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Interface Fracture in Layered Materials and Blister Mechanics of Thin Films Unabridged edition [Kõva köide]

  • Formaat: Hardback, 345 pages, kõrgus x laius: 212x148 mm
  • Ilmumisaeg: 07-Feb-2024
  • Kirjastus: Cambridge Scholars Publishing
  • ISBN-10: 1527582450
  • ISBN-13: 9781527582453
Interface Fracture in Layered Materials and Blister Mechanics of Thin Films Unabridged edition
  • Formaat: Hardback, 345 pages, kõrgus x laius: 212x148 mm
  • Ilmumisaeg: 07-Feb-2024
  • Kirjastus: Cambridge Scholars Publishing
  • ISBN-10: 1527582450
  • ISBN-13: 9781527582453
Layered materials and thin film coatings are ubiquitous in today's science, engineering, and technology sectors. To name just a few examples: fibre-reinforced composite laminates in aircraft structures, thermal barrier coatings in aero-engines and power turbines, multilayer Mo/Si mirrors of nanometre thickness in synchrotrons, telescope optics, extreme ultraviolet optical systems, etc. The inherent weak interfaces in these materials are extremely vulnerable to fracture which often causes thin film blisters of various morphologies. The authors of the present work have made some significant research progress on this topic; the book gathers these advancements to provide researchers and engineers with more theoretical tools to study and design such material systems. Furthermore, this book can be used as a textbook in advanced courses for postgraduate students. To suit these purposes, each chapter focuses on a relatively independent topic and consists of both theoretical development and experimental applications. Many figures and numerical tables are used to help readers with mechanical understanding and self-practice.

Arvustused

'The authors of this book have made a series of advancements in the area. The discovered double orthogonality of pure modes reveals a more fundamental understanding of interface fracture in layered materials and builds up a powerful methodology for mixed-mode fracture partition. The novel approach of pocket energy concentration reveals a new mechanism for the spontaneous formation of various blisters in thin films and establishes a set of handy analytical formulae to determine blister morphologies, residual stresses in thin films, and interface fracture toughness. The book contains detailed theoretical developments and extensive experi-mental validations with over two hundred references. The work is a milestone in interface fracture mechanics of layered materials and blister mechanics of thin films. It provides state-of-the-art knowledge to academic researchers, postgraduate students, and design engineers. Its publication shall bring about considerable interest in the scientific community.'Jiashi YangProfessor of Mechanical and Materials Engineering, University of Nebraska-Lincoln, USA

Professor Simon S. Wang works in the Department of Aeronautical and Automotive Engineering at Loughborough University in the UK. He obtained his BEng in engineering mechanics from Tsinghua University in China, and his PhD in the mechanics of composite materials from Birmingham University in the UK. His research interests focus on interface fracture in layered materials and blister mechanics of thin films. He has published around two hundred papers in international journals and conferences and co-authored one textbook.Dr Christopher M. Harvey works in the Department of Aeronautical and Automotive Engineering at Loughborough University in the UK. He has been conducting research on interface fracture in layered materials and blister mechanics of thin films since 2008. He has published around one hundred academic journal and conference papers.Dr Bo Yuan is an Associate Professor at Inner Mongolia University of Science and Technology in China. His research focuses on blisters in thin coatings and lifetime analysis of thermal barrier coatings, including mechanical modeling, physical testing, and materials characterization.