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High-Resolution Electron Microscopy 4th Revised edition [Kõva köide]

(Regents' Professor of Physics, Arizona State University)
  • Formaat: Hardback, 432 pages, kõrgus x laius x paksus: 246x177x28 mm, kaal: 1028 g, 163 b/w illustrations, 4 colour plates
  • Ilmumisaeg: 12-Sep-2013
  • Kirjastus: Oxford University Press
  • ISBN-10: 0199668639
  • ISBN-13: 9780199668632
Teised raamatud teemal:
High-Resolution Electron Microscopy 4th Revised editionSuurem pilt
  • Formaat: Hardback, 432 pages, kõrgus x laius x paksus: 246x177x28 mm, kaal: 1028 g, 163 b/w illustrations, 4 colour plates
  • Ilmumisaeg: 12-Sep-2013
  • Kirjastus: Oxford University Press
  • ISBN-10: 0199668639
  • ISBN-13: 9780199668632
Teised raamatud teemal:
Püsilink: https://www.kriso.ee/db/9780199668632.html
Märksõnad:
This new fourth edition of the standard text on atomic-resolution transmission electron microscopy (TEM) retains previous material on the fundamentals of electron optics and aberration correction, linear imaging theory (including wave aberrations to fifth order) with partial coherence, and multiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highest quality images of atoms and molecules using a modern TEM or STEM electron microscope. Applications sections have been updated - these include the semiconductor industry, superconductor research, solid state chemistry and nanoscience, and metallurgy, mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography, aberration correction, field-emission guns, imaging filters, super-resolution methods, Ptychography, Ronchigrams, tomography, image quantification and simulation, radiation damage, the measurement of electron-optical parameters, and detectors (CCD cameras, Image plates and direct-injection solid state detectors). The theory of Scanning transmission electron microscopy (STEM) and Z-contrast are treated comprehensively. Chapters are devoted to associated techniques, such as energy-loss spectroscopy, Alchemi, nanodiffraction, environmental TEM, twisty beams for magnetic imaging, and cathodoluminescence. Sources of software for image interpretation and electron-optical design are given.

Arvustused

... Essential reading for anyone interested in HREM and its applications in materials characterization. The fourth edition provides much needed updates on aberration correction and the latest developments in electron detection technology and analytical microscopic techniques. * Jian-Min Zuo, Microscopy & Microanalysis *

