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High-Power Radio Frequency Effects on Electronic Systems Unabridged edition [Kõva köide]

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  • Formaat: Hardback, 320 pages, kõrgus x laius: 229x152 mm
  • Ilmumisaeg: 31-Mar-2020
  • Kirjastus: Artech House Publishers
  • ISBN-10: 1630815888
  • ISBN-13: 9781630815882
Teised raamatud teemal:
High-Power Radio Frequency Effects on Electronic Systems Unabridged editionSuurem pilt
  • Formaat: Hardback, 320 pages, kõrgus x laius: 229x152 mm
  • Ilmumisaeg: 31-Mar-2020
  • Kirjastus: Artech House Publishers
  • ISBN-10: 1630815888
  • ISBN-13: 9781630815882
Teised raamatud teemal:
Püsilink: https://www.kriso.ee/db/9781630815882.html
Märksõnad:
This is the first book that comprehensively addresses the issues relating to the effects of radio frequency (RF) signals and the environment of electrical and electronic systems. It covers testing methods as well as methods to analyze radio frequency. The generation of high-powered electromagnetic (HPEM) environments, including moderate band damped sinusoidal radiators and hyperband radiating systems is explored. HPEM effects on component, circuit, sub-system electronics, as well as system level drawing are discussed. The effects of HPEM on experimental techniques and the standards which can be used to control tests are described. The validity of analytical techniques and computational modeling in a HPEM effects context is also discussed.

Insight on HPEM effects experimental techniques and the standards which can be used to control tests is provided, and the validity of analytical techniques and computational modeling in a HPEM effects context is discussed. This book dispels myths, clarifies good experimental practice and ultimately draws conclusions on the HPEM interaction with electronics. Readers will learn to consider the importance of HPEM phenomena as a threat to modern electronic based technologies which underpin society and to therefore be pre-emptive in the consideration of HPEM resilience.
Foreword xi
Acknowledgments xiii
1 Introduction
1(10)
1.1 Reliance on Electronics
1(1)
1.2 HPEM Environment Overview
1(2)
1.3 HPEM Effects Overview
3(1)
1.4 A Brief History of EM Interference and Effects
4(1)
1.5 A Systems-of-Systems Hierarchy
5(4)
1.5.1 Device
6(1)
1.5.2 Circuit
6(1)
1.5.3 Equipment
7(1)
1.5.4 System
7(1)
1.5.5 Network
7(1)
1.5.6 Infrastructure
7(2)
1.6 Summary
9(2)
References
9(2)
2 HPEM Environments
11(52)
2.1 Introduction
11(4)
2.2 Lightning
15(5)
2.2.1 Overview
15(3)
2.2.2 Lightning-Radiated Environment
18(2)
2.3 Nuclear EM Pulse
20(11)
2.3.1 HEMP-Radiated Environment
22(6)
2.3.2 HEMP-Conducted Environment
28(1)
2.3.3 Open-Source Accounts of HEMP Disturbances
29(1)
2.3.4 HEMP Environment Summary
30(1)
2.4 High-Power RF Directed Energy Environments
31(4)
2.4.1 The Status of HPRF DE Systems Today
32(3)
2.5 Intentional EM Interference Environments
35(10)
2.5.1 IEMI Technical Capability Groups
37(3)
2.5.2 IEMI Environment Summary
40(1)
2.5.3 Open-Source Accounts of HPRF DE and IEMI Action
41(4)
2.6 Classification of HPRF DE and IEMI Environments
45(9)
2.6.1 Hypoband
46(2)
2.6.2 Mesoband
48(3)
2.6.3 Hyperband
51(3)
2.7 Summary
54(9)
References
54(9)
3 HPEM Coupling and Interaction
63(28)
3.1 EM Interaction Coupling Model
63(4)
3.2 Topological Concept
67(3)
3.3 Transfer Functions
70(16)
3.3.1 Antenna Transfer Function
70(3)
3.3.2 Free-Space Wave Propagation
73(1)
