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Handbook of Microscopy: Applications in Materials Science, Solid-state Physics and Chemistry Vol. 3 ed., Applications [Kõva köide]

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  • Formaat: Hardback, 908 pages, kõrgus x laius: 94x66 mm, kaal: 1852 g, 900 figures, 70 tables
  • Ilmumisaeg: 20-Dec-1996
  • Kirjastus: Wiley-VCH Verlag GmbH
  • ISBN-10: 3527292934
  • ISBN-13: 9783527292936
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  • Formaat: Hardback, 908 pages, kõrgus x laius: 94x66 mm, kaal: 1852 g, 900 figures, 70 tables
  • Ilmumisaeg: 20-Dec-1996
  • Kirjastus: Wiley-VCH Verlag GmbH
  • ISBN-10: 3527292934
  • ISBN-13: 9783527292936
Teised raamatud teemal:
Handbook of Microscopy Applications in Materials Science, Solid-State Physics and Chemistry Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which technique is suitable for characterizing a given material?" From the Contents: Classes of Materials: Metals and Alloys, Rocks and Minerals, Semiconductors and Semiconducting Devices, Opto-electronic Materials, Ferroic Materials, Structural Ceramics, Gemmological Applications. Superconductors: Intermetallics and Ceramics, Nonperiodic Structures, Dental and Biomaterials, Application of TEM and SAED, Different Forms of Carbon, Composite Structural Materials, Polymers, Nuclear Materials, Magnetic Materials. Special Topics: Phase Transformations, Specimen Preparation Techniques, Environmental Problems, Thin Film Growth, Quantitative Hyleography.
Volume 1: Methods I I Light Microscopy 1 Fundamentals of Light Microscopy F. Mucklich 2 Optical Contrasting of Microstructures F. Mucklich 3 Raman Microscopy P. Dhamelincourt J. Barbillat 4 Three-Dimensional Light Microscopy E. H. K. Stelzer 5 Near Field Optical Microscopy D. Courjon M. Spajer 6 Infrared Microscopy J. P. Huvenne B. Sombret II X-Ray Microscopy 1 Soft X-Ray Imaging G. Schmahl 2 X-Ray Microradiography D. Mouze 3 X-Ray Microtomography J. Cazaux 4 Soft X-Ray Microscopy by Holography D. Joyeux 5 X-Ray Diffraction Topography M. Schlenker J. Baruchel III Acoustic Microscopy 1 Acoustic Microscopy A. Briggs IV Electron Microscopy 1 Stationary Beam Methods 1.1 Transmission Electron Microscopy 1.1.1 Diffraction Contrast Transmission Electron Microscopy S. Amelinckx 1.1.2 High-Resolution Electron Microscopy D. Van Dyck 1.2 Reflection Electron Microscopy J. M. Cowley 1.3 Electron Energy-Loss Spectroscopy Imaging C. Colliex 1.4 High Voltage Electron Microscopy H. Fujita 1.5 Convergent Beam Electron Diffraction D. Cherns J. W. Steeds R. Vincent 1.6 Low-Energy Electron Microscopy E. Bauer 1.7 Lorentz Microscopy J. P. Jakubovics 1.8 Electron Holography Methods H. Lichte Volume 2: Methods II IV Electron Microscopy 2 Scanning Beam Methods 2.1 Scanning Reflection Electron Microscopy D. C. Joy 2.2 Scanning Transmission Electron Microscopy J. M. Cowley 2.3 Scanning Transmission Electron Microscopy: Z Contrast S. J. Pennycook 2.4 Scanning Auger Microscopy (SAM) and Imaging X-Ray Photoelectron Microscopy (XPS) R. De Gryse L. Fiermans 2.5 Scanning Microanalysis R. Gijbels 2.6 Imaging Secondary Ion Mass Spectrometry P. van Espen G. Janssens V Magnetic Methods 1 Nuclear Magnetic Resonance D. G. Cory S. Choi 2 Scanning Electron Microscopy with Polarization Analysis (SEMPA) J. Unguris M. H. Kelley A. Gavrin R. J. Celotta D. T. Pierce M. R. Scheinfein 3 Spin-Polarized Low-Energy Electron Microscopy E. Bauer VI Emission Methods 1 Photoelectron Emission Microscopy M. Mundschau 2 Field Emission and Field Ion Microscopy (Including Atom Probe FIM) A. Cerezo G. D. W. Smith VII Scanning Point Probe Techniques General Introduction 1 Scanning Tunneling Microscopy R. Wiesendanger 2 Scanning Force Microscopy U. D. Schwarz 3 Magnetic Force Microscopy A. Wadas 4 Ballistic Electron Emission Microscopy J. DiNardo VIII Image Recording, Handling and Processing 1 Image Recording in Microscopy K. -H. Herrmann 2 Image Processing N. Bonnet IX Special Topics 1 Coincidence Microscopy P. Kruit 2 Low Energy Electron Holography and Point-Projection Microscopy J. C. H. Spence Volume 3: Applications I Classes of Materials 1 Metals and Alloys J. Th. M. De Hosson G. van Tendeloo 2 Microscopy of Rocks and Minerals D. J. Barber 3 Semiconductors and Semiconducting Devices H. Oppolzer 4 Optoelectronic Materials I. Berbezier J. Derrien 5 Domain Structures in Ferroic Materials E. K. H. Salje 6 Structural Ceramics M. Ruhle 7 Microscopy of Gemmological Materials J. van Landuyt M. H. G. van Bockstael J. van Royen 8 Superconducting Ceramics J. van Tendeloo 9 Non-Periodic Structures 9.1 High-Resolution Imaging of Amorphous Materials P. H. Gaskell 9.2 Quasi-Crystalline Structures K. H. Kuo 10 Medical and Dental Materials K. Yasuda K. Hisatsune H. Takahashi K. -I. Udoh Y. Tanaka 11 Carbon D. Bernaerts S. Amelinckx 12 Composite Structural Materials O. Van der Biest P. Lust K. Lambrinou J. Ivens I. Verpoest L. Froyen 13 The Structure of Polymers and Their Monomeric Analogs I. G. Voigt-Martin 14 Nuclear Materials H. Blank Hj. Matzke H. MauBner I. L. F. Ray 15 Magnetic Microscopy A. Hubert II Special Topics 1 Small Particles (Catalysis, Photography, Magnetic Recording) H. W. Zandbergen C. Troeholt 2 Structural Phase Transformations H. Warlimont 3 Preparation Techniques for Transmission Electron Microscopy A. Barna G. Radnoczi B. Pecz 4 Environmental Problems W. Jambers R. E. Van Grieken 5 Quantitative Hyleography: The Determination of Quantitative Data From Micrographs P. J. Goodhew