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Flip-Flop Design in Nanometer CMOS: From High Speed to Low Energy 2015 ed. [Kõva köide]

  • Formaat: Hardback, 260 pages, kõrgus x laius: 235x155 mm, kaal: 5884 g, 5 Illustrations, color; 118 Illustrations, black and white; XV, 260 p. 123 illus., 5 illus. in color., 1 Hardback
  • Ilmumisaeg: 30-Oct-2014
  • Kirjastus: Springer International Publishing AG
  • ISBN-10: 3319019961
  • ISBN-13: 9783319019963
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  • Formaat: Hardback, 260 pages, kõrgus x laius: 235x155 mm, kaal: 5884 g, 5 Illustrations, color; 118 Illustrations, black and white; XV, 260 p. 123 illus., 5 illus. in color., 1 Hardback
  • Ilmumisaeg: 30-Oct-2014
  • Kirjastus: Springer International Publishing AG
  • ISBN-10: 3319019961
  • ISBN-13: 9783319019963

This book provides a unified treatment of Flip-Flop design and selection in nanometer CMOS VLSI systems. The design aspects related to the energy-delay tradeoff in Flip-Flops are discussed, including their energy-optimal selection according to the targeted application, and the detailed circuit design in nanometer CMOS VLSI systems. Design strategies are derived in a coherent framework that includes explicitly nanometer effects, including leakage, layout parasitics and process/voltage/temperature variations, as main advances over the existing body of work in the field. The related design tradeoffs are explored in a wide range of applications and the related energy-performance targets. A wide range of existing and recently proposed Flip-Flop topologies are discussed. Theoretical foundations are provided to set the stage for the derivation of design guidelines, and emphasis is given on practical aspects and consequences of the presented results. Analytical models and derivations are introduced when needed to gain an insight into the inter-dependence of design parameters under practical constraints. This book serves as a valuable reference for practicing engineers working in the VLSI design area, and as text book for senior undergraduate, graduate and postgraduate students (already familiar with digital circuits and timing).




