Muutke küpsiste eelistusi

IEEE International Reliability Physics Symposium 2002 Revised edition [Pehme köide]

,
  • Formaat: Paperback / softback, 500 pages, kõrgus x laius: 279x216 mm
  • Ilmumisaeg: 31-May-2002
  • Kirjastus: I.E.E.E.Press
  • ISBN-10: 0780373529
  • ISBN-13: 9780780373525
Teised raamatud teemal:
IEEE International Reliability Physics Symposium 2002 Revised edition
  • Formaat: Paperback / softback, 500 pages, kõrgus x laius: 279x216 mm
  • Ilmumisaeg: 31-May-2002
  • Kirjastus: I.E.E.E.Press
  • ISBN-10: 0780373529
  • ISBN-13: 9780780373525
Teised raamatud teemal:
Püsilink: https://www.kriso.ee/db/9780780373525.html
This CD-ROM originates from the 2002 IEEE International Reliability Physics Symposium, and is concerned with electron devices. Its contents include: non volatile memory; dielectrics; hot carriers; assembly/packaging; device dielectrics; interconnects; product reliability; and device and process.
Non Volatile Memory; Dielectrics; Hot Carriers; Assembly/Packaging;
Device Dielectrics; Device & Process; Interconnects; Non Volatile Memory;
Product Reliability; Compound Semiconductor Failure Analysis