3.3.3 Coupling/Radiation Efficiency
73(3)
3.3.4 Diffusion Penetration
76(4)
3.3.5 Aperture Penetration
80(2)
3.3.6 Conducted Propagation
82(1)
3.3.7 Galvanic, Capacitive, and Magnetic Coupling
82(1)
3.3.8 Capacitive Coupling
83(2)
3.3.9 Inductive Coupling
85(1)
3.4 Field Variation Inside System Enclosure
86(1)
3.5 Overall Response
86(5)
3.5.1 Devices, Equipment, Systems, Networks, and Infrastructure
86(1)
3.5.2 Coupling as a Function of HPEM Environment Type
87(2)
References
89(2)
4 Overview of HPEM Test Facilities and Techniques
91(54)
4.1 Introduction
91(7)
4.1.1 General Considerations for the Scenario
92(3)
4.1.2 General Considerations for HPEM Environment Simulation
95(1)
4.1.3 General Considerations of the SUT
96(2)
4.1.4 Summary
98(1)
4.2 Uncertainty in Effects Testing
98(1)
4.3 HPEM Effects Test Methods and Facilities
99(32)
4.3.1 HPEM-Radiated Testing
100(3)
4.3.2 HPEM-Radiated Test Facilities and HPEM Environment Simulation
103(17)
4.3.3 Measuring the Radiated HPEM Environment
120(1)
4.3.4 The Measurement Chain
121(3)
4.3.5 HPEM Conducted Testing
124(7)
4.3.6 Measuring the Conducted HPEM Environment
131(1)
4.4 Exercising and Observing the SUT
131(2)
4.5 Effects Data Presentation
133(4)
4.6 Other Practical Considerations for HPEM Effects Testing
137(2)
4.7 Summary
139(6)
References
139(6)
5 HPEM Effects Mechanisms
145(64)
5.1 Introduction
145(1)
5.2 Terminology
146(2)
5.2.1 About This
Chapter
147(1)
5.3 Device and Circuit-Level Effects
148(10)
5.3.1 Rectification
148(2)
5.3.2 Noise
150(1)
5.3.3 Interference or Jamming
150(1)
5.3.4 Saturation
151(1)
5.3.5 Shift in Operating Point
151(1)
5.3.6 False Information
152(1)
5.3.7 Transient Upset
152(1)
5.3.8 Chaotic Effects
153(1)
5.3.9 Damage and Destruction
154(3)
5.3.10 Published Device and Circuit-Level Effects Data
157(1)
5.4 Equipment, System, and Network-Level Effects
158(11)
5.4.1 Summary of Equipment, System, and Network-Level Effects
168(1)
5.5 HPEM Signal Indicators
169(19)
5.5.1 Transient or Time-Domain Signal Indicators
170(5)
5.5.2 Frequency-Domain Signal Indicators
175(3)
5.5.3 Pulsed CW Signals
178(3)
5.5.4 Use of Response Indicators
181(7)
5.6 Impact of Signal Indicators on HPEM Effect Mechanisms
188(14)
5.6.1 Effects of Pulse Repetition: Charging and Heating
188(1)
5.6.2 Effects of Pulse Repetition: Thermal Damage
189(2)
5.6.3 Effects of Pulse Repetition: Probability of Intercept
191(2)
5.6.4 Effects of Spectral Density
193(9)
5.7 Summary
202(7)
References
203(6)
6 Classification and Implications of HPEM Effects
209(10)
6.1 Introduction
209(2)
6.2 Classification of EM Effects
211(5)
6.2.1 Effect Classification by Mechanism
211(2)
6.2.2 Effect Classification by Duration
213(2)
6.2.3 Effect Classification by Criticality
215(1)
6.3 Conclusions
216(3)
References
217(2)
7 HPEM Protection Concepts and Methods
219(68)
7.1 Introduction
219(1)
7.2 Shielding Topology Protection Concept
220(13)
7.2.1 Shielding Topology Modeling
221(3)
7.2.2 Shielding Mechanisms
224(9)
7.3 Conducted Protection Via Nonlinear Elements
233(31)
7.3.1 Protection Using the Amplitude Reduction Approach
235(28)
7.3.2 Summary of Analysis of Nonlinear Elements
263(1)
7.4 HPEM Resilience and Detection
264(15)
7.4.1 A Risk-Based Approach
266(1)
7.4.2 A Resilience Approach
267(3)
7.4.3 HPEM Detection
270(9)
7.5 HPEM Standards
279(1)
7.5.1 HPEM Standards Organization
279(1)
7.6 Summary
280(7)
References
281(6)
8 Epilogue
287(6)
References
291(2)
Glossary 293(8)
About the Authors 301(4)
Index 305