This book offers a comprehensive treatment of Flip-Flop design, including nanometer effects and the consequent design tradeoffs for current and future VLSI systems. It examines more than 20 topologies, covering all relevant classes of circuits.
1 The Logical Effort Method
1(26)
1.1 An RC Model for the Delay of Logic Gates
1(3)
1.2 The Logical Effort Model
4(1)
1.3 Limitations of the Original Logical Effort Model
5(3)
1.4 Basic Estimation of Logical Effort Parameters
8(2)
1.5 Accurate Estimation of Parameters G and p
10(6)
1.5.1 Estimation of the Capacitance at Internal Nodes
11(1)
1.5.2 Elmore Delay
12(2)
1.5.3 Parameter Calibration
14(1)
1.5.4 Non-step Input
15(1)
1.6 Multistage Logic Networks and Delay Minimization
16(3)
1.6.1 Path Parameters
16(1)
1.6.2 Optimized Design
17(2)
1.7 Optimum Number of Stages
19(1)
1.8 Extension of the Model to Non-static Gates
20(4)
1.8.1 Dynamic and Domino Gates with Keeper
21(1)
1.8.2 Logic with Transmission Gates and Pass-transistors
22(2)
1.9 Nonlinearities and Need for Iterative Procedures
24(3)
Appendix: Derivation of Logical Effort with a Transistor Current Source Model
25(2)
2 Design in the Energy-Delay Space
27(30)
2.1 Energy Modeling
27(4)
2.2 Energy-Delay Space Analysis and Hardware-Intensity
31(6)
2.2.1 The Energy-Efficient Curve
31(2)
2.2.2 Energy-Delay Metrics and Hardware Intensity
33(2)
2.2.3 Voltage Intensity and Generalization of the Sensitivity Criterion
35(2)
2.3 Energy-Efficient Design of Digital Circuits
37(9)
2.3.1 The Role of the Input Capacitance
37(1)
2.3.2 Derivation of Design Space Bounds
38(5)
2.3.3 Simulation-Based Optimization of Small-Sized Circuits
43(1)
2.3.4 Nonlinear and Convex Optimization of Large Size Circuits
44(2)
2.4 Design of Energy-Efficient Pipelined Systems
46(11)
2.4.1 Zyuban and Strenski's Hardware-Voltage Intensity Criteria
47(4)
2.4.2 Practical Guidelines to Design Energy-Efficient Pipelines
51(3)
Appendix: Convex Optimization
54(3)
3 Clocked Storage Elements
57(24)
3.1 Clocking in Synchronous Digital Systems
57(1)
3.2 Features of the Clock Signal
57(3)
3.3 Clocked Storage Elements: Latches, Master--Slave Flip-Flops and Pulsed Topologies
60(4)
3.4 Timing Parameters of Clocked Storage Elements
64(6)
3.4.1 Setup Time and Hold Time
64(4)
3.4.2 The Data Race-Through Issue
68(1)
3.4.3 Differences Between Master--Slave and Pulsed FFs
69(1)
3.4.4 Latches
70(1)
3.5 Clock Uncertainties Absorption and Time Borrowing
70(3)
3.6 Energy Consumption in Flip-Flops
73(4)
3.6.1 Dynamic Energy Dissipation and Techniques for Its Reduction
74(2)
3.6.2 Glitches, Short-Circuit and Static Energy Dissipation
76(1)
3.7 Differential and Dual Edge-Triggered Topologies
77(4)
4 Flip-Flop Optimized Design
81(38)
4.1 A Comprehensive Design Approach
81(3)
4.2 Definition of Independent Design Variables: Step 1
84(3)
4.2.1 A Single Path
85(1)
4.2.2 Two Different Re-converging Paths
86(1)
4.2.3 A Bifurcating Path
86(1)
4.2.4 Other Cases
87(1)
4.3 Sizing of Dependent Design Variables: Step 2
87(7)
4.3.1 Clocked Precharge Transistors
88(2)
4.3.2 Keepers and Noise Immunity
90(1)
4.3.3 Feedback Paths
91(1)
4.3.4 Pulse Generators
91(3)
4.3.5 IDVs and DDVs in SDFF First Stage
94(1)
4.4 Estimation of Design Space (IDVs) Bounds: Step 3
94(1)
4.5 Extrapolation of the Energy-Efficient Curve: Step 4
95(1)
4.6 A Complete Design Example: The SDFF as Case of Study
96(5)
4.7 Estimation of Layout Parasitics in Transistor-Level Design Iterations
101(5)
4.7.1 Estimation of Layout Parasitics from Stick Diagrams
101(2)
4.7.2 A Detailed Example: Geometrical Width of Folded Transistors
103(1)
4.7.3 The SDFF Case of Study
104(2)
4.8 Reconsidering High-Speed Design Criteria for Transmission-Gate Based Master--Slave FFs
106(13)
4.8.1 Timing Behavior of TGMS Flip-Flops
107(1)
4.8.2 High-speed Design Strategy for TGMS Flip-Flops
108(3)
4.8.3 Design Example: TGFF
111(3)
4.8.4 Simulation Results
114(5)
5 Analysis and Comparison in the Energy-Delay-Area Domain
119(56)
5.1 A Thorough Analysis and Comparison Strategy
119(1)
5.2 Simulation Setup and Energy-Delay Estimation
120(7)
5.2.1 Test Bench Circuit
120(2)
5.2.2 Definition of Timing Figure of Merit
122(1)
5.2.3 Estimation of Energy Dissipation
123(4)
5.3 Analyzed Flip-Flop Classes and Topologies
127(14)
5.4 Normalization to Technology
141(1)
5.5 Energy-Delay Tradeoff in Each Class
142(11)
5.5.1 Single-Edge Triggered Master-Slave FFs
142(1)
5.5.2 Single-Edge Triggered Implicitly-Explicitly Pulsed FFs
143(3)
5.5.3 Single-Edge Triggered Differential FFs
146(2)
5.5.4 Dual-Edge Triggered FFs
148(5)
5.6 Energy-Delay Comparison Among All FFs
153(5)
5.6.1 Ei Dj Metrics
153(2)
5.6.2 Selection of the Most Energy-Efficient FFs
155(3)
5.7 Leakage
158(5)
5.7.1 Leakage Impact in Active Mode
158(1)
5.7.2 Leakage Impact in Standby Mode and Tradeoff with Delay
159(2)
5.7.3 Effectiveness of Leakage Reduction Techniques
161(2)
5.8 Silicon Area
163(4)
5.8.1 Comparison of FFs Area
163(1)
5.8.2 Area-Delay Tradeoff
163(2)
5.8.3 Area Related Properties
165(2)
5.9 Clock Load
167(5)
5.9.1 Clock Load Comparison and Tradeoff with Delay
167(1)
5.9.2 Impact of Layout Parasitics on the Clock Load
168(2)
5.9.3 Joint FFs and Clock Distribution Energy Dissipation
170(2)
5.10 A Summary
172(3)
6 Energy Efficiency Versus Clock Slope
175(24)
6.1 Basic Considerations on the Role of the Clock Slope
175(1)
6.2 Setup to Simulate FFs Under a Varying Clock Slope
176(2)
6.3 FFs Timing and Energy Versus Clock Slope
178(5)
6.3.1 Impact of Clock Slope on τDQ, min
178(2)
6.3.2 Impact of Clock Slope on τCQ, min, tsetup and thold
180(2)
6.3.3 Impact of Clock Slope on EFF and Operation Robustness
182(1)
6.4 Energy of Local Clock Buffers Versus Clock Slope
183(3)
6.5 Design Considerations and Optimum Clock Slope
186(5)
6.5.1 Analytical Evaluation of the Optimum Clock Slope
186(1)
6.5.2 Dependencies and Typical Optimum Clock Slope Xopt
187(3)
6.5.3 Effectiveness of Clock Slope Optimization and FFs Comparison
190(1)
6.6 Impact of Clock Slope on Skew, Jitter and Variability
191(6)
6.6.1 Additive Skew and Jitter Due to a Smoother Clock Slope
191(4)
6.6.2 The Impact of Clock Slope on FFs Delay Variability
195(2)
6.7 The Impact of Technology Scaling
197(2)
7 Hold Time Issues and Impact of Variations on Flip-Flop Topologies
199
7.1 State of the Art and Preliminary Considerations
199(1)
7.2 Variations, Metrics and Methodology
200(2)
7.3 Impact of Process Variations on Flip-Flop Timing: Performance
202(3)
7.4 Impact of Process Variations on Robustness Against Hold Time
205(5)
7.5 Impact of Voltage, Temperature and Clock Slope Variations on Flip-Flop Timing
210(5)
7.5.1 Impact of Voltage Variations
210(1)
7.5.2 Impact of Temperature Variations
211(2)
7.5.3 Impact of Clock Slope Variations
213(2)
7.6 Process/Voltage/Temperature Variations and Energy Variability
215(1)
7.7 Energy-Performance Comparison and Remarks
216