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Interferogram Analysis For Optical Testing 2nd edition [Kõva köide]

  • Formaat: Hardback, 566 pages, kõrgus x laius: 229x152 mm, kaal: 861 g
  • Ilmumisaeg: 24-Mar-2005
  • Kirjastus: CRC Press Inc
  • ISBN-10: 1574446827
  • ISBN-13: 9781574446821
  • Formaat: Hardback, 566 pages, kõrgus x laius: 229x152 mm, kaal: 861 g
  • Ilmumisaeg: 24-Mar-2005
  • Kirjastus: CRC Press Inc
  • ISBN-10: 1574446827
  • ISBN-13: 9781574446821
In this day of digitalization, you can work within the technology of optics without having to fully understand the science behind it. However, for those who wish to master the science, rather than merely be its servant, it's essential to learn the nuances, such as those involved with studying fringe patterns produced by optical testing interferometers.

When Interferogram Analysis for Optical Testing originally came to print, it filled the need for an authoritative reference on this aspect of fringe analysis. That it was also exceptionally current and highly accessible made its arrival even more relevant. Of course, any book on something as cutting edge as interferogram analysis, no matter how insightful, isn't going to stay relevant forever.

The second edition of Interferogram Analysis for Optical Testing is designed to meet the needs of all those involved or wanting to become involved in this area of advanced optical engineering. For those new to the science, it provides the necessary fundamentals, including basic computational methods for studying fringe patterns. For those with deeper experience, it fills in the gaps and adds the information necessary to complete and update one's education.

