only shorten the product development cycle, but also accelerate the adoption and further development of modern flow-based microfluidic biochips, by facilitating the full exploitation of design complexities that are possible with current fabrication techniques.

1 Introduction
1(24)
1.1 Introduction of Microfluidic Biochip Platforms
2(4)
1.2 Overview of Flow-Based Microfluidic Biochips
6(9)
1.2.1 Structure and Fabrication
7(1)
1.2.2 Components
8(4)
1.2.3 Applications
12(3)
1.3 Challenges and Motivation
15(4)
1.3.1 Design Automation
16(1)
1.3.2 Contamination Removal
16(1)
1.3.3 Defects and Erroneous Operations
17(2)
1.4 Outline of the Book
19(6)
References
20(5)
2 Control-Layer Optimization
25(28)
2.1 Motivation and Related Prior Work
26(1)
2.2 Problem Description, Design Requirements, and Challenges
26(9)
2.2.1 Pressure-Propagation Delay
26(1)
2.2.2 Requirements in Control-Layer Design
27(3)
2.2.3 Valve Addressing
30(3)
2.2.4 Routing of Control Channels
33(1)
2.2.5 Placement of Control Pins
34(1)
2.2.6 Relationship Between Control-Layer Optimization and Clock-Tree Design in VLSI Circuits
34(1)
2.3 Problem Formulation
35(1)
2.4 Algorithm Design
36(9)
2.4.1 Routing Algorithm 1
37(4)
2.4.2 Routing Algorithm 2
41(4)
2.5 Experimental Results
45(5)
2.5.1 Experiments with Two Fabricated Biochips
46(4)
2.5.2 Experiments with Synthetic Benchmarks
50(1)
2.6 Conclusions
50(3)
References
51(2)
3 Wash Optimization for Cross-Contamination Removal
53(28)
3.1 Motivation and Challenges
54(1)
3.2 Problem Description and Formulation
55(7)
3.2.1 Physical Implementability of a Wash Path
55(2)
3.2.2 Execution Time for a Wash Path
57(5)
3.3 Search for a Set of Washing Paths
62(10)
3.3.1 Generation of the Path Dictionary
62(2)
3.3.2 Storage of the Path Dictionary
64(1)
3.3.3 Identification of Washing-Path Set
65(4)
3.3.4 Washing of Multiple Contaminant Species
69(2)
3.3.5 Complexity Analysis
71(1)
3.4 Results: Application to Fabricated Biochips
72(6)
3.4.1 Results for ChIP
73(4)
3.4.2 A Programmable Microfluidic Device with an 8-by-8 Grid
77(1)
3.5 Conclusions
78(3)
References
79(2)
4 Fault Modeling, Testing, and Design for Testability
81(36)
4.1 Motivation and Challenges
82(1)
4.2 Defects and Fault Modeling
83(3)
4.3 Testing Strategy
86(4)
4.4 Applications to Fabricated Biochip
90(2)
4.4.1 Logic Circuit Model
90(1)
4.4.2 Test-Pattern Generation and Results
91(1)
4.5 Automated Generation of Logic-Circuit Model
92(5)
4.5.1 Physical Representation of Boolean Gates in Netlists
92(2)
4.5.2 Hierarchical Modeling
94(3)
4.5.3 Fault Analysis Based on ATPG Results
97(1)
4.6 Other Practical Concerns
97(2)
4.6.1 Test Cost
98(1)
4.6.2 Dynamic Faults
98(1)
4.6.3 Multiple Faults
99(1)
4.7 Experimental Demonstration
99(8)
4.7.1 Experimental Feasibility Demonstration
99(2)
4.7.2 Pattern Set-up Time, Measurement Time and Refresh Time
101(2)
4.7.3 Experimental Demonstration I: Cell Culture Chip
103(3)
4.7.4 Experimental Demonstration II: WGA Chip
106(1)
4.8 Untestable Faults and Design-For-Testability
107(7)
4.8.1 Causes of Untestable Faults
109(1)
4.8.2 DfT for Flow-Based Microfluidic Biochips
110(2)
4.8.3 Demonstration of Proposed DfT Approach
112(2)
4.9 Conclusion
114(3)
References
114(3)
5 Techniques for Fault Diagnosis
117(20)
5.1 Motivation and Challenges
117(1)
5.2 Problem Description
118(9)
5.2.1 Single-Defect-Type Assumption
118(1)
5.2.2 Syndrome Analysis
119(2)
5.2.3 Formulation as a Hitting-Set Problem
121(6)
5.3 Algorithm Design
127(4)
5.3.1 Complexity Analysis
130(1)
5.4 Results: Application to Fabricated Biochips
131(5)
5.4.1 Results for ChIP Chip
132(1)
5.4.2 Results for WGA Chip
133(2)
5.4.3 Results for Cell Culture Chip
135(1)
5.5 Conclusion
136(1)
References
136(1)
6 Conclusions and New Directions
137(4)
6.1 Conclusions
137(1)
6.2 Opportunities and New Directions
138(3)
6.2.1 Fault-Tolerant Design
139(1)
6.2.2 Programmable Multipurpose Biochip Platforms
139(1)
6.2.3 Balancing Control Channels by Modifying Channel Width
139(1)
6.2.4 Washing in Parallel
140(1)
6.2.5 Testing for Dynamic Defects
140(1)
References
140(1)
Index 141
Kai Hu received his B. Sci. degree from Fudan University, Shanghai, China, in 2009, and the M.S. and Ph.D. degree from Duke University, NC, USA, in 2011 and 2015, respectively. He was the recipient of the VLSI Test Symposium (VTS) Best Paper Award in 2013, IEEE Transactions on Computer-Aided Design Donald O. Pederson Best Paper Award in 2015, and European Design and Automation Association (EDAA) Outstanding Dissertation Award in 2016.



