The editors refer in their preface to the transitions that have occurred since publication of Handbook of Microscopy in 1997-- as electron microscopy has evolved to nanoscopy, and the increased resolution has caused transformation of the field from describing to measuring and understanding property-structure relations. This two-volume handbook is intended as a fundamental reference for the upcoming generation of nanoscopists who must master the new instruments as well as choose techniques to fit the problems under investigation. The first volume focuses on basic principles underlying the various nanoscopical methods, including electron tomography, dynamic transmission electron microscopy, scanning probe microscopy, and focused ion beam system, among others. The second addresses the specifics of materials and various techniques. The three editors are affiliated as follows: Gustaaf Van Tendeloo and Dirk Van Dyck (U. of Antwerp, Belgium) and Stephen J. Pennycook (Oak Ridge National Laboratory, US). Annotation ©2012 Book News, Inc., Portland, OR (booknews.com)
This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the optical
to the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going
on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals,
alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are divided between
methods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and
engineers, as well as graduate students and their lecturers.
