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EDA for IC Implementation, Circuit Design, and Process Technology [Kõva köide]

Edited by (Cadence Berkeley Laboratories, California, USA), Edited by (Cadence Design Systems, San Jose, California, USA), Edited by (Tensilica Inc., Santa Clara, California, USA)
  • Formaat: Hardback, 616 pages, kõrgus x laius: 254x178 mm, kaal: 1224 g, 14 Tables, black and white; 3 Halftones, black and white; 17 Illustrations, color; 333 Illustrations, black and white
  • Sari: Electronic Design Automation for Integrated Circuits Hdbk
  • Ilmumisaeg: 23-Mar-2006
  • Kirjastus: CRC Press Inc
  • ISBN-10: 0849379245
  • ISBN-13: 9780849379246
Teised raamatud teemal:
  • Formaat: Hardback, 616 pages, kõrgus x laius: 254x178 mm, kaal: 1224 g, 14 Tables, black and white; 3 Halftones, black and white; 17 Illustrations, color; 333 Illustrations, black and white
  • Sari: Electronic Design Automation for Integrated Circuits Hdbk
  • Ilmumisaeg: 23-Mar-2006
  • Kirjastus: CRC Press Inc
  • ISBN-10: 0849379245
  • ISBN-13: 9780849379246
Teised raamatud teemal:
Electronic design automation is a tool that is critical for the progression of integrated circuit manufacturing. This text, put together by Scheffer (Cadence Design Systems), Lavagno (Cadence Berkeley Laboratories), and Martin (Tensilica Inc.), is the second volume of a handbook describing the state of the art of EDA for IC manufacturing. Where the first volume covered system-level design, micro-architectural design, and verification and test, the 26 chapters contained in this volume is dedicated to "RTL to GDS" design flow, incorporating synthesis, placement and routing, analog and mixed-signal design, physical verification, analysis and extraction, and technology. Annotation ©2006 Book News, Inc., Portland, OR (booknews.com)

Presenting a comprehensive overview of the design automation algorithms, tools, and methodologies used to design integrated circuits, the Electronic Design Automation for Integrated Circuits Handbook is available in two volumes. The second volume, EDA for IC Implementation, Circuit Design, and Process Technology, thoroughly examines real-time logic to GDSII (a file format used to transfer data of semiconductor physical layout), analog/mixed signal design, physical verification, and technology CAD (TCAD). Chapters contributed by leading experts authoritatively discuss design for manufacturability at the nanoscale, power supply network design and analysis, design modeling, and much more. Save on the complete set.
SECTION I RTL to GDS-II, or Synthesis, Place, and Route
1 Design Flows
Leon Stok, David Hathaway, Kurt Keutzer, and David Chinnery
1-1(1)
1.1 Introduction
1-1(1)
1.2 Invention
1-2(1)
1.3 Implementation
1-2(1)
1.4 Integration
1-5(1)
1.5 Future Scaling Challenges
1-10(1)
1.6 Conclusion
1-12(1)
2 Logic Synthesis
Sunil Khatri and Narendra V. Sheno
2-1(1)
2.1 Introduction
2-1(1)
2.2 Behavioral and Register Transfer-Level Synthesis
2-2(1)
2.3 Two-Level Minimization
2-3(1)
2.4 Multilevel Logic Minimization
2-4(1)
