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Fringe Pattern Analysis for Optical Metrology Theory, Algorithms, and Applications [Other digital carrier]

(Centro de Investigaciones en Óptica AC, Mexico), (Universidad Complutense de Madrid, Spain), (Nationale Supérieure des Télécommunications, France; Centro de Investigaciones en Óptica AC, Mexico)
  • Formaat: Other digital carrier, 344 pages, kõrgus x laius x paksus: 150x250x15 mm, kaal: 666 g
  • Ilmumisaeg: 24-Jun-2014
  • Kirjastus: Wiley-VCH Verlag GmbH
  • ISBN-10: 3527681078
  • ISBN-13: 9783527681075
Teised raamatud teemal:
Fringe Pattern Analysis for Optical Metrology  Theory, Algorithms, and  Applications
  • Formaat: Other digital carrier, 344 pages, kõrgus x laius x paksus: 150x250x15 mm, kaal: 666 g
  • Ilmumisaeg: 24-Jun-2014
  • Kirjastus: Wiley-VCH Verlag GmbH
  • ISBN-10: 3527681078
  • ISBN-13: 9783527681075
Teised raamatud teemal:
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.