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Gallium Nitride-enabled High Frequency and High Efficiency Power Conversion 1st ed. 2018 [Kõva köide]

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  • Formaat: Hardback, 232 pages, kõrgus x laius: 235x155 mm, kaal: 541 g, 165 Illustrations, color; 18 Illustrations, black and white; XIII, 232 p. 183 illus., 165 illus. in color., 1 Hardback
  • Sari: Integrated Circuits and Systems
  • Ilmumisaeg: 24-May-2018
  • Kirjastus: Springer International Publishing AG
  • ISBN-10: 3319779931
  • ISBN-13: 9783319779935
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  • Kõva köide
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  • Formaat: Hardback, 232 pages, kõrgus x laius: 235x155 mm, kaal: 541 g, 165 Illustrations, color; 18 Illustrations, black and white; XIII, 232 p. 183 illus., 165 illus. in color., 1 Hardback
  • Sari: Integrated Circuits and Systems
  • Ilmumisaeg: 24-May-2018
  • Kirjastus: Springer International Publishing AG
  • ISBN-10: 3319779931
  • ISBN-13: 9783319779935
Teised raamatud teemal:
This book demonstrates to readers why Gallium Nitride (GaN) transistors have a superior performance as compared to the already mature Silicon technology. The new GaN-based transistors here described enable both high frequency and high efficiency power conversion, leading to smaller and more efficient power systems. Coverage includes i) GaN substrates and device physics; ii) innovative GaN -transistors structure (lateral and vertical); iii) reliability and robustness of GaN-power transistors; iv) impact of parasitic on GaN based power conversion, v) new power converter architectures and vi) GaN in switched mode power conversion.















Provides single-source reference to Gallium Nitride (GaN)-based technologies, from the material level to circuit level, both for power conversions architectures and switched mode power amplifiers;

Demonstrates how GaN is a superior technology for switching devices, enabling both high frequency, high efficiency andlower cost power conversion;

Enables design of smaller, cheaper and more efficient power supplies.
1 Taking the Next Step in GaN: Bulk GaN Substrates and GaN-on-Si Epitaxy for Electronics
1(28)
Joff Derluyn
Marianne Germain
Elke Meissner
2 Lateral GaN HEMT Structures
29(22)
Chang Soo Suh
3 Vertical GaN Transistors for Power Electronics
51(24)
Srabanti Chowdhury
Dong Ji
4 Reliability of GaN-Based Power Devices
75(26)
Gaudenzio Meneghesso
Enrico Zanoni
Matteo Meneghini
Maria Ruzzarin
Isabella Rossetto
5 Validating GaN Robustness
101(22)
Kenichiro Tanaka
Ayanori Ikoshi
Tetsuzo Ueda
6 Impact of Parasitics on GaN-Based Power Conversion
123(30)
Johan T. Strydom
7 GaN in AC/DC Power Converters
153(28)
Fred Wang
Bo Liu
8 GaN in Switched-Mode Power Amplifiers
181(44)
David J. Perreault
Charles R. Sullivan
Juan M. Rivas
Index 225
Gaudenzio Meneghesso is full professor at the University of Padova, Department of Information engineering. His research interests involve electrical characterization, modeling and reliability of semiconductors devices. 

Matteo Meneghini is researcher at the University of Padova, Department of Information engineering. His research interests involve electrical characterization, modeling and reliability of semiconductors devices. 

Enrico Zanoni is full professor at the University of Padova, Department of Information engineering. His research interests involve electrical characterization, modeling and reliability of semiconductors devices.