Eleventh IEEE European Test Symposium: Ets 2006: Proceedings: 21-24 May, 2006, [ Hilton Hotel] Southampton, United Kingdom [Pehme köide]

Thirty-five papers from the May 2006 symposium present recent research on electronic-based circuit and system testing. Several of the papers explore memory testing, automatic test pattern generation, single-event upsets, diagnosis, reconfigurable systems, and sigma-delta modulators. Other topics include an on-chip time measurement architecture with femtosecond timing resolution, convolutional compactors with variable polynomials, reducing sampling clock jitter to improve SNR measurement, and low-cost parametric failure diagnosis of RF transceivers. Two tutorials describe soft error rate testing of deep-submicron integrated circuits, and new techniques for accessing embedded instrumentation. No subject index is provided. Annotation ©2006 Book News, Inc., Portland, OR (booknews.com)