Symbols and abbreviations xvii
1 Preliminaries
1(12)
1.1 Elementary principles of phase-contrast TEM imaging
2(6)
1.2 Instrumental requirements for high resolution
8(2)
1.3 First experiments
10(3)
References
11(2)
2 Electron optics
13(33)
2.1 The electron wavelength and relativity
13(3)
2.2 Simple lens properties
16(6)
2.3 The paraxial ray equation
22(2)
2.4 The constant-field approximation
24(1)
2.5 Projector lenses
25(3)
2.6 The objective lens
28(1)
2.7 Practical lens design
29(2)
2.8 Aberrations
31(6)
2.9 The pre-field
37(1)
2.10 Aberration correction
38(8)
References
43(2)
Bibliography
45(1)
3 Wave optics
46(21)
3.1 Propagation and Fresnel diffraction
47(3)
3.2 Lens action and the diffraction limit
50(5)
3.3 Wave and ray aberrations (to fifth order)
55(6)
3.4 Strong-phase and weak-phase objects
61(2)
3.5 Diffractograms for aberration analysis
63(4)
References
65(1)
Bibliography
66(1)
4 Coherence and Fourier optics
67(21)
4.1 Independent electrons and computed images
69(1)
4.2 Coherent and incoherent images and the damping envelopes
70(6)
4.3 The characterization of coherence
76(3)
4.4 Spatial coherence using hollow-cone illumination
79(2)
4.5 The effect of source size on coherence
81(2)
4.6 Coherence requirements in practice
83(5)
References
86(1)
Bibliography
87(1)
5 TEM imaging of thin crystals and their defects
88(66)
5.1 The effect of lens aberrations on simple lattice fringes
89(4)
5.2 The effect of beam divergence on depth of field
93(3)
5.3 Approximations for the diffracted amplitudes
96(6)
5.4 Images of crystals with variable spacing-spinodal decomposition and modulated structures
102(2)
5.5 Are the atom images black or white? A simple symmetry argument
104(2)
5.6 The multislice method and the polynomial solution
106(1)
5.7 Bloch wave methods, bound states, and `symmetry reduction' of the dispersion matrix
107(6)
5.8 Partial coherence effects in dynamical computations-beyond the product representation. Fourier images
113(2)
5.9 Absorption effects
115(2)
5.10 Dynamical forbidden reflections
117(5)
5.11 Relationship between algorithms. Supercells, patching
122(3)
5.12 Sign conventions
125(1)
5.13 Image simulation, quantification, and the Stobbs factor
126(3)
5.14 Image interpretation in germanium-a case study
129(5)
5.15 Images of defects and nanostructures
134(9)
5.16 Tomography at atomic resolution-imaging in three dimensions
143(2)
5.17 Imaging bonds between atoms
145(9)
References
146(8)
6 Imaging molecules: radiation damage
154(50)
6.1 Phase and amplitude contrast
154(3)
6.2 Single atoms in bright field
157(8)
6.3 The use of a higher accelerating voltage
165(4)
6.4 Contrast and atomic number
169(2)
6.5 Dark-field methods
171(3)
6.6 Inelastic scattering
174(3)
6.7 Noise, information, and the Rose equation
177(3)
6.8 Single-particle cryo-electron microscopy: tomography
180(8)
6.9 Electron crystallography of two-dimensional crystals
188(2)
6.10 Organic crystals
190(2)
6.11 Radiation damage: organics and low-voltage EM
192(3)
6.12 Radiation damage: inorganics
195(9)
References
197(7)
7 Image processing, super-resolution, and diffractive imaging
204(29)
7.1 Through-focus series, coherent detection, optimization, and error metrics
204(6)
7.2 Tilt series, aperture synthesis
210(1)
7.3 Off-axis electron holography
211(1)
7.4 Imaging with aberration correction: STEM and TEM
212(3)
7.5 Combining diffraction and image data for crystals
215(4)
7.6 Ptychography, Ronchigrams, shadow images, in-line holography, and diffractive imaging
219(7)
7.7 Direct inversion from dynamical diffraction patterns
226(7)
References
226(7)
8 Scanning transmission electron microscopy and Z-contrast
233(31)
8.1 Imaging modes, reciprocity, and Bragg scattering
233(7)
8.2 Coherence functions in STEM
240(3)
8.3 Dark-field STEM: incoherent imaging, and resolution limits
243(6)
8.4 Multiple elastic scattering in STEM: channelling
249(2)
8.5 Z-contrast in STEM: thermal diffuse scattering
251(6)
8.6 Three-dimensional STEM tomography
257(7)
References
260(4)
9 Electron sources and detectors
264(25)
9.1 The illumination system
265(3)
9.2 Brightness measurement
268(2)
9.3 Biasing and high-voltage stability for thermal sources
270(4)
9.4 Hair-pin tungsten filaments
274(1)
9.5 Lanthanum hexaboride sources
274(1)
9.6 Field-emission sources
275(1)
9.7 The charged-coupled device detector
276(5)
9.8 Image plates
281(1)
9.9 Film
282(1)
9.10 Direct detection cameras
283(6)
References
286(3)
10 Measurement of electron-optical parameters
289(26)
10.1 Objective-lens focus increments
289(2)
10.2 Spherical aberration constant
291(2)
10.3 Magnification calibration
293(2)
10.4 Chromatic aberration constant
295(1)
10.5 Astigmatic difference: three-fold astigmatism
295(1)
10.6 Diffractogram measurements
296(3)
10.7 Lateral coherence width
299(3)
10.8 Electron wavelength and camera length
302(1)
10.9 Resolution
303(3)
10.10 Ronchigram analysis for aberration correction
306(9)
References
312(3)
11 Instabilities and the microscope environment
315(9)
11.1 Magnetic fields
315(3)
11.2 High-voltage instability
318(1)
11.3 Vibration
319(1)
11.4 Specimen movement
319(2)
11.5 Contamination and the vacuum system
321(2)
11.6 Pressure, temperature, and draughts
323(1)
References
323(1)
12 Experimental methods
324(24)
12.1 Astigmatism correction
325(1)
12.2 Taking the picture
326(2)
12.3 Recording atomic-resolution images-an example
328(7)
12.4 Adjusting the crystal orientation using non-eucentric specimen holders
335(2)
12.5 Focusing techniques and auto-tuning
337(3)
12.6 Substrates, sample supports, and graphene
340(3)
12.7 Film analysis and handling for cryo-EM
343(1)
12.8 Ancillary instrumentation for HREM
344(1)
12.9 A checklist for high-resolution work
345(3)
References
346(2)
13 Associated techniques
348(40)
13.1 X-ray microanalysis and ALCHEMI
348(9)
13.2 Electron energy loss spectroscopy in STEM
357(6)
13.3 Microdiffraction, CBED, and precession methods
363(9)
13.4 Cathodoluminescence in STEM
372(4)
13.5 Environmental HREM, imaging surfaces, holography of fields, and magnetic imaging with twisty beams
376(12)
References
380(8)
Appendices 388(15)
Index 403
John C. H. Spence is Regents' Professor of Physics at Arizona State University with a joint appointment at Lawrence Berkeley Laboratory. He completed a PhD in Physics at Melbourne University in Australia, followed by postdoctoral work in Materials Science at Oxford University, UK. He is a Fellow of the American Physical Society, of the Institute of Physics, of the American Association for the Advancement of Science, and of Churchill College Cambridge, UK. He is a recent co-editor of Acta Crystallographica and served on the editorial board of Reports on Progress in Physics. He has served on the Scientific Advisory Committee of the Molecular Foundry and the Advanced Light Source at the Lawrence Berkeley Laboratory and the DOE's BESAC committee. He has been awarded the Burton Medal and the Distinguished Scientist Award of the Microscopy Society of America, and the Buerger Medal of the American Crystallographic Association.