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Handbook of Optical Dimensional Metrology [Kõva köide]

Edited by (GE Global Research, Niskayuna, New York, USA)
  • Formaat: Hardback, 506 pages, kõrgus x laius: 254x178 mm, kaal: 1043 g, 5 Tables, black and white; 369 Illustrations, black and white
  • Sari: Series in Optics and Optoelectronics
  • Ilmumisaeg: 26-Feb-2013
  • Kirjastus: CRC Press Inc
  • ISBN-10: 1439854815
  • ISBN-13: 9781439854815
  • Formaat: Hardback, 506 pages, kõrgus x laius: 254x178 mm, kaal: 1043 g, 5 Tables, black and white; 369 Illustrations, black and white
  • Sari: Series in Optics and Optoelectronics
  • Ilmumisaeg: 26-Feb-2013
  • Kirjastus: CRC Press Inc
  • ISBN-10: 1439854815
  • ISBN-13: 9781439854815
"The need for faster and more accurate dimensional measurements has sparked the development of a range of laser types and methods with greater computational power. Featuring contributors from industry and academia, this handbook reviews modern optical dimensional measurement technologies and their applications. Covering scales ranging from nanometers to kilometers, it presents the principles, techniques, and devices used in modern optical dimensional metrology. An essential desk reference for metrologists and engineers, the book incorporates data tables and a multitude of available techniques"--

Due to their speed, data density, and versatility, optical metrology tools play important roles in today’s high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods.

The book first builds a foundation for evaluating optical measurement methods. It explores the many terms of optical metrology and compares it to other forms of metrology, such as mechanical gaging, highlighting the limitations and errors associated with each mode of measurement at a general level. This comparison is particularly helpful to current industry users who operate the most widely applied mechanical tools.

The book then focuses on each application area of measurement, working down from large area to medium-sized to submicron measurements. It describes the measurement of large objects on the scale of buildings, the measurement of durable manufactured goods such as aircraft engines and appliances, and the measurement of fine features on the micron and nanometer scales. In each area, the book covers fast, coarse measures as well as the finest measurements possible. Best practices and practical examples for each technology aid readers in effectively using the methods.

Requiring no prior expertise in optical dimensional metrology, this handbook helps engineers and quality specialists understand the capabilities and limitations of optical metrology methods. It also shows them how to successfully apply optical metrology to a vast array of current engineering and scientific problems.

Arvustused

"This handbook is an impressive collection of methods to make very precise measurements of location, length and surface quality." Albert C. Claus, Optics & Photonics News, 2014

Preface vii
Editor xi
Contributors xiii
Part I Optical Metrology: Introduction
1 Optical Metrology Overview
3(34)
Kevin Harding
2 Machine Vision for Metrology
37(56)
Kevin Harding
Gil Abramovich
Part II Optical Metrology of Larger Objects
3 Laser Tracking Systems
93(64)
Scott Sandwith
Stephen Kyle
4 Displacement Measuring Interferometry
157(82)
Vivek G. Badami
Peter J. de Groot
5 Metrology of Large Parts
239(26)
H. Philip Stahl
Part III Optical Metrology of Medium Size Objects
6 Portable Metrology
265(22)
Daniel Brown
Jean Francois Laurie
7 Phase-Shifting Systems and Phase-Shifting Analysis
287(46)
Qingying Hu
8 Moire Measurement
333(36)
Toru Yoshizawa
Lianhua Jin
Part IV Optical Micro-Metrology of Small Objects
9 Automation in Interferometry
369(26)
Erik Novak
Bryan Guenther
10 White-Light Interference 3D Microscopes
395(24)
Joanna Schmit
11 Focus-Based Optical Metrology
419(32)
Kevin Harding
Part V Advanced Optical Micro-Metrology Methods
12 Parallel Multifunctional System for MEMS/MOEMS and Microoptics Testing
451(30)
Matgorzata Kujawinska
Michal Jozwik
Adam Styk
Index 481
Kevin Harding is a principal scientist at GE Research in Niskayuna, New York, where he leads work in optical metrology at the R&D center and provides guidance to a wide range of optical technology projects. Internationally recognized for his work in 3D measurement technology, he has received numerous honors, including the Automated Imaging Association Leadership Award and the SME Eli Whitney Productivity Award. A SPIE fellow, Harding has published over 120 technical papers, taught more than 60 short courses and tutorials, contributed sections to six books, and received over 55 patents.