He is currently a Senior Engineer with Oracle. Inc., Santa Clara, CA, USA. His current research interests include algorithms for computer-aided design and testing of flow-based microfluidic biochips.





Krishnendu Chakrabarty is the William H. Younger Distinguished Professor of Engineering in the Department of Electrical and Computer Engineering, at Duke University in Durham, NC.  He has been at Duke University since 1998. His current research is focused on: testing and design-for-testability of integrated circuits (especially 3D and multicore chips); digital microfluidics, biochips, and cyberphysical systems; optimization of digital print and production system infrastructure. His research projects in the recent past have also included chip cooling using digital microfluidics, wireless sensor networks, and real-time embedded systems. Research support is provided by the National Science Foundation, the Semiconductor Research Corporation, Cisco Systems, HP Labs, Huawei Technologies, and Intel Corporation through Intel Lab's Academic Research Office. Other sponsors in the past have included National Institutes of Health , DARPA and the Office of Naval Research.











Prof. Chakrabarty received the B. Tech. degree from the Indian Institute of Technology, Kharagpur, India in 1990, and the M.S.E. and Ph.D. degrees from the University of Michigan, Ann Arbor in 1992 and 1995, respectively, all in Computer Science and Engineering . During 1990-95, he was a research assistant at the Advanced Computer Architecture Laboratory of the Department of Electrical Engineering and Computer Science, University of Michigan. During 1995-1998, he was an Assistant Professor of Electrical and Computer Engineering at Boston University. 



Prof. Chakrabarty is a Fellow of ACM, a Fellow of IEEE, and a Golden Core Member of the IEEE Computer Society. He is also an Invitational Fellow of the Japan Society for the Promotion of Science (JSPS), 2009. He is a recipient of the IEEE Computer Society Meritorious Service Award. Prof. Chakrabarty was a Chair Professor in the School of Software in Tsinghua University, Beijing, China (2009-2013), and a Visiting Chair Professor in Computer Science and Information Engineering at National Cheng Kung University in Taiwan (2012-2013). He has held Visiting Professor positions at University of Tokyo (Japan), Nara Institute of Science and Technology (Japan), and University of Potsdam (Germany), and a Guest Professor position at University of Bremen (Germany).



Tsung-Yi Ho received his Ph.D. in Electrical Engineering from National Taiwan University in 2005. He is a Professor with the Department of Computer Science of National Tsing Hua University, Hsinchu, Taiwan. His research interests include design automation and test for microfluidic biochips and nanometer integrated circuits. He has presented 10 tutorials and contributed 10 special sessions in ACM/IEEE conferences, all in design automation for microfluidic biochips. He has been the recipient of the Invitational Fellowship of the Japan Society for the Promotion of Science (JSPS), the Humboldt Research Fellowship by the Alexander von Humboldt Foundation, and the Hans Fischer Fellow by the Institute of Advanced Study of the Technical University of Munich. He was a recipient of the Best Paper Awards at the VLSI Test Symposium (VTS) in 2013 and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems in 2015. He served as a Distinguished Visitor ofthe IEEE Computer Society for 2013-2015, the Chair of the IEEE Computer Society Tainan Chapter for 2013-2015, and the Chair of the ACM SIGDA Taiwan Chapter for 2014-2015. Currently he serves as an ACM Distinguished Speaker, a Distinguished Lecturer of the IEEE Circuits and Systems Society, and Associate Editor of the ACM Journal on Emerging Technologies in Computing Systems, ACM Transactions on Design Automation of Electronic Systems, ACM Transactions on Embedded Computing Systems, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, and IEEE Transactions on Very Large Scale Integration Systems, Guest Editor of IEEE Design & Test of Computers, and the Technical Program Committees of major conferences, including DAC, ICCAD, DATE, ASP-DAC, ISPD, ICCD, etc.