Written by the most experienced researchers in optical testing, this text discusses classical and innovative fringe analysis, principles of Fourier theory, digital image filtering, phase detection algorithms, and aspheric wavelength testing. It also explains how to assess wavefront deformation by calculating slope and local average curvature.
Review and Comparison of the Main Interferometric Systems
1(62)
Two-Wave Interferometers and Configurations Used in Optical Testing
1(4)
Twyman--Green Interferometer
5(3)
Fizeau Interferometers
8(3)
Typical Interferograms in Twyman--Green and Fizeau Interferometers
11(3)
Lateral Shear Interferometers
14(12)
Primary Aberrations
16(1)
Defocus
17(1)
Spherical Aberration
17(1)
Coma
17(1)
Primary Astigmatism
17(1)
Rimmer--Wyant Method To Evaluate Wavefronts
18(2)
Saunders Method To Evaluate Interferograms
20(1)
Spatial Frequency Response of Lateral Shear Interferometers
21(2)
Regularization Method To Obtain Wavefronts
23(3)
Ronchi Test
26(4)
Hartmann Test
30(4)
Fringe Projection
34(3)
Talbot Interferometry and Moire Deflectometry
37(2)
Common Light Sources Used in Interferometry
39(2)
Aspherical Compensators and Aspheric Wavefronts
41(1)
Imaging of the Pupil on the Observation Plane
41(10)
Imaging the Pupil Back on Itself
42(1)
Imaging the Pupil on the Observing Screen
43(3)
Requirements on the Imaging Lens
46(5)
Multiple-Wavelength Interferometry
51(12)
References
54(9)
Fourier Theory Review
63(32)
Introduction
63(3)
Complex Functions
63(3)
Fourier Series
66(2)
Fourier Transforms
68(7)
Parseval Theorem
71(1)
Central Ordinate Theorem
71(1)
Translation Property
72(1)
Derivative Theorem
72(1)
Symmetry Properties of Fourier Transforms
73(2)
The Convolution of Two Functions
75(4)
Filtering by Convolution
78(1)
The Cross-Correlation of Two Functions
79(1)
Sampling Theorem
80(3)
Sampling of a Periodical Function
83(6)
Sampling of a Periodical Function with Interval Averaging
85(4)
Fast Fourier Transform
89(6)
References
94(1)
Digital Image Processing
95(32)
Introduction
95(1)
Histogram and Gray-Scale Transformations
96(2)
Space and Frequency Domain of Interferograms
98(2)
Digital Processing of Images
100(12)
Point and Line Detection
102(1)
Derivative and Laplacian Operators
102(1)
Spatial Filtering by Convolution Masks
103(6)
Edge Detection
109(1)
Smoothing by Regularizing Filters
110(2)
Some Useful Spatial Filters
112(4)
Square Window Filter
112(2)
Hamming and Hanning Window Filters
114(1)
Cosinusoidal and Sinusoidal Window Filters
115(1)
Extrapolation of Fringes Outside of the Pupil
116(2)
Light Detectors Used To Digitize Images
118(9)
Image Detectors and Television Cameras
119(4)
Frame Grabbers
123(2)
References
125(2)
Fringe Contouring and Polynomial Fitting
127(32)
Fringe Detection Using Manual Digitizers
127(2)
Fringe Tracking and Fringe Skeletonizing
129(6)
Spatial Filtering of the Image
131(1)
Identification of Fringe Maxima
131(2)
Assignment of Order Number to Fringes
133(2)
Global Polynomial Interpolation
135(9)
Zernike Polynomials
137(3)
Properties of Zernike Polynomials
140(1)
Least-Squares Fit to Zernike Polynomials
141(2)
Gram-Schmidt Orthogonalization
143(1)
Local Interpolation by Segments
144(4)
Wavefront Representation by an Array of Gaussians
148(11)
References
150(9)
Periodic Signal Phase Detection and Algorithm Analysis
159(100)
Least-Squares Phase Detection of a Sinusoidal Signal
159(6)
Quadrature Phase Detection of a Sinusoidal Signal
165(8)
Low-Pass Filtering in Phase Detection
168(5)
Discrete Low-Pass Filtering Functions
173(6)
Examples of Discrete Filtering Functions
176(1)
Wyant's Three-Step Algorithm
176(1)
Four-Steps-in-Cross Algorithm
177(1)
Schwider-Hariharan Five-Step (4 + 1) Algorithm
178(1)
Fourier Description of Synchronous Phase Detection
179(9)
Synchronous Detection Using a Few Sampling Points
188(13)
General Discrete Sampling
190(4)
Equally Spaced and Uniform Sampling
194(2)
Applications of Graphical Vector Representation
196(2)
Graphic Method To Design Phase-Shifting Algorithms
198(3)
Signal Amplitude Measurement
201(2)
Characteristic Polynomial of a Sampling Algorithm
203(3)
General Error Analysis of Synchronous Phase-Detection Algorithms
206(6)
Exact Phase-Error Analysis
207(3)
Phase-Error Approximation in Two Particular Cases
210(2)
Some Sources of Phase Error
212(27)
Phase-Shifter Miscalibration and Nonlinearities
214(1)
Error in the Sampling Reference Functions
215(1)
Error in the Measured Signal
216(1)
Measurement and Compensation of Phase-Shift Errors
217(3)
Linear or Detuning Phase-Shift Error
220(1)
Quadratic Phase-Shift Errors
221(3)
High-Order, Nonlinear, Phase-Shift Errors with a Sinusoidal Signal
224(2)
High-Order, Nonlinear, Phase-Shift Errors with a Distorted Signal
226(3)
Nonuniform Phase-Shifting Errors
229(2)
Phase Detection of a Harmonically Distorted Signal
231(3)
Light-Detector Nonlinearities
234(1)
Random Phase Error
235(4)
Shifting Algorithms with Respect to the Phase Origin
239(8)
Shifting the Algorithm by ±π/2
242(1)
Shifting the Algorithm by ±π/4
243(4)
Optimization of Phase-Detection Algorithms
247(2)
Influence of Window Function of Sampling Algorithms
249(3)
Conclusions
252(7)
Appendix. Derivative of the Amplitude of the Fourier Transform of the Reference Sampling Functions
253(1)
References
254(5)
Phase-Detection Algorithms
259(100)
General Properties of Synchronous Phase-Detection Algorithms
259(1)
Three-Step Algorithms To Measure the Phase
260(14)
120° Three-Step Algorithm
261(5)
Inverted T Three-Step Algorithm
266(2)
Wyant's Tilted T Three-Step Algorithm
268(2)
Two-Steps-Plus-One Algorithm
270(4)
