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Electrical Performance of Electronic Packaging, 7th Topical Meeting [Pehme köide]

  • Formaat: Paperback / softback, 270 pages, kõrgus x laius: 279x216 mm
  • Ilmumisaeg: 01-Jan-1998
  • Kirjastus: I.E.E.E.Press
  • ISBN-10: 0780349652
  • ISBN-13: 9780780349650
Teised raamatud teemal:
  • Formaat: Paperback / softback, 270 pages, kõrgus x laius: 279x216 mm
  • Ilmumisaeg: 01-Jan-1998
  • Kirjastus: I.E.E.E.Press
  • ISBN-10: 0780349652
  • ISBN-13: 9780780349650
Teised raamatud teemal:
This volume covers the topics of this meeting, the general topic of which is electrical design, analysis, and characterization of electronic interconnections and packaging structures for performance-driven, high-speed/high complexity electronic systems.
SESSION I--SYSTEM DESIGN ISSUES I
Reaching the Limits of CMOS Technology--(Keynote)
3(1)
Electrical Performance of Chip-On-Chip Modules
4(4)
Modeling, Simulation, and Design Methodology of The Interconnect Packaging of an Ultra-High Speed Source Synchronous Bus
8(7)
SESSION II--SYSTEM DESIGN ISSUES II
First Level Package Design Considerations for the IBM's S/390 G5 Server--(Invited)
15(2)
Bus Pumping at GBIT/S Data Rate on MCM
17(4)
Determination of the Optimal Signal/Ground Configuration of A Multi-Pins Connector for Minimal Crosstalk
21(6)
SESSION III--ON-CHIP INTERCONNECTIONS
Design Methodology for On-Chip Interconnects
27(4)
Signal Propagation on Seamless High Off-Chip Connectivity (SHOCC) Interconnects
31(4)
Frequency-dependent Crosstalk Modeling for On-chip Interconnections
35(4)
Flip-Chip Power Distribution
39(6)
SESSION IV--MEASUREMENT I
National Institute of Standards and Technology Programs in Electrical Measurements for Electronic Interconnections--(Invited)
45(5)
Inductance Measurement of Lead-Frame Packages
50(4)
High Frequency Limitations of the JEDEC 123 Guideline
54(7)
SESSION V--MEASUREMENTS II
Electrical Characterization of Ball Grid Array Packages from S-parameter Measurements below 500MHz
61(4)
On-chip Capacitor Measurement for High Performance Microprocessor
65(4)
Characterization of Frequency Dependent Dielectric Packaging Media Using Differential and Multiple-Reflection Techniques on a Precision Stripline Test Structure
69(4)
PLL Phase Error and Power Supply Noise
73(6)
SESSION VI--MIXED SIGNAL/OPTICAL PACKAGING DESIGN
A Novel High Isolation Interconnect for Broadband Mixed Signal Silicon MMICs
79(4)
Investigations of Multi-Layer Ceramic-Based MCM Technology
83(4)
Modeling of Free Space Holographic Optical Link for Board Level Interconnect
87(6)
SESSION VII--OPEN FORUM (POSTERS)
Temperature Stable Thermoplastic Microwave Materials and Copper Laminates
93(4)
Considerations of Characterizing Standard SMT Packages for RFIC Applications
97(4)
A Novel Electrical Performance Analysis for Leaded Packages
101(4)
Simulation and Evaluation of Ground Bounce Induced Crosstalk in a Mixed Logic Ball Grid Array Substrate Design
105(4)
A Custom Package Autoprober
109(4)
GaAs Multichip Packaging using the Selectively Oxidized Porous Silicon (SOPS) Substrate
113(3)
Modeling of the Electrical Performance of the Power and Ground Supply for a PC Microprocessor on a Card
116(4)
Transient and Crosstalk Analysis of Interconnection Lines for Single Level Integrated Packaging Modules
120(4)
Scaling Analysis of Interconnectivity and Crosstalk in VLSI Circuits
124(4)
Skin Effects Models for Transmission Line Structures using Generic SPICE Circuit Simulators
128(4)
Evaluation and Optimization of MCM-BGA Packages
