Held in Freiburg, Germany in May, 2007, the 12th IEEE European Test Symposium (ETS 2007) drew researchers from around the world to discuss recent developments in the field of electronic-based circuit and system testing. This proceedings volume contains all of the papers presented there that were selected for the scientific track. Topics explored include NoC testing, online sensor testing, fault grading, single event upsets, and embedded tutorials. The volume concludes with a paper on a new DFT technique that allows for the testing of embedded ADCs and DACs in a fully digital manner. The volume is not indexed. Annotation ©2007 Book News, Inc., Portland, OR (booknews.com)