Four-Step Algorithms To Measure the Phase
274(7)
Four Steps in the Cross Algorithm
275(3)
Algorithm for Four Steps in X
278(3)
Five-Step Algorithm
281(3)
Algorithms with Symmetrical N + 1 Phase Steps
284(20)
Symmetrical Four-Step (3 + 1) Algorithm
290(4)
Schwider-Hariharan Five-Step (4 + 1) Algorithm
294(4)
Symmetrical Six-Step (5 + 1) Algorithm
298(3)
Symmetrical Seven-Step (6 + 1) Algorithm
301(3)
Combined Algorithms in Quadrature
304(17)
Schwider Algorithm
308(7)
Schmit and Creath Algorithm
315(4)
Other Detuning-Insensitive Algorithms
319(2)
Detuning-Insensitive Algorithms for Distorted Signals
321(9)
Zhao and Surrel Algorithm
322(4)
Hibino Algorithm
326(2)
Six-Sample, Detuning-Insensitive Algorithm
328(2)
Algorithms Corrected for Nonlinear Phase-Shifting Error
330(4)
Continuous Sampling in a Finite Interval
334(5)
Asynchronous Phase-Detection Algorithms
339(13)
Carre Algorithm
340(6)
Schwider Asynchronous Algorithm
346(3)
Two Algorithms in Quadrature
349(1)
An Algorithm for Zero Bias and Three Sampling Points
349(2)
Correlation with Two Sinusoidal Signals in Quadrature
351(1)
Algorithm Summary
352(7)
Detuning Sensitivity
352(3)
Harmonic Sensitivity
355(1)
References
355(4)
Phase-Shifting Interferometry
359(40)
Phase-Shifting Basic Principles
359(1)
An Introduction to Phase Shifting
360(6)
Moving Mirror with a Linear Transducer
360(1)
Rotating Glass Plate
361(1)
Moving Diffraction Grating
362(1)
Rotating Phase Plate
363(2)
Moire in an Interferogram with a Linear Carrier
365(1)
Frequency Changes in the Laser Light Source
365(1)
Simultaneous Phase-Shift Interferometry
366(1)
Phase-Shifting Schemes and Phase Measurement
366(2)
Heterodyne Interferometry
368(2)
Phase-Lock Detection
370(3)
Sinusoidal Phase Oscillation Detection
373(3)
Practical Sources of Phase Error
376(7)
Vibration and Air Turbulence
376(2)
Multiple-Beam Interference and Frequency Mixing
378(3)
Spherical Reference Wavefronts
381(1)
Quantization Noise
382(1)
Photon Noise Phase Errors
382(1)
Laser Diode Intensity Modulation
382(1)
Selection of the Reference Sphere in Phase-Shifting Interferometry
383(16)
Paraxial Focus
385(1)
Best Focus
385(1)
Marginal Focus
386(1)
Optimum Tilt and Defocusing in Phase-Shifting Interferometry
387(2)
Temporal Phase-Shifting Techniques
389(1)
Spatial Linear Carrier Demodulation
390(1)
Spatial Circular Carrier Demodulation
391(1)
References
392(7)
Spatial Linear and Circular Carrier Analysis
399(56)
Spatial Linear Carrier Analysis
399(15)
Introduction of a Linear Carrier
400(3)
Holographic Interpretation of the Interferogram
403(4)
Fourier Spectrum of the Interferogram and Filtering
407(4)
Pupil Diffraction Effects
411(3)
Space-Domain Phase Demodulation with a Linear Carrier
414(18)
Basic Space-Domain Phase Demodulation Theory
414(2)
Phase Demodulation with an Aspherical Reference
416(2)
Analog and Digital Implementations of Phase Demodulation
418(1)
Spatial Low-Pass Filtering
419(3)
Sinusoidal Window Filter Demodulation
422(2)
Spatial Carrier Phase-Shifting Method
424(4)
Phase-Locked Loop Demodulation
428(4)
Circular Spatial Carrier Analysis
432(1)
Phase Demodulation with a Circular Carrier
433(7)
Phase Demodulation with a Spherical Reference Wavefront
433(3)
Phase Demodulation with a Tilted-Plane Reference Wavefront
436(4)
Fourier Transform Phase Demodulation with a Linear Carrier
440(7)
Sources of Error in the Fourier Transform Method
444(2)
Spatial Carrier Frequency, Spectrum Width, and Interferogram Domain Determination
446(1)
Fourier Transform Phase Demodulation with a Circular Carrier
447(8)
References
449(6)
Interferogram Analysis with Moire Methods
455(20)
Moire Techniques
455(1)
Moire Formed by Two Interferograms with a Linear Carrier
456(9)
Moire with Interferograms of Spherical Wavefronts
458(4)
Moire with Interferograms of Aspherical Wavefronts
462(3)
Moire Formed by Two Interferograms with a Circular Carrier
465(5)
Moire with Interferograms of Spherical Wavefronts
467(1)
Moire with Interferograms of Aspherical Wavefronts
468(2)
Summary of Moire Effects
470(1)
Holographic Interpretation of Moire Patterns
470(2)
Conclusion
472(3)
References
473(2)
Interferogram Analysis without a Carrier
475(18)
Introduction
475(1)
Mathematical Model of the Fringes
476(5)
The Phase Tracker
481(4)
The N-Dimensional Quadrature Transform
485(5)
Using the Fourier Transform To Calculate the Isotropic Hilbert Transform
487(1)
The Fringe Orientation Term
488(2)
Conclusion
490(3)
References
491(2)
Phase Unwrapping
493(32)
The Phase Unwrapping Problem
493(7)
Unwrapping Consistent Phase Maps
500(4)
Unwrapping Full-Field Consistent Phase Maps
500(2)
Unwrapping Consistent Phase Maps within a Simple Connected Region
502(2)
Unwrapping Noisy Phase Maps
504(7)
Unwrapping Using Least-Squares Integration
504(3)
The Regularized Phase Tracking Unwrapper
507(4)
Unwrapping Subsampled Phase Maps
511(10)
Greivenkamp's Method
513(3)
Null Fringe Analysis of Subsampled Phase Maps Using a Computer-Stored Compensator
516(2)
Unwrapping of Smooth Continuous Subsampled Phase Maps
518(2)
Unwrapping the Partial Derivative of the Wavefront
520(1)
Conclusions
521(4)
References
522(3)
Wavefront Curvature Sensing
525(16)
Wavefront Determination by Slope Sensing
525(1)
Wavefront Curvature Sensing
525(12)
The Laplacian and Local Average Curvatures
526(1)
Irradiance Transport Equation
527(2)
Laplacian Determination with Irradiance Transport Equation
529(4)
Wavefront Determination with Iterative Fourier Transforms
533(4)
Wavefront Determination with Defocused Images
537(1)
Conclusions
538(3)
References
538(3)
Index 541


Malacara, Zacarias; Servín, Manuel