132(4)
Full-Wave Electromagnetic Modeling of Interconnects with Meshed Ground Planes
136(4)
Fast Method for the Prediction of the Capacitance of Via Through-holes
140(4)
Electromagnetic Interference Through Slots in Packaging Structures
144(4)
Multi Drop Net Topologies for MCM Off Chip Interconnection Lines
148(4)
High Frequency Equivalent Circuit Model of Via
152(7)
SESSION VIII--POWER DISTRIBUTION MODELING I
Modeling of Power Distribution Systems in PCs
159(4)
Accurate Power Supply and Ground Plane Pair Models
163(4)
Extraction of Equivalent Circuit Models of Package Power Supply Distribution Systems from Full Wave EM Field Simulations
167(4)
Incorporating Vertical Discontinuities in Power-Bus Modeling using a Mixed-Potential Integral Equation and Circuit Extraction Formulation
171(6)
SESSION IX--POWER DISTRIBUTION MODELING II
Effects of Power/Ground Via Distribution on the Power/Ground Performance of C4/BGA Packages
177(4)
Reducing Simultaneous Switching Noise and EMI on Ground/Power Planes by Dissipative Edge Termination
181(4)
Contribution of Resonance to Ground Bounce in Lossy Thin Film Plates
185(6)
SESSION X--SIMULTANEOUS SWITCHING NOISE
Characterization of Flip-Chip CMOS ASIC Simultanous Switching Noise on Multilayer Organic and Ceramic BGA/CGA Packages
191(4)
Norton Equivalent Modeling of Microprocessor Core Noise from Measurements
195(4)
Rejection of SSN Coupling in Multilayer PCB Using a Conductive Layer
199(6)
SESSION XI--POWER SUPPLY DECOUPLING
Modeling and Simulation of Thin Film Decoupling Capacitors
205(4)
Power Decoupling with Integral Capacitors and Area Array Connections
209(4)
ESR and ESL of Ceramic Capacitor Applied to Decoupling Applications
213(6)
SESSION XII--SILICON SUBSTRATE MODELING
Analytic Modeling of Monolithic Inductors on Semiconductor Substrates
219(4)
Simple Formulas to Calculate the Line Parameters of Interconnects on Conducting Substrates
223(4)
CAD-Oriented Equivalent Circuit Modeling of On-Chip Interconnects in CMOS Technology
227(6)
SESSION XIII--MICROWAVE PACKAGING I
Microwave & Millimeter Wave Ball Grid Array (BGA) Packages-(Invited)
233(4)
Electrical Modeling of a BGA Package for Microwave Applications--A Layer by Layer Approach
237(4)
Full Wave Analysis and Development of Circuit Models for Flip Chip Interconnects
241(6)
SESSION XIV--MICROWAVE PACKAGING II
Micromachined Silicon Conformal Packaging for Millimeter Wave System Applications--(Invited)
247(1)
A Monolithic Spiral Transmission-Line Balun
248(4)
Novel Microstrip-to-Stripline Transitions for Leakage Suppression in Multilayer Microwave Circuits
252(7)
SESSION XV--MODELING TECHNIQUES
The Application of the TLM Method to the Simulation of High-Speed and High-Complexity Electronic Systems--(Invited)
259(5)
Numerical Modeling of Packaging Effects Using the Finite-Difference Time-Domain Technique--(Invited)
264(3)
Canonical Package Problem Solved Using Six Different Codes
267(6)
SESSION XVI--ACCELERATED MODELING/SIMULATION I
Improved Integral Formulations for Fast 3-D Method-of-Moments Solvers
273(4)
Efficient Computation of Interconnect Capacitances Using the Domain Decomposition Approach
277(4)
Recent Improvements for Fast Inductance Extraction and Simulation
281(6)
SESSION XVII--ACCELERATED MODELING/SIMULATION II
Model Reduction for PEEC Models Including Retardation
287(4)
Passive Model Order Reduction of Multiconductor Interconnects
291(4)
Efficient Simulation of High-Speed Distributed Interconneccts Using Krylov-Subspace Techniques
295(4)
Author Index 299