2.5 Enabling Technologies for Logic Synthesis
2-10(1)
2.6 Sequential Optimization
2-11(1)
2.7 Physical Synthesis
2-13(1)
2.8 Multivalued Logic Synthesis
2-14(1)
2.9 Summary
2-15(1)
3 Power Analysis and Optimization from Circuit to Register-Transfer Levels
Jose Monteiro, Rakesh Patel, and Vivek Tiwari
3-1(1)
3.1 Introduction
3-1(1)
3.2 Power Analysis
3-2(1)
3.3 Circuit-Level Power Optimization
3-8(1)
3.4 Logic Synthesis for Low Power
3-12(1)
3.5 Conclusion
3-15(1)
4 Equivalence Checking
Andreas Kuehlmann and Fabio Somenzi
4-1(1)
4.1 Introduction
4-1(1)
4.2 Equivalence Checking Problem
4-3(1)
4.3 Boolean Reasoning
4-5(1)
4.4 Combinational Equivalence Checking
4-10(1)
4.5 Sequential Equivalence Checking
4-14(1)
4.6 Summary
4-17(1)
5 Digital Layout - Placement
Andrew B. Kahng and Sherief Reda
5-1(1)
5.1 Introduction: Placement Problem and Contexts
5 -1(1)
5.2 Global Placement
5-4(1)
5.3 Detailed Placement and Legalizers
5-15(1)
5.4 Placement Trends
5-17(1)
5.5 Academic and Industrial Placers
5-19(1)
5.6 Conclusions
5-20(1)
6 Static Timing Analysis
Sachin S. Sapatnekar
6-1(1)
6.1 Introduction
6-1(1)
6.2 Representation of Combinational and Sequential Circuits
6-1(1)
6.3 Gate Delay Models
6-3(1)
6.4 Timing Analysis for Combinational Circuits
6-3(1)
6.5 Timing Analysis for Sequential Circuits
6-7(1)
6.6 Clocking Disciplines: Edge-Triggered Circuits
6-8(1)
6.7 Clocking and Clock-Skew Optimization
6-9(1)
6.8 Statistical Static Timing Analysis
6-12(1)
6.9 Conclusion
6-15(1)
7 Structured Digital Design
Fan Mo and Robert K. Brayton
7-1(1)
7.1 Introduction
7-1(1)
7.2 Datapaths
7-2(1)
7.3 Programmable Logic Arrays
7-13(1)
7.4 Memory and Register Files
7-15(1)
7.5 Structured Chip Design
7-17(1)
7.6 Summary
7-21(1)
8 Routing
Louis Scheffer
8-1(1)
8.1 Introduction
8-2(1)
8.2 Types of Routers
8-2(1)
8.3 A Brief History of Routing
8-4(1)
8.4 Common Routing Algorithms
8-5(1)
8.5 Additional Router Considerations
8-9(1)
9 Exploring Challenges of Libraries for Electronic Design
James Hogan and Scott T. Becker
9-1(1)
9.1 Introduction
9-1(1)
9.2 What Does It Mean to Design Libraries?
9-1(1)
9.3 How Did We Get Here, Anyway?
9-2(1)
9.4 Commercial Efforts
9-5(1)
9.5 What Makes the Effort Easier?
9-5(1)
9.6 The Enemies of Progress
9-6(1)
9.7 Environments That Drive Progress
9-6(1)
9.8 Libraries and What They Contain
9-6(1)
9.9 Summary
9-7(1)
10 Design Closure
Peter J. Osler and John M. Cohn
10-1(1)
10.1 Introduction
10-1(1)
10.2 Current Practice
10-13(1)
10.3 The Future of Design Closure
10-28(1)
10.4 Conclusion
10-30(1)
11 Tools for Chip-Package Codesign
Paul D. Franzon
11-1(1)
11.1 Introduction
11-1(1)
11.2 Drivers for Chip-Package Codesign
11-1(1)
11.3 Digital System Codesign Issues
11-2(1)
11.4 Mixed-Signal Codesign Issues
11-5(1)
11.5 I/O Buffer Interface Standard and Other Macromodels
11-5(1)
11.6 Conclusions
11-7(1)
12 Design Databases
Mark Bales
12-1(1)
12.1 Introduction
12-1(1)
12.2 History
12-2(1)
12.3 Modern Database Examples
12-3(1)
12.4 Fundamental Features
12-4(1)
12.5 Advanced Features
12-9(1)
12.6 Technology Data
12-12(1)
12.7 Library Data and Structures: Design-Data Management
12-13(1)
12.8 Interoperability Models
12-13(1)
13 FPGA Synthesis and Physical Design
Mike Hutton and Vaughn Betz
13-1(1)
13.1 Introduction
13-1(1)
13.2 System-Level Tools
13-6(1)
13.3 Logic Synthesis
13-6(1)
13.4 Physical Design
13-13(1)
13.5 Looking Forward
13-26(1)
SECTION II Analog and Mixed-Signal Design
14 Simulation of Analog and RF Circuits and Systems
Jaijeet Roychowdhury and Alan Mantooth
14-1(1)
14.1 Introduction
14-1(1)
14.2 Differential-Algebraic Equations for Circuits via Modified Nodal Analysis
14-2(1)
14.3 Device Models
14-4(1)
14.4 Basic Circuit Simulation: DC Analysis
14-10(1)
14.5 Steady-State Analysis
14-13(1)
14.6 Multitime Analysis
14-17(1)
14.7 Noise in RF Design
14-25(1)
14.8 Conclusions
14-35(1)
15 Simulation and Modeling for Analog and Mixed-Signal Integrated Circuits
Georges G.E. Gielen and Joel R. Phillips
15-1(1)
15.1 Introduction
15-2(1)
15.2 Top-Down Mixed-Signal Design Methodology
15-2(1)
15.3 Mixed-Signal and Behavioral Simulation
15-8(1)
15.4 Analog Behavioral and Power Model Generation Techniques
15-14(1)
15.5 Symbolic Analysis of Analog Circuits
15-18(1)
15.6 Conclusions
15-20(1)
16 Layout Tools for Analog Integrated Circuits and Mixed-Signal Systems-on-Chip: A Survey
Rob A. Rutenbar and John M. Cohn
16-1(1)
16.1 Introduction
16-1(1)
16.2 Analog Layout Problems and Approaches
16-2(1)
16.3 Analog Cell Layout Strategies
16-5(1)
16.4 Mixed-Signal System Layout
16-8(1)
16.5 Field-Programmable Analog Arrays
16-11(1)
16.6 Conclusions
16-11(1)
SECTION III Physical Verification
17 Design Rule Checking
Robert Todd, Laurence Grodd, and Katherine Fetty
17-1(1)
17.1 Introduction
17-1(1)
17.2 Geometric Algorithms for Physical Verification
17-6(1)
17.3 Hierarchical Data Structures
17-7(1)
17.4 Time Complexity of Hierarchical Analysis
17-8(1)
17.5 Connectivity Models
17-9(1)
17.6 Parallel Computing
17-11(1)
17.7 Future Roles for Verification
17-11(1)
18 Resolution Enhancement Techniques and Mask Data Preparation
Franklin M. Schellenberg
18-1(1)
18.1 Introduction
18-1(1)
18.2 Lithographic Effects
18-2(1)
18.3 RET for Smaller k,
18-5(1)
18.4 Software Implementations of RET Solutions
18-11(1)
18.5 Mask Data Preparation
18-24(1)
18.6 Summary
18-27(1)
19 Design for Manufacturability in the Nanometer Era
Nicola Dragone, Carlo Guardiani, and Andrzej J. Strojwas
19-1(1)
19.1 Introduction
19-1(1)
19.2 Taxonomy of Yield Loss Mechanisms
19-3(1)
19.3 Logic Design for Manufacturing
19-6(1)
19.4 Parametric Design for Manufacturing Methodologies
19-13(1)
19.5 Design for Manufacturing Integration in the Design Flow: Yield-Aware Physical Synthesis
19-18(1)
19.6 Summary
19-20(1)
20 Design and Analysis of Power Supply Networks
David Blaauw, Sanjay Pant, Rajat Chaudhry, and Rajendran Panda
20-1(1)
20.1 Introduction
20-1(1)
20.2 Voltage-Drop Analysis Modes
20-3(1)
20.3 Linear System Solution Techniques
20-5(1)
20.4 Models for Power Distribution Networks
20-8(1)
20.5 Conclusions
20-13(1)
21 Noise Considerations in Digital ICs
Vinod Kariat
21-1(1)
21.1 Introduction
21-1(1)
21.2 Why Has Noise Become a Problem for Digital Chips?
21-2(1)
21.3 Noise Effects in Digital Designs
21-3(1)
21.4 Static Noise Analysis
21-7(1)
21.5 Electrical Analysis
21-14(1)
21.6 Fixing Noise Problems
21-18(1)
21.7 Summary and Conclusions
21-20(1)
22 Layout Extraction
William Kao, Chi-Yuan Lo, Mark Basel, Raminderpal Singh, Peter Spink, and Louis Scheffer
22-1(1)
22.1 Introduction
22-1(1)
22.2 Early History
22-2(1)
22.3 Problem Analysis
22-2(1)
22.4 System Capabilities
22-3(1)
22.5 Converting Drawn Geometries to Actual Geometries
22-4(1)
22.6 Designed Device Extraction
22-5(1)
22.7 Connectivity Extraction
22-7(1)
22.8 Parasitic Resistance Extraction
22-8(1)
22.9 Capacitance Extraction Techniques
22-10(1)
22.10 Inductance Extraction Techniques
22-13(1)
22.11 Network Reduction
22-17(1)
22.12 Process Variation
22-18(1)
22.13 Conclusions and Future Study
22-19(1)
23 Mixed-Signal Noise Coupling in System-on-Chip Design: Modeling, Analysis, and Validation
Nishath Verghese and Makoto Nagata
23-1(1)
23.1 Introduction
23-2(1)
23.2 Mechanisms and Effects of Mixed-Signal Noise Coupling
23-2(1)
23.3 Modeling of Mixed-Signal Noise Coupling
23-7(1)
23.4 Mixed-Signal Noise Measurement and Validation
23-18(1)
23.5 Application to Placement and Power Distribution Synthesis
23-19(1)
23.6 Summary
23-21(1)
SECTION IV Technology CAD
24 Process Simulation
Mark D. Johnson
24-1(1)
24.1 Introduction
24-1(1)
24.2 Process Simulation Methods
24-2(1)
24.3 Ion Implantation
24-3(1)
24.4 Diffusion
24-8(1)
24.5 Oxidation
24-12(1)
24.6 Etch and Deposition
24-13(1)
24.7 Lithography and Photoresist Modeling
24-20(1)
24.8 Silicidation
24-20(1)
24.9 Mechanics Modeling
24-20(1)
24.10 Putting It All Together
24-22(1)
24.11 Conclusions
24-23(1)
25 Device Modeling —From Physics to Electrical Parameter Extraction
Robert W. Dutton, Chang-Hoon Choi, and Edwin C. Kan
25-1(1)
25.1 Introduction
25-1(1)
25.2 MOS Technology and Intrinsic Device Modeling
25-3(1)
25.3 Parasitic Junction and Inhomogeneous Substrate Effects
25-20(1)
25.4 Device Technology Alternatives
25-23(1)
25.5 Conclusions
25-26(1)
26 High-Accuracy Parasitic Extraction
Mattan Kamon and Ralph Iverson
26-1
26.1 Introduction
26-2(1)
Part I: Extraction via Fast Integral Equation Methods
26-3(1)
26. 2 Introduction
26-3(1)
26. 3 Forms of Maxwell's Equations
26-3(1)
26. 4 Fast Field Solvers: Capacitance Solution
26-5(1)
26. 5 Fast Inductance Solution
26-7(1)
26. 6 Distributed RLC and Full Wave
26-11(1)
26. 7 Conclusions
26-14(1)
Part II: Statistical Capacitance Extraction
26-14(1)
26. 8 Introduction
26-14(1)
26. 9 Theory
26-15(1)
26.10 Characteristics
26-17(1)
26.11 Summary
26-22
Index
Luciano Lavagno, Louis Scheffer